The surface morphology and roughness of samples were observed by scanning electron microscopy (SEM, Zeiss AURIGA FIB, Germany) and atomic force microscope (AFM, Dimension, Bruker, Germany). An instrument to measure contact angle (DSA30, Kruss, Germany) was used to determine the wettability. The chemical compositions of the different coatings were determined by X-ray photoelectron spectroscopy (XPS, Model PHI 5400, Perkin Elmer, United States).
Model phi 5400
Manufactured by PerkinElmer
Sourced in United States
The PHI 5400 is a high-performance surface analysis instrument designed for detailed characterization of solid surfaces and thin films. It utilizes X-ray photoelectron spectroscopy (XPS) to provide quantitative information about the elemental composition, chemical states, and molecular structure of the sample surface.
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Surface Characterization of Coatings
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Surface Characterization of Coatings
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The surface morphology and roughness of specimens were characterized by scanning electron microscopy (SEM, Zeiss AURIGA FIB, Germany) and atomic force microscopy (AFM, Dimension, Bruker, Germany). The elemental compositions of the coatings were analyzed via an energy dispersive X-ray microanalysis system (EDS, Zeiss AURIGA FIB, Germany) and X-ray photoelectron spectroscopy (XPS, Model PHI 5400, Perkin Elmer, USA). The crystalline phases and wettability analysis of different samples were determined by X-ray diffraction (XRD, D/Max 2500 PC, Rigaku, Japan) and contact angle measuring instrument (DSA30, Kruss, Germany), respectively.
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