The surface composition of the chars was determined via X-ray photoelectron spectroscopy (XPS) equipped with a monochromatic Al Kα source operated at 120 W. The spectra were collected with a Kratos Axis Ultra DLD electron spectrometer and processed with Kratos software. An analyzer pass energy of 160 eV and a pass energy of 20 eV were used for acquiring survey spectra and individual photoelectron lines, respectively. A spectrometer charge neutralization system was used to stabilize the surface potential. The binding energy (BE) scale was referenced to the C 1s line of aliphatic carbon, which was set to 285.0 eV. Using a Ni spatula, powder samples for the analysis were gently pressed into a pellet affixed to a sample holder. The limit of detection (LOD) was ~ 0.1 at. %.
Axis ultra dld electron spectrometer
The Axis Ultra DLD electron spectrometer is a laboratory instrument designed for high-resolution X-ray photoelectron spectroscopy (XPS) analysis. It features a dual-layer delay-line detector (DLD) for high-speed, high-resolution electron detection. The core function of the Axis Ultra DLD is to enable the study and characterization of the chemical composition and electronic structure of surfaces and thin films.
Lab products found in correlation
11 protocols using axis ultra dld electron spectrometer
Characterizing Surface Composition of Chars via FTIR and XPS
The surface composition of the chars was determined via X-ray photoelectron spectroscopy (XPS) equipped with a monochromatic Al Kα source operated at 120 W. The spectra were collected with a Kratos Axis Ultra DLD electron spectrometer and processed with Kratos software. An analyzer pass energy of 160 eV and a pass energy of 20 eV were used for acquiring survey spectra and individual photoelectron lines, respectively. A spectrometer charge neutralization system was used to stabilize the surface potential. The binding energy (BE) scale was referenced to the C 1s line of aliphatic carbon, which was set to 285.0 eV. Using a Ni spatula, powder samples for the analysis were gently pressed into a pellet affixed to a sample holder. The limit of detection (LOD) was ~ 0.1 at. %.
Comprehensive Materials Characterization Protocol
Bi2Te3 Powder Characterization
Comprehensive Material Characterization Protocol
Comprehensive Characterization of Material Surface
Characterization of Magnetic Nanoparticles
FTIR and XPS Characterization of Material Samples
XPS analysis was performed with a monochromatic Al Kα source operated at 120 W. The spectra were collected with a Kratos Axis Ultra DLD electron spectrometer and processed with Kratos software. An analyzer pass energy of 160 eV and a pass energy of 20 eV were used for acquiring survey spectra and individual photoelectron lines, respectively. Spectrometer charge neutralization system was used to stabilize the surface potential. The binding energy (BE) scale was referenced to the C 1s line of aliphatic carbon, which was set to 285.0 eV. Using a Ni spatula, powder samples for the analysis were gently pressed into a pellet affixed to a sample holder. The limit of detection (LOD) was ~ 0.1 at. %.
XPS Analysis of Specimen Composition
Comprehensive Characterization of Covalent Organic Frameworks
XPS Characterization of Material Surfaces
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