Apreo s lovac

X-ray diffraction (XRD) patterns were recorded on X-ray diffractometer (D8 Advanced, Bruker, Germany) equipped with Cu K_α radiation with a scanning rate of 5^° min⁻¹. The morphologies were observed by scanning electron microscopy (SEM, Apreo S LoVac, FEI, America) and transmission electron microscope (TEM) with an acceleration voltage of 200 kV (Tecnai G2 F20, FEI, America). The local structure and oxygen vacancy were discerned through Aberration-corrected scanning transmission electron microscopy (JEM-ARM200F, JEOL, Japan). The electron spin resonance (EPR) spectra were obtained on JES-FA 200 spectrometer (JEOL, Japan). Surface elements were analyzed by X-ray photoelectron spectroscopy (XPS, Escalab 250, Thermo SCIENTIFIC, America). All energies were referenced to C 1 s peaks (284.8 eV) of the surface adventitious carbon. X-ray absorption spectroscopy (XAS) measurements for the Bi L₃-edge were performed in fluorescence mode on beamline 20-BM-B with electron energy of 7 GeV and an average current of 100 mA. The radiation was monochromatized by a Si (111) double-crystal monochromator. X-ray absorption near edge structure (XANES) and extended X-ray absorption fine structure (EXAFS) data reduction and analysis were processed by Athena software.

To certify the structure of the obtained samples, X-ray powder diffraction (XRD, Miniflex 600, Rigaku, Tokyo, Japan) patterns were measured with the Cu-Kα radiation at a scan rate of 5°/min. The calcined temperature range, essential for this study, was determined using thermogravimetric analysis (TAG, TGA/DSC) in an Ar atmosphere, spanning from 30 to 1000 °C. Fourier-transformed infrared spectra (FT-IR, Nicolet iS 50, Thermo Scientific, Waltham, MA, USA) were then employed for a more comprehensive analysis of the chemical bonds. N₂ adsorption isotherms (Autosorb-iQ, Anton Paar, Boynton Beach, FL, USA) were utilized to determine the Brunauer–Emmett–Teller (BET) surface area. The sample morphology was further analyzed using a field-emission scanning electron microscope (FESEM, Apreo S LoVac, Thermo Scientific, Waltham, MA, USA) at a 5.0 kV acceleration voltage, equipped with an Energy Dispersive Spectrometer (EDS), and a transmission electron microscope (TEM, FEI Talos F200s, FEI, Hillsboro, OR, USA). Finally, to gain insights into the chemical compositions, X-ray photoelectron spectroscopy (XPS, Axis Supra, Shimadzu, Tokyo, Japan) was conducted.

Scanning electron microscopy (SEM) measurements of the surfaces of membrane selective layer were performed with the instrument Apreo S LoVac (Thermo Scientific™, Waltham, MA, USA). Samples were prepared in two different manners, either via freeze-drying of the water-wet membrane using the FreezeDryer Alpha 1–4 (Christ, Osterode am Harz, Germany) or via stepwise solvent exchange from water via water/ethanol mixtures to ethanol and finally to hexane and ultimately air drying. The sputtering with an alloy containing 80% Au and 20% Pd was done using a K-550 sputter coater (Emitech, Quorum Technologies Ltd, Laughton, UK).

Hep3B cells were cultured on coverslips with collagen (Type I solution from rat tail, Sigma C3867) and fixed in fixation buffer B (2.5% glutaraldehyde, 0.18 M Na₂HPO₄, 0.019 M KH₂PO₄, pH 7.2) after stimulation. The samples were submitted to Yimingfuxing Bio (Beijing, China) for embedding, according to standard procedures. A field emission scanning electron microscope (Apreo S LoVac, Thermo Fisher) at the Central Laboratory of Nankai University was used for observations.

For SEM image acquisition, the particles were first dispersed in water. In parallel, a single crystalline silicon wafer was immersed in a 10 g/L solution of PEI (270 kDa, branched) in water and cleaned with water after 10 min. Subsequently, the wafer was dried with compressed air and then immersed in the particle dispersion for another 10 min, followed by rinsing with water. Due to the electrostatic interactions between the PEI on the wafer surface and the particles, single particles could be imaged. To ensure sufficient conductivity of the sample, the samples were sputtered with an Au/Pd layer. The image acquisition was performed with the instrument Apreo S LoVac from Thermo Fisher Scientific (Waltham, MA, USA).

The morphology of the samples was observed by a scanning electron microscope with an operating voltage of 10 kV (SEM, Apreo S LoV ac, Thermo Fisher Scientific, Waltham, MA, USA).
The X-ray diffraction data were taken using an X-ray diffractometer with CuK radiation and a measurement range of 20–80°, (XRD, Miniflex 600, Akishima, Rigaku, Tokyo, Japan).
The transmission electron microscopy and selected area electron diffraction images were obtained from an FEI Talos F200s transmission electron microscope, operated at 200 kV (TEM, SAED, Thermo Fisher Scientific, Waltham, MA, USA).
High-resolution transmission electron microscopy was carried out on an FEI Titan Themis Z G3 30–300 spherical aberration-corrected transmission electron microscope, operated at 300 kV, equipped with both image and probe aberration (HRTEM, Thermo Fisher Scientific, Waltham, MA, USA).
X-ray photoelectron spectroscopy was used to characterize the atomic composition and state at the surface of the samples, using Al Ka rays as the excitation source (XPS, Thermo Scientific K-Alpha, Waltham, MA, USA).
The UV-Vis absorbance spectra were collected by a Cary 5000 spectrophotometer, (UV-Vis, Agilent, Santa Clara, CA, USA).
The photoluminescence spectra were acquired using a fluorescence spectroscopy test system (PL, FLS980, Edinburgh Instruments Ltd., Livingston, UK).