Jem 2010 system
The JEM 2010 system is a transmission electron microscope (TEM) designed and manufactured by JEOL. It is a versatile and high-performance instrument capable of providing detailed images and structural analysis of a wide range of materials at the nanoscale level. The core function of the JEM 2010 system is to enable users to obtain high-resolution, high-contrast electron micrographs and perform advanced analytical techniques such as electron diffraction and energy-dispersive X-ray spectroscopy.
Lab products found in correlation
8 protocols using jem 2010 system
Comprehensive Characterization of Catalysts
Characterization of SiO2@InP QDs@SiO2 NPs
Characterization of PEI-Et/siRNA Polyplexes
Polyplex Characterization by Particle Analysis
Transmission Electron Microscopy of Polyplexes
Characterization of PDAPEI/miR-221/222 Complexes
TEM Sample Preparation Methods
Polyethylenimine-Butyrate Polyplex Characterization
Saline and BSA solution were used to mimic the physiological conditions to indicate the stability of the particles. The PEI-Bu siRNA polyplex was prepared as described and incubated in saline and BSA solution at 37°C separately for 48 hours. Particle size was determined at 0, 1, 3, 6, 12, 24, 36, 48 hours to study the stability of the formed polyplexes.
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