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Axis ultra dld electron spectrometer

Manufactured by Shimadzu
Sourced in United Kingdom

The Axis Ultra DLD electron spectrometer is a laboratory instrument designed for high-resolution X-ray photoelectron spectroscopy (XPS) analysis. It features a dual-layer delay-line detector (DLD) for high-speed, high-resolution electron detection. The core function of the Axis Ultra DLD is to enable the study and characterization of the chemical composition and electronic structure of surfaces and thin films.

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11 protocols using axis ultra dld electron spectrometer

1

Characterizing Surface Composition of Chars via FTIR and XPS

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Fourier transform infrared (FTIR) spectra were collected using a Vertex 70v (Bruker Co., Germany) spectrometer equipped with an attenuated total reflectance (ATR) cell (single bounce diamond; Golden Gate, Specab). Dried and homogenized samples were pressed onto the ATR cell using a sapphire anvil. Absorption spectra were obtained (wavenumbers 600–4000 cm−1, resolution 4 cm−1) in 100 co-added scans recorded under vacuum at room temperature.
The surface composition of the chars was determined via X-ray photoelectron spectroscopy (XPS) equipped with a monochromatic Al Kα source operated at 120 W. The spectra were collected with a Kratos Axis Ultra DLD electron spectrometer and processed with Kratos software. An analyzer pass energy of 160 eV and a pass energy of 20 eV were used for acquiring survey spectra and individual photoelectron lines, respectively. A spectrometer charge neutralization system was used to stabilize the surface potential. The binding energy (BE) scale was referenced to the C 1s line of aliphatic carbon, which was set to 285.0 eV. Using a Ni spatula, powder samples for the analysis were gently pressed into a pellet affixed to a sample holder. The limit of detection (LOD) was ~ 0.1 at. %.
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2

Comprehensive Materials Characterization Protocol

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Powder X-ray diffraction (XRD) patterns were collected on a PANalytical X'pert diffractometer (Cu-Kα, λ = 1.5406 Å) with 45 kV and 40 mA at ambient temperature, using a continuous mode in the 2θ angular range of 10° to 80° with a scan speed of 0.0279°·s−1. Scanning electron microscopy studies were carried out with a FE-SEM, Carl Zeiss Merlin equipped with energy dispersive X-ray spectroscopy (EDS). Transmission electron microscopy (TEM) images were obtained on FEI Talos L 120C, and the STEM high-angle annular dark-field (HAADF) images were recorded on a Thermo Scientific Themis Z at 300 kV, EDX was acquired using a SuperX EDX detector, and EELS was recorded on a GIF quantum ER spectrometer. Surface elemental composition and valence states were examined by X-ray photoelectron spectroscopy (XPS) using a Kratos Axis Ultra DLD electron-spectrometer equipped with a monochromatic X-ray source (Al Kα line of 1486.6 eV), the XPS spectra were calibrated with the C 1s = 284.4 eV (C–C sp2).25,26 (link) Raman spectroscopy was carried out with a Renishaw inVia Raman spectrometer fitted with a diffraction grating of 2400 lines per mm, excited with a radiation of 514 nm Ar-ion laser and calibrated with Si single crystal.
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3

Bi2Te3 Powder Characterization

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The particle size distribution of n‐type and p‐type Bi2Te3 powders was analyzed by Master sizer 3000 laser particle size meter (JL‐6000, Chengdu Jingxin, China). Using Merlin field emission SEM (ZERSS, Germany) at an acceleration voltage of 5.0 kV, the surface morphology of the semiconductor Bi2Te3 powders and the ion‐electron ink layer was observed. The electric conductivity of the paper generator was tested with a four‐probe square resistance tester (KDY‐1, Guangzhou Kunde) by considering the fractional contribution to conductivity of the hybrid ion‐electron ink. Tektronix oscilloscope (TBS, Tektronix) was used to test the short‐circuit voltage output of hygroelectricity, thermoelectricity, and also HTE, respectively. The X‐ray photoelectron spectroscopy was measured by Kratos Axis Ultra DLD electron spectrometer to determine the distributions of main elements of Bi2Te3 materials. Real‐time humidity was recorded by utilizing a humidity meter CEM DT8896.
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4

Comprehensive Material Characterization Protocol

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SEM studies were carried out on a Carl Zeiss Merlin microscope equipped with an energy dispersive X-ray spectrometer. XPS was performed on a Kratos Axis Ultra DLD electron-spectrometer equipped with a monochromatic X-ray source (Al Kα line of 1486.6 eV). X-ray diffraction (XRD) characterization was conducted on a PANalytical X’pert diffractometer (λ = 1.5406 Å, Cu Kα) in the range of 5 to 75 degrees (step size of 0.01395° and time of 0.5 s step−1) at atmospheric conditions. Sheet resistance was measured in an Ossila Four-Point Probe System. These measurements were performed in a cleanroom with 52% controlled humidity and temperature (21 °C).
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5

Comprehensive Characterization of Material Surface

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The surface topography characteristics were observed using field emission scanning electron microscopy (SEM) and transmission electron microscopy (TEM). The high-angle annular dark-field (HAADF) element mapping and energy-dispersive X-ray spectroscopy (EDS) were collected using a scanning tunneling electron microscopy (Tecnai G2 F20, FEI). Brunauer–Emmett–Teller (BET) measurement was conducted by the N2 adsorption/desorption analysis on an ASAP 2020 volumetric adsorption analyzer at 77 K. The X-ray diffraction (XRD) patterns were recorded on an XD-3 Purkinje diffractometer using Cu Kα radiation, and the scan rate was 5° min−1 over the range of 2θ = 10–60°. X-ray photoelectron spectroscopy (XPS) analyses were carried out on a Kratos Axis Ultra DLD electron spectrometer to analyze chemical elements and chemical configuration, and the binding energy was calibrated by means of the C 1s peak energy of 284.8 eV.
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6

