Sigma vp field emission scanning electron microscope
The Sigma VP Field Emission Scanning Electron Microscope is a high-performance imaging and analysis tool designed for a wide range of applications. It features a field emission electron source, which provides high-resolution imaging capabilities. The microscope operates under variable pressure conditions, allowing for the analysis of non-conductive and outgassing samples without the need for extensive sample preparation.
Lab products found in correlation
22 protocols using sigma vp field emission scanning electron microscope
Ultrastructural Analysis of Photoreceptor Organelles
SEM Imaging of Contact Lenses
Fabrication of Epoxy-based Monolithic Filters
Corneal Ultrastructural Analysis Protocol
Measuring Cell-Nanotopography Interactions
arrangements were subsequently measured by SEM (FEI Nova, under 10
kV, WD = 10 mm) after sputter-coated with 3 nm Au. For cell SEM imaging,
HOb cells were seeded on the nanotopographies at 2000 cells/cm2 and were fixed in 1.5% glutaraldehyde/0.1 M sodium cacodylate
buffer for 1 h at 4 °C. After fixation, cells were then washed
three times in 0.1 M sodium cacodylate buffer before incubation in
1% osmium tetroxide/0.1 M sodium cacodylate buffer. Afterward, nanotopographies
were washed three times with deionized (DI) water and stained with
0.5% uranyl acetate/distilled water for 1 h in the dark, and followed
by the dehydration procedure through an ethanol gradient (30, 50,
70, 90, and 100% ethanol). Samples were loaded onto a critical point
dryer (liquid CO2) for 1 h 30 min and then given a gold/palladium
coating using a POLARON SC515 SEM COATER. High-resolution secondary
electron of cell nanotopography interactions imaging was performed
at the Imaging, Spectroscopy and Analysis Centre (ISAAC) at the University
of Glasgow, UK. The images were acquired with a Zeiss Sigma VP Field
Emission scanning electron microscope under high vacuum conditions
using 5 kV accelerating voltage, an aperture size of 30 mm, and at
a working distance of 5 mm.
Nanoparticle Characterization via SEM
Scanning Electron Microscopy of Nanomaterials
Characterizing NP Surface Morphology via SEM
Nanoparticle Surface Morphology Analysis
Soil Microstructural Analysis via SEM
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