The X-ray diffraction (XRD) patterns for the mineralogical analyses of coal fly ash and ceramics were obtained at room temperature (26.8°C) using a Shimadzu XRD-6000 powder diffractometer. Bragg-Bretano geometry was used with Cu-ka radiation. The tube was operated at 40 kV and 40 mA. The diffraction data were collected over the range of 10° ≤ 2θ ≤ 60° with 0.02° steps and an integration time of 2 s per point. Crystallinity (%) was obtained from the percentile ratio between the crystalline area and total area on the X-ray diffractogram [23 ]. X'Pert HighScore software (PANalytical) was used to identify crystalline phases; Rietica 1.7.7 software (Lucas Heights Research Laboratories) was used for structure refinement (Rietveld's method) and subsequent quantitative analysis.
Xrd 6000 powder diffractometer
Manufactured by Shimadzu
Sourced in Japan
The XRD-6000 is a powder diffractometer manufactured by Shimadzu. It is designed to analyze the crystalline structure of solid materials by measuring the diffraction of X-rays. The instrument can identify and quantify the phases present in a sample and provide information about the material's atomic arrangement.
Automatically generated - may contain errors
Lab products found in correlation
X pert highscore software, by Malvern Panalytical (1 mentions)
Jsm 6700f electron microscope, by JEOL (1 mentions)
Uv 3600 uv vis nir spectrophotometer, by Shimadzu (1 mentions)
F 7000, by Hitachi (1 mentions)
Axis nova spectrometer, by Shimadzu (1 mentions)
Model 100 series, by PerkinElmer (1 mentions)
Nicolet 6700, by Thermo Fisher Scientific (1 mentions)
Escalab 250xi, by Thermo Fisher Scientific (1 mentions)
Uv 3600 plus, by Shimadzu (1 mentions)
6 protocols using xrd 6000 powder diffractometer
1
Mineral Analysis of Coal Fly Ash and Ceramics
2
Comprehensive Materials Characterization Protocol
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
Scanning electron microscopy (SEM) was carried out using a JEOL-JSM-6700F electron microscope. The samples were coated with gold using a sputter coater and an energy-dispersive X-ray spectrometer (EDX) attachment was employed.
The average oxidation states of vanadium and nickel in the samples were studied by X-ray photoelectron spectroscopy (XPS) using a Thermo ESCALAB 250 spectrometer with monochromatic Al Kα radiation (hν = 1486.6 eV) operating at 150 W with a 500 μm diameter analysis area and a pass energy of 20 eV. The binding energies for sample charging were calibrated using the C 1s peak at 284.8 eV.
N2 adsorption–desorption measurements were carried out at −196 °C using a Micromeritics Gemini V 2380 autosorption analyzer. The specific surface area was calculated according to the Brunauer–Emmett–Teller (BET) equation and pore distributions were obtained using the Barrett–Joyner–Halenda (BJH) method. Samples were degassed in flowing N2 at 200 °C for 5 h before measurements.
X-ray diffraction (XRD) patterns were obtained on a Shimadzu XRD-6000 powder diffractometer (Japan) using Cu Kα radiation (λ = 0.1541 nm). The 2θ scan range was 10°–80° with a step size of 0.02°.
The chemical composition of the samples was analyzed using an ARL-9800 X-ray fluorescence spectrometer (XRF) to confirm the EDX results.
The average oxidation states of vanadium and nickel in the samples were studied by X-ray photoelectron spectroscopy (XPS) using a Thermo ESCALAB 250 spectrometer with monochromatic Al Kα radiation (hν = 1486.6 eV) operating at 150 W with a 500 μm diameter analysis area and a pass energy of 20 eV. The binding energies for sample charging were calibrated using the C 1s peak at 284.8 eV.
N2 adsorption–desorption measurements were carried out at −196 °C using a Micromeritics Gemini V 2380 autosorption analyzer. The specific surface area was calculated according to the Brunauer–Emmett–Teller (BET) equation and pore distributions were obtained using the Barrett–Joyner–Halenda (BJH) method. Samples were degassed in flowing N2 at 200 °C for 5 h before measurements.
X-ray diffraction (XRD) patterns were obtained on a Shimadzu XRD-6000 powder diffractometer (Japan) using Cu Kα radiation (λ = 0.1541 nm). The 2θ scan range was 10°–80° with a step size of 0.02°.
The chemical composition of the samples was analyzed using an ARL-9800 X-ray fluorescence spectrometer (XRF) to confirm the EDX results.