Characterization of Magnetic Nanoparticles

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The powder X-ray diffraction (XRD) study of the obtained materials was carried out using a PANalytical X'Pert Pro diffractometer. Fourier transform infrared spectroscopy (FTIR) in KBr pellets was recorded using a Nicolet 470 Nexus instrument (Thermo Scientific, USA). Magnetic properties of nanoparticles were measured with an EV9 vibrating sample magnetometer. In order to determine the saturation magnetization (Ms), magnetic hysteresis loop experiments were performed in a magnetic field (H) of 20 kOe. Transmission electron microscopy (TEM) was used to examine the size and morphology of the biosynthesized MNPs. The images were done by TEM 1230 JEOL (Tokyo, Japan) with an acceleration voltage of 80 kV. The JSM-6100 (JEOL, Japan) scanning electron microscope (SEM) equipped with an Oxford Instruments INCA energy-dispersive X-ray spectrometer (EDX) was used to study the chemical composition of solids. Textural parameters of the magnetic materials were determined from the N2 adsorption/desorption isotherms recorded at 77 K with an ASAP 2020 apparatus. The specific surface area (SBET) of the samples was determined by the BET method.36 (link) X-ray photoelectron spectroscopy (XPS) spectra were measured with an Axis Ultra DLD electron spectrometer (Kratos Analytical, UK) using a monochromated Al Kα source that was operated at 150 W.
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7

FTIR and XPS Characterization of Material Samples

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Fourier transform infrared (FTIR) spectra were collected using a Vertex 70v spectrometer (Bruker Co., Germany). Samples were pressed onto an attenuated total reflectance (ATR) cell (single bounce diamond; Golden Gate, Specab) using a sapphire anvil. Absorption spectra were recorded at room temperature between 600 and 4000 cm−1, (resolution 2 cm−1, 100 co-added scans).
XPS analysis was performed with a monochromatic Al Kα source operated at 120 W. The spectra were collected with a Kratos Axis Ultra DLD electron spectrometer and processed with Kratos software. An analyzer pass energy of 160 eV and a pass energy of 20 eV were used for acquiring survey spectra and individual photoelectron lines, respectively. Spectrometer charge neutralization system was used to stabilize the surface potential. The binding energy (BE) scale was referenced to the C 1s line of aliphatic carbon, which was set to 285.0 eV. Using a Ni spatula, powder samples for the analysis were gently pressed into a pellet affixed to a sample holder. The limit of detection (LOD) was ~ 0.1 at. %.
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8

XPS Analysis of Specimen Composition

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AXIS Ultra DLD electron spectrometer was used to collect XPS spectra (Kratos, UK). Specimens were exposed to 180 W X-rays and monochrome Al K (1486.6 eV). A survey spectrum of 0–1200 eV was collected at a high-resolution spectra of C 1s, P 2p, and Ca 2p regions with pass energies of 160 eV and 40 eV, respectively, and data was analysed using CasaXPS Software (Casa Software Ltd, United Kingdom).
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9

Comprehensive Characterization of Covalent Organic Frameworks

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Powder X-ray diffraction spectra were obtained using a Bruker D8 ADVANCE instrument in the 2θ range of 2.5°-40°and used to evaluate COF crystallinity. The experiment was carried out using a Quartz holder at a scan rate of 1°min -1 and a step interval of 0.01°. The stretching bands of the functional groups were obtained from FTIR spectra using a Thermo Scientific Nicolet iS10 spectrometer. Solid-state 13 C NMR spectroscopy was performed using the Bruker Avance III 400 MHz equipment. Thermal decomposition of COFs was determined by thermogravimetric analyses (TGA, 209 F1 analyzer Netzsch) under an N 2 atmosphere at a ramp rate of 10 °C min -1 , in a range of 30 °C-900 °C. X-ray photoelectron spectroscopy (XPS) imaging was performed on a Kratos Axis Ultra DLD electron spectrometer. A Magellan FEI 400 was used for scanning electron microscopy (SEM) measurements. The samples were treated with iridium prior to analysis to avoid surface charging. Nitrogen adsorption analyses were conducted on a Micromeritics ASAP 2420 at -196 °C. The BET surface areas of ND-COF-1 and ND-COF-2 were calculated. A non-localized density functional theory (NLDFT) model was utilized for the calculations of pore size distribution. CO 2 , N 2 , and CH 4 uptake was measured using a Micromeritics ASAP 2020 at 0 and 25 °C, under atmospheric pressure.
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10

XPS Characterization of Material Surfaces

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XPS spectra were acquired using AXIS Ultra DLD electron spectrometer (Kratos, UK). Specimens were deployed with 180 W X-rays and Al Kα (1486.6 eV) monochrome. A survey spectrum comprising of 0-1200 eV was collected at a highresolution spectra of C 1s, P 2p, and Ca 2p regions with a pass energy of 160 eV and 40 eV and data analysed using CasaXPS Software (Casa Software Ltd, United Kingdom).
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