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X pert pro 1

Manufactured by Malvern Panalytical
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The X'Pert Pro-1 is a versatile X-ray diffractometer designed for materials analysis. It utilizes advanced X-ray optics and a high-performance detector to provide accurate and reliable data on the structural properties of a wide range of materials.

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Lab products found in correlation

Icps 8100, by Shimadzu (1 mentions) Escalab xi, by Thermo Fisher Scientific (1 mentions) Tecnai g2 f30, by Thermo Fisher Scientific (1 mentions)

2 protocols using x pert pro 1

1

Comprehensive Catalyst Characterization

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The physical characterization of catalysts was conducted with an X-ray diffractometer (X’pert Pro-1, PANalytical) from 10 to 90° (Almelo, The Netherlands), a Raman spectrometer (Bruker Optics Senterra, Ettlingen, Germany), a specific surface and pore size analysis instrument (QUADRASORB SI, Boynton Beach, FL, USA). The XPS of samples was conducted on Escalab Xi+ (Thermo Fisher Scientific, Waltham, MA, USA). TEM was carried out on TECNAI G2F30 (FEI Company, Hillsboro, OR, USA). The Fe content was measured by inductively coupled plasma optical emission spectroscopy (ICP-OES, ICPS-8100, Shimadzu, Japan).
Zhao H., Chen L., Ni N., Lv Y., Wang H., Zhang J., Li Z., Liu Y., Geng Y., Xie Y, & Wang L. (2023). Zn-Induced Synthesis of Porous Fe-N,S-C Electrocatalyst with Iron-Based Active Sites Containing Sulfides, Oxides and Nitrides for Efficient Oxygen Reduction and Zinc-Air Batteries. Molecules, 28(15), 5885.
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2

Multilayered 2D Perovskite Film Characterization

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The (PEA)2(MA)n−1PbnI3n+1 (n = 4) multilayered
2D perovskite films and SCs with n = 1–3 were
both measured by powder X-ray diffraction
system (PXRD) (X’pert Pro-1, PANAlytical).
Tang J., Tian W., Zhao C., Sun Q., Zhang C., Cheng H., Shi Y, & Jin S. (2022). Imaging the Moisture-Induced Degradation Process of 2D Organolead Halide Perovskites. ACS Omega, 7(12), 10365-10371.
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