H 7500 microscope
The Hitachi H-7500 is a transmission electron microscope designed for high-resolution imaging and analysis of samples. It features a 100 kV accelerating voltage and advanced optics to provide detailed information about the structure and composition of materials at the nanoscale level.
Lab products found in correlation
10 protocols using h 7500 microscope
Pollen Viability Estimation via SEM
Multidisciplinary Characterization of Nanomaterials
Ultrastructural Analysis of Kidney Tissues
Morphology and Pore Analysis of Porous Carbons
and pore size of the resultant porous carbons were examined on a field
emission scanning electron microscope (FE-SEM, JEOL JSM7000F, USA).
TEM was conducted using a Hitachi H-7500 microscope. The inorganic
residue in the resultant porous carbons and the carbon-to-inorganic
template ratio of the particle composition was characterized using
a TGA (TA Instruments Q50, USA), heated from 100 to 900 °C with
a ramp rate of 20 °C min–1 under an air or
nitrogen atmosphere. A micro Raman spectrometer from Renishaw with
a He–Ne laser source with a wavelength of 633 nm was used to
determine the structure of the porous carbons. The N2 adsorption–desorption
isotherms of all samples were taken at 77 K on a micrometric TriStar
II apparatus to estimate the pore sizes and surface areas. The pore-size
distribution curves were obtained from the analysis of adsorption
isotherms using the BJH (Barrett–Joyner–Halenda) method.
Ultrastructural Analysis of Rat Lung Tissue
Ultrastructural Analysis of EYFP-Labeled Boutons
Transmission Electron Microscopy of Mouse Kidney
Transmission Electron Microscopy of Ly-MgO NPs
microscopic analysis was performed to determine
the size and morphology of Ly-MgO NPs using a Hitachi H-7500 microscope.
For TEM studies, the carbon-coated 200 mesh copper grid was dipped
into a solution of MgO NPs dispersed in DDW.
Characterization of Au Nanoparticles and Arrays
Raman, TEM, and XPS Characterization
TEM images were performed with Hitachi H7500 microscope (Tokyo, Japan) with an accelerating voltage of 80 kV, equipped with an AMT Hamamatsu camera (Tokyo, Japan). X-ray Photoelectron Spectroscopy (XPS) analyses were performed on a Thermo Scientific K-Alpha X-ray photoelectron spectrometer with a basic chamber pressure of 10 -8 -10 -9 bar with an anode using Al Kα radiation (hν = 1486.6 eV). The samples were analyzed as powders. A spot size of 400 μm was used. The survey spectra are the average of 10 scans with a pass energy of 200.00 eV and a step size of 1 eV.
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