The largest database of trusted experimental protocols

D8 advance x ray diffractometer

Manufactured by Siemens
Sourced in Germany

The D8 ADVANCE X-ray diffractometer is a laboratory instrument designed for the analysis of crystalline materials. It employs X-ray diffraction technology to determine the structure and phase composition of solid samples. The core function of the D8 ADVANCE is to provide precise measurements of lattice parameters, phase identification, and quantitative analysis of multi-phase samples.

Automatically generated - may contain errors

2 protocols using d8 advance x ray diffractometer

1

Adsorption of Humic Acid on Modified Zeolites

Check if the same lab product or an alternative is used in the 5 most similar protocols
Modified zeolites were prepared by dissolving calculated amounts of DAAO at 60 °C in 250 mL of a water ethanol mixture (50 : 10, v/v) acidified to pH 3.0 with HCl. DAAO-modified zeolites were prepared as described previously.20 (link) In brief, the DAAO stock solution of a 50 mmol L−1 concentration was prepared prior to use in natural zeolite modification. A series of 10 g natural zeolites mixed with different volumes of DAAO solution ranging from 20, 30, 40, 50, 60, 72, and 80 mL, which were named SMZ1, SMZ2, SMZ3, SMZ4, SMZ5, SMZ6 and SMZ7, respectively. The adsorbents were characterized by XRD, FE-SEM and FT-IR spectroscopy before and after adsorption of HA at pH 6.0. XRD patterns were obtained using a Bruker D8 ADVANCE X-ray diffractometer with Cu Kα radiation (Siemens D5000 diffractometer, Bruker AXS Inc, Germany), operating at 40 kV and 40 mA. The surface morphologies of solid samples were examined using a JSM-7500F FE-SEM (JEOL Ltd., Japan). Infrared spectra were recorded in KBr pellets on a Nicolet 5700 model FTIR spectrometer (Thermo Nicolet Corporation, USA). Zeta potentials of HA and SMZ were measured using a Zeta sizer 2000 Analyzer (Malvern, Mastersizer 2000 Instruments Co., USA) at an ionic strength of 1 mM NaCl and initial pH ranging from 3.0 to 11.0.
+ Open protocol
+ Expand
2

Characterization of PEGN Nanostructures

Check if the same lab product or an alternative is used in the 5 most similar protocols
A Hitachi S-4800 scanning-electron microscope (SEM, Tokyo, Japan) and Hitachi H-600-II transmission electron microscope (TEM) were used to characterize the morphology of the PEGN nanostructures. The critical structures in the PEGN particles were recorded using a Siemens D8 Advance X-ray diffractometer (XRD, Munich, Germany) with Cu-Ka radiation (=0.15418 nm) over a range of 5° ≤ 2° ≤ 80°. The Raman analysis was carried out using a Via-Reflex Raman microspectrometer (Renishaw, Wotton-under-Edge, UK) using a continuous-wave laser with a wavelength of 532 nm. Under carbon-hybridized conditions, surface chemical statements were recorded using an X-ray photoelectron spectroscope (XPS, Escallab 250, Thermo Scientific, Waltham, MA, USA) with an Al-Kα line and a VG CLAMP hemispherical analyzer (Waltham, MA, USA).
+ Open protocol
+ Expand

About PubCompare

Our mission is to provide scientists with the largest repository of trustworthy protocols and intelligent analytical tools, thereby offering them extensive information to design robust protocols aimed at minimizing the risk of failures.

We believe that the most crucial aspect is to grant scientists access to a wide range of reliable sources and new useful tools that surpass human capabilities.

However, we trust in allowing scientists to determine how to construct their own protocols based on this information, as they are the experts in their field.

Ready to get started?

Sign up for free.
Registration takes 20 seconds.
Available from any computer
No download required

Sign up now

Revolutionizing how scientists
search and build protocols!