D8 advance diffractometer

XRD patterns were collected on a Bruker D8-Advance diffractometer equipped with Cu Kα radiation source. Additional synchrotron XRD patterns were collected on powders put in sealed glass capillaries (diameter 0.7 mm) either at the European Synchrotron Radiation Facility on ID22 with λ=0.3543 Å (Fig. 3a,c) or at 11BM-Argonne National Lab with λ=0.4142 Å (Fig. 3b). The in situ XRD patterns were recorded using electrochemical cells, assembled similarly to our Swagelok cell, but equipped with a beryllium window as current collector on the positive side. These cells were placed on the Bruker D8-Advance diffractometer (Cu Kα radiation) and connected to the VMP2 system. All patterns were analysed using the Rietveld method as implemented in the FullProf program29 . Phase quantification was performed on the in situ patterns by applying a overall correction on the patterns to account for the absorption from the Be window.

Structural characterizations of Miscanthus fibers and PHBHV/MIS composites with and without DCP were determined by X-ray diffraction (XRD) using a D8 advance Bruker diffractometer (Bruker, Wissenbourg, France) operating at 40 kV and 40 mA with a CuKα radiation. The whole area investigated was in the range 2θ ≈ 5–40° at a scanning rate of 0.2°/min.

Thermal analysis measurements were performed with a Perkin Elmer Diamond DSC device (Waltham, MA, USA) with a heating/cooling rate of 1 K min⁻¹ on a temperature interval between 293 K and 550 K. The measurements were made in an inert gas atmosphere, argon, at a flow rate of 20 mL min⁻¹. The instrument has been calibrated for specific parameters, temperature, and enthalpy using high purity indium (Δ_fusH = 28.54 J g⁻¹). All samples’ masses were between 7 and 10 mg and were weighed with the Partner XA balance (Radwag, Radom, Poland) with a precision of 10 μg.
The XRD measurements for the crystalline structure of the samples were studied by X-Ray Diffraction using a D8 Advance Bruker diffractometer (Cu Kα radiation λ = 1.5418 Å, 40 kV, 40 mA, Bragg-Bretano geometry, Karlsruhe, Germany) at a scanning speed of 0.10 degrees/min in the 10–40 degrees 2Θ range. Crystallite size was estimated with Scherrer equation.
All the FTIR measurements were performed on a Perkin Elmer Spectrum Two ATR-FTIR (Waltham, MA, USA) with a data acquisition count set to 100. The spectrometer was equipped with an universal attenuated total reflection (UATR) accessory containing a diamond/ZnSe crystal for 1 reflection analysis. FT-IR spectra were recorded at a 4 cm⁻¹ spectral resolution.