Scanning electron microscopy
Scanning electron microscopy is an analytical technique that uses a focused beam of high-energy electrons to generate a variety of signals from the surface of a sample. The signals provide information about the sample's surface topography, composition, and other properties.
Lab products found in correlation
14 protocols using scanning electron microscopy
Osteoclast Differentiation and Resorption Assay
Preparation and Characterization of Amyloid Fibrils
scanning electron microscopy (SEM) images of amyloid fibrils were obtained using an ESEM system (Thermo Fisher Scientific, Waltham, MA, USA) with an accelerating voltage of 5 kV. The sample solution (1 nmol/µL) was diluted 50-fold in pure water, and 1 µL of the diluted solution was placed on silicone and air-dried overnight. To prevent electric charge build-up, the sample was coated with platinum using an Auto-Fine Coater (JEOL, Akishima, Tokyo, Japan) prior to imaging. Images were viewed at magnifications of 2000×, 4000×, and 10,000×. Fibril’s diameter data were collected from software build-up in scanning electron microscopy (Thermo Fisher Scientific, Waltham, MA, USA).
SEM Analysis of Sample Surfaces
Samples were prepared according to the following protocol: Impurities were removed from the samples’ surface using a compressed air can, then a conductive double-sided tape was glued to a supportive device (which is cylindrical, with a diameter of 10 mm). After each sample was glued to the device, it was inserted in a charge reduction sample holder, which will be placed in the microscope. This equipment has the following advantage: for a non-metallic sample, it reduces the electron charge; therefore, the preparation of nonconductive samples is no longer necessary. After the device with the sample is inserted, the image of the sample is displayed, and the areas of the SEM are defined. For this analysis, the microscope settings were the following: intensity of electron cannon 10 keV, magnification 320x, and working distance 3 mm under the cylindrical device.
Characterizing Fmoc-FF/S Hydrogel Morphology
Structural Analysis of ZnO Polymer Nanocomposites
Detailed SEM characterization was performed using a (FE-SEM) Nova NanoSEM 630 (FEI Company, Hillsborough, OR, USA), equipped with an EDX detector (EDAX TEAM™, EDAX Inc., Mahwah, NJ, USA) and field emission microscope. All samples were characterized in high vacuum mode. In order to correctly perform the SEM characterization, samples were coated by thermal evaporation with a 5 nm Au thin film to avoid charging during the analysis.
In Situ Electrochemical Sensor Fabrication
The morphologies of microspherical MIPs particles prepared by bulk, precipitation and in situ polymerization were compared using Scanning Electron Microscopy (SEM, FEI Company, Eindhoven
The Netherlands, (Fig. 1). For reference, these MIPs were compared with commercial MIPs towards amphetamine (Fig. 1d). The obtained functionalized electrodes were eventually tested using an electrochemical detection of N-FA performed using an automated flow injection system, developed by CapSenze AB (Lund, Sweden).
Bacterial Cell Morphology Observation
Scanning Electron Microscopy of Plant Shoot Apex
Scanning Electron Microscopy of Nanoparticles
Characterizing GNEC/HAPAAm Hydrogel Microstructure
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