3
X-ray Characterization of Peptide Compounds
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
In this study, the composition, purity, and crystallinity of PTH I-34, PTH-ANC, ANC, and MAC were studied by an X-ray powder diffractometer (Shimadzu XRD-6000 powder diffractometer with CuKα [λ=1.540562 Å] at 40 kV and 30 mA). A standard back fill method was used in preparation of samples for XRD. This entailed packing ~0.35 g of powder into the holder for a 90° tilt test. The holder was sufficiently firm enough to prevent the sample from falling out during the test. The crystallinity phases were determined with diffraction angles from 20° to 70° at 37°C.
4
Photocatalytic Material Characterization
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The crystalline phases were characterized by a Shimadzu XRD-6000 powder diffractometer. Under a scanning electron microscope (SEM, Carl Zeiss SIGMA) and a transmission electron microscope (TEM, Tecnai G2 F20S-TWIN), the morphology and microstructure of photocatalysts were identified. X-ray photoelectron spectroscopy (XPS) was performed with a Kratos AXIS NOVA spectrometer. UV-vis diffuse reflectance spectra were collected on a Shimadzu UV-3600 UV/vis/NIR spectrophotometer. Photoluminescence (PL) spectra were obtained on a florescence spectrophotometer (Hitachi F-7000). With a three-electrode system (CHI-660E, Chenhua Instruments Co., Shanghai, China), the photoelectrochemical experiments were performed. A Pt wire and saturated calomel electrode (SCE) acted as counter electrode and reference electrode, respectively. The catalyst powder was deposited on a fluoride tin oxide (FTO) substrate to serve as the working electrode. A 0.5 M Na2SO4 aqueous solution acted as the electrolyte. A 300 W xenon lamp (MICROSOLAR300UV, Beijing Perfect light) equipped with a 420 nm cutoff filter (k > 420 nm) was employed as a visible light source.
5
Crystallinity and Chemical Analysis of Antimicrobial Agents
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The crystallinity of naked ANP, VANP, and vancomycin alone was investigated with an X-ray powder diffractometer (Shimadzu XRD-6000 powder diffractometer) using CuKα (λ=1.540562 Å) at 40 kV and 30 mA.11 The crystallinity phases of the samples were determined using diffraction angles from 5° to 70°, and the experiment was conducted at 37°C.
Chemical analyses of naked ANP, VANP, and vancomycin alone were carried out using a Fourier transform infrared (FT-IR) spectrophotometer (Model 100 series, PerkinElmer Inc.). The spectrum was recorded at ambient temperature over a wavenumber range of 4,000–400 cm−1 at 2 cm−1 resolution18 (link) by averaging 64 scans.
Chemical analyses of naked ANP, VANP, and vancomycin alone were carried out using a Fourier transform infrared (FT-IR) spectrophotometer (Model 100 series, PerkinElmer Inc.). The spectrum was recorded at ambient temperature over a wavenumber range of 4,000–400 cm−1 at 2 cm−1 resolution18 (link) by averaging 64 scans.
6
Comprehensive Catalyst Characterization
Check if the same lab product or an alternative is used in the 5 most similar protocols
+ Expand
The crystal phase and microstructure of the catalyst were determined by X-ray powder diffraction (XRD) using Shimadzu XRD-6000 powder diffractometer (at 40 kV and 30 mA with Cu Kα-ray, with λ = 0.1541 nm). The detailed morphologies were observed by a high-resolution transmission electron microscope (HRTEM, Talos F200S). Fourier transform infrared (FTIR) spectra were acquired in air at room temperature on an FTIR spectrometer (Thermo Scientific Nicolet 6,700). Raman measurement was carried out using a Raman spectroscopy (NOST FEX, Korea) with 532 nm laser excitation. The facial element status and chemical composition of particles were detected by X-ray photoelectron spectroscopy (XPS, Escalab 250Xi, Thermo Fisher) analysis. UV-Vis diffused reflectance spectra of the samples were recorded by a UV-Vis spectrophotometer (UV-3600 plus, Shimadzu, Japan), where BaSO4 was applied as a reflectance standard. An optical microscopy equipped with a digital camera was installed under an inverted optical microscope (BDS400, Optex Co. Ltd. China) for observing Pickering emulsion. Furthermore, the stability of the emulsion droplet was confirmed by dispersion stability analyzer (TURBISCAN LAB). Thermal Gravimetric Analysis (TGA, TA TGA5500) was applied to estimate the amount of the grafted reagent.
About PubCompare
Our mission is to provide scientists with the largest repository of trustworthy protocols and intelligent analytical tools, thereby offering them extensive information to design robust protocols aimed at minimizing the risk of failures.
We believe that the most crucial aspect is to grant scientists access to a wide range of reliable sources and new useful tools that surpass human capabilities.
However, we trust in allowing scientists to determine how to construct their own protocols based on this information, as they are the experts in their field.
Ready to get started?
Sign up for free.
Registration takes 20 seconds.
Available from any computer
No download required
Revolutionizing how scientists
search and build protocols!