1010 ex electron microscope
The JEOL 1010 EX is a transmission electron microscope (TEM) designed for high-resolution imaging and analysis of a wide range of materials. It features a LaB6 electron source and provides accelerating voltages up to 100 kV. The microscope is equipped with a standard CCD camera for digital image capture and can be configured with various optional detectors and accessories to enable advanced analytical capabilities.
5 protocols using 1010 ex electron microscope
Ultrastructural Analysis of Cell Morphology
Electron Microscopy of Prefrontal Cortex
Immunostained Striatum Analysis
Morphological Analysis of EV Suspensions
Ultrastructural Analysis of Cells
For SEM, cells were fixed and dehydrated as described above, then treated with hexamethildisilazane and mounted on polylysinated slides, air dried and subsequently covered with a 9 nm gold film by flash evaporation of carbon in an Emitech K 250 sputter coater (Emitech). Specimens were examined with a SEM-FEG Philips XL-30 microscope (Philips).
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