D2 phaser

The bioreduction of the silver ions in the solution was determined under UV-visible spectroscopy using Perkin-Elmer Lambda 2 UV198 between 300 to 800 nm. Morphological details of purified AgNPs were measured with transmission electron microscopy (TEM) at 200 kV using FEI TECNAI G² 20 equipped with selected area electron diffraction pattern (SAED). Simultaneously, the elemental compositions of the samples were also recorded using Energy Dispersive X-ray analysis. X-ray powder diffraction (XRD) using Cu Kα radiation with λ = 0.15418 nm (Bruker D2 phaser) was used to investigate the crystalline nature and particles size of the synthesized AgNPs. Attenuated total reflectance Fourier transform infrared (ATR-FTIR) spectra of the freeze-dried samples were recorded using a Bruker Tensor 27 equipment to determine the surface functional groupsof the AgNPs.

The crystal structure of the samples was investigated by X-ray diffraction (XRD) using Bruker D2 phaser (Bruker Corp., Billerica, MA, USA) with Cu-Kα radiation (λ = 1.54056 Å) in the range of 4° to 70° (2θ). Microstructures, such as the morphology and the interlayer distance of MRGO-HS, were determined using a field-emission scanning electron microscope (Hitachi SU8220, HITACHI, Tokyo, Japan) and a high-resolution transmission electron microscope (HRTEM) (Titan G2 ChemiSTEM, FEI Company, Hillsboro, OR, USA) with a 200-keV acceleration voltage. We also measured the Fourier transform infrared (FTIR) (Thermo Scientific Nicolet iS5, Thermo Fisher Scientific, Waltham, MA, USA) and Raman (Renishaw inVia reflex, Wotton-under-Edge, UK) spectra using KBr pellets to analyze the carbon bonds before and after the reduction of the synthesized samples. In addition, we used X-ray photoelectron spectroscopy (XPS) (Quantera SXM, ULVAC-PHI, Yokohama, Japan) to analyze the atomic composition of the surface. N₂ adsorption-desorption experiments were performed using Autosorb-iQ and Quadrasorb SI instruments (Quantachrome, Boynton Beach, FA, USA), and pre-experiment samples were dehydrated at 100 °C for 12 h using a vacuum oven. Thermogravimetric analysis (TGA) experiments in an ambient condition were conducted using an STA-S1000 analyzer (SCINCO, Co., Ltd, Seoul, Korea).

Phase identification was carried out by X-ray diffraction (XRD) using Bruker-D2 phaser (Bruker, Madison, WI, USA) for a wide range of angles (2θ) ranging from 10° to 90°, with a scan speed of 0.0101. Micro-hardness of the composites was tested using Wilson Tukon^TM 1202 hardness tester (Buehler, Lake Bluff, IL, USA). The hardness tests were conducted using a load of 200 g with a dwell time of 10 s. At least 10 measurements were taken to calculate the average hardness of the composites.
Dry reciprocating linear sliding tests were performed on the composites using Rtec multi-function Tribometer (Rtec-instruments, San Jose, CA, USA). Alumina ball (900 HV) (McMaster-Carr, Atlanta, GA, USA) and 52,100 steel balls (740 HV) (McMaster-Carr, Atlanta, GA, USA) of 6.35 mm diameter were used as counterparts. The reciprocating tests were conducted using a track length of 10 mm for 20 cycles under 10 N normal load with a sliding speed of 1 mm/s. After the reciprocating sliding tests, the generated wear track was analyzed by an optical microscope and scanning electron microscope (SEM; JEOL JSM-6010LA, Peabody, MA, USA). The chemical characterization of the wear track was characterized by an energy dispersive spectrometer (EDS, JOEL, Peabody, MA, USA) equipped with the SEM.

The microstructure of the film was recorded using SEM (Carl Zeiss, Sigma 300, Oberkochen, Germany). The samples were treated in liquid nitrogen for 10 min to obtain brittle fracture samples before the test. The truncated surface was glued to the conductive adhesive, and the sample was obtained by spraying gold for 45 s. The acceleration voltage during SEM shooting was 3 kV. The FT-IR analysis of the films was captured by an FT-IR spectrometer (Thermo Fisher Scientific, NicoletIS/10, Waltham, MA, USA) from 1000 to 4000 cm⁻¹. X-ray diffraction of all samples was obtained using an X-ray diffractometer (Bruker, Bruker D2 PHASER, Karlsruhe, Germany) with the scanning range of 5–90° (2θ) under Ni-filtered Cu-Kα radiation.

The crystallinity of DOL filler, OMCD filler, virgin PECoVA, PECoVA/DOL composite and PECoVA/OMCD composite was characterized by using X-ray diffraction (XRD) with the model Bruker D2 Phaser (Billerica, MA, USA), with Cu Kα radiation and the wavelength, λ, of 1.5406 Å. The voltage used was 35 kV with the current of 25 mA. The scattering angle range 2θ used was 10°–90°, while the step size and the time per step were 0.022 and 19.2 s, respectively. The crystallinity index or peak-to-noise ratio of the samples, CI_XRD (%), was calculated using Equation (1): CIXRD %=IC(IC+IA)×100%
where I_C represents the area of crystalline peaks of the sample, which is obtained by calculating the area under the crystalline peaks and (I_C + I_A) is the total area under all of the peaks of the sample.

A Bruker D2 Phaser (Billerica, United States) was used to perform X-ray analysis. The scanning range was 5 to 60°2θ width of 0.004°2θ and a step time of 1 s. The detector opening was 5°2θ. The divergence slit and air scatter screen were 1 mm and 3 mm, respectively. The sample stage spun at 60 rpm during measurements.