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S 4800 scanning

Manufactured by JEOL
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The S-4800 is a high-resolution scanning electron microscope (SEM) manufactured by JEOL. It is designed to provide detailed imaging and analysis of a wide range of materials at the nanoscale level. The S-4800 offers high-resolution capabilities, advanced imaging modes, and versatile sample handling capabilities for various applications in materials science, nanotechnology, and scientific research.

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Lab products found in correlation

Jem 2010f, by JEOL (1 mentions) Asap 2020m system, by Micromeritics (1 mentions)

Close spelling variants of this product

S-4800 field emission scanning electron microscope FESEM S-4800 scanning electron microscope S-4800 scanning electron microscope S-4800

2 protocols using s 4800 scanning

1

Comprehensive Characterization of Prepared Samples

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Powder X-ray diffraction (XRD) was performed on a Model D/max-rC X-ray diffractometer with Cu target Kα lines. The surface morphology and microstructure of the prepared samples were analyzed by scanning electron microscopy (SEM, Hitachi S-4800 scanning) and transmission electron microscopy (TEM, JEOL JEM-2010F). X-ray photoelectron spectroscopy (XPS) of the samples was analyzed by Thermo ESCALAB 250 test.
Jia W., Lu Q., Zheng W., Wang K., Liu X., Yang S, & He B. (2023). V-doped porous CoP nanoarrays grown on carbon cloth with optimized electronic structure for the hydrogen evolution reaction. Nanoscale Advances, 5(16), 4133-4139.
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2

Characterization of Ru/LaF3 and Ru/NdF3 Catalysts

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X-Ray diffraction (XRD) analysis of the samples was performed on an X-ray diffractometer (Model D/MAX2500, Rigaka) with Cu-Kα radiation, and the scan speed was 5° min–1. The morphologies of the products were characterized using a HITACHI S-4800 scanning electron microscope (SEM) and a JEOL-1010 transmission electron microscope operated at 100 kV. The crystal structure and SAED pattern were characterized using a TEM JEOL-2100F. The porosity properties of the materials were obtained from nitrogen adsorption–desorption isotherms using a Micromeritics ASAP 2020M system, and then calculated from the Barrett–Joyner–Halenda method. The Ru loading in the Ru/LaF3 catalyst and Ru/NdF3 was determined using the ICP-AES method (VISTA-MPX).
Kang X., Shang W., Zhu Q., Zhang J., Jiang T., Han B., Wu Z., Li Z, & Xing X. (2015). Mesoporous inorganic salts with crystal defects: unusual catalysts and catalyst supports †Electronic supplementary information (ESI) available: Scheme S1 contains reaction equation, Fig. S1–S7 contain solubility test, XRD, SEM, TEM, micropore size distribution and reaction conversion. See DOI: 10.1039/c4sc03736g Click here for additional data file.. Chemical Science, 6(3), 1668-1675.
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