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Jsm 7600f field emission scanning electron microscope fesem

Manufactured by JEOL
Sourced in Japan

The JSM-7600F is a Field Emission Scanning Electron Microscope (FESEM) manufactured by JEOL. It is designed to provide high-resolution imaging and analysis of a wide range of materials, from metals and ceramics to biological samples. The JSM-7600F utilizes a field emission electron source to generate a narrowly focused electron beam, which is then scanned across the surface of the specimen to create a detailed image.

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2 protocols using jsm 7600f field emission scanning electron microscope fesem

1

Characterization of MNCs via X-ray Diffraction

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X-ray diffraction method was employed to authenticate the formation of GO, LZFO MNPs, CHLZFO, and CHLZFO-GO MNCs. XRD instrument used was PANalytical X’Pert Pro X-ray diffractometer (India), using Cukα1 radiation (λ = 1.5406 Å) operating at working voltage of 45 kV and working current of 40 mA in the 2ϴ range of 5.070–90.010° at step size 0.02°. Both the lattice constant and the crystallite size for prepared samples were determined using Debye–Scherrer equation. Morphological studies were performed by JEM-2100F Field Emission Electron Microscope and JEOL JSM-7600F Field Emission Scanning Electron Microscope (FESEM) (Saudi Arabia). Furthermore, magnetic characterizations were studied using EV9 Vibrating Sample Magnetometer (EV9 VSM), MicroSense (India), by applying ± 2 Tesla field at ambient temperature.
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2

Characterization of Polymeric Nanoparticles

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All synthesized polymeric nanoparticles were characterized by measurements of their size, size distribution, zeta potential, concentration, and morphology observation. Fluorescent emission spectra of the loaded polymeric NPs, as well as empty ones, were acquired to confirm drug encapsulation. For evaluation of the stability of synthesized polymeric nanoparticles, their size was monitored in time during storage in the preparation buffer.
The zeta potential, average size and size distribution of synthesized polymeric nanoparticles and their coatings with a various number of layers were carried out on a Zetasizer Nano ZS instrument (Malvern-Pananalytical, Malvern, UK). Additionally, the concentration and the size distribution of polymeric NPs were determined using Nanosight NS500 instrument (Malvern-Panalytical, Malvern, UK). The morphology of polymeric nanoparticles was analyzed by a cryo-scanning electron microscope (cryo-SEM) Jeol JSM-7600F Field Emission Scanning Electron Microscope, FESEM (Jeol Ltd., Tokyo, Japan) according to the protocol described previously [34 (link)]. Spectrofluorimetric measurements were acquired using a HORIBA Jobin Yvon Fluorolog-3 spectrofluorometer equipment (HORIBA Jobin Yvon, Longjumeau, France).
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