Jsm 7600f field emission scanning electron microscope fesem
The JSM-7600F is a Field Emission Scanning Electron Microscope (FESEM) manufactured by JEOL. It is designed to provide high-resolution imaging and analysis of a wide range of materials, from metals and ceramics to biological samples. The JSM-7600F utilizes a field emission electron source to generate a narrowly focused electron beam, which is then scanned across the surface of the specimen to create a detailed image.
2 protocols using jsm 7600f field emission scanning electron microscope fesem
Characterization of MNCs via X-ray Diffraction
Characterization of Polymeric Nanoparticles
The zeta potential, average size and size distribution of synthesized polymeric nanoparticles and their coatings with a various number of layers were carried out on a Zetasizer Nano ZS instrument (Malvern-Pananalytical, Malvern, UK). Additionally, the concentration and the size distribution of polymeric NPs were determined using Nanosight NS500 instrument (Malvern-Panalytical, Malvern, UK). The morphology of polymeric nanoparticles was analyzed by a cryo-scanning electron microscope (cryo-SEM) Jeol JSM-7600F Field Emission Scanning Electron Microscope, FESEM (Jeol Ltd., Tokyo, Japan) according to the protocol described previously [34 (link)]. Spectrofluorimetric measurements were acquired using a HORIBA Jobin Yvon Fluorolog-3 spectrofluorometer equipment (HORIBA Jobin Yvon, Longjumeau, France).
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