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Su4800 field emission sem

Manufactured by Hitachi

The SU4800 field emission scanning electron microscope (FE-SEM) from Hitachi is a high-performance imaging and analysis tool. It utilizes a field emission electron source to provide high-resolution imaging capabilities. The SU4800 is designed for a variety of applications, including materials science, nanotechnology, and life sciences research.

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Lab products found in correlation

2 protocols using su4800 field emission sem

1

Electron Microscopy Sample Preparation

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The 1-cm stem segments were mounted on aluminum stubs with doublesided carbon tape, dried in a desiccator and sputter-coated (www.tedpella.com) with a Cressington HR208 sputter coater with platinum for 90 s at 40 milliamps, depositing a 10-nm coating. The segments were examined at 10 kV with a Hitachi SU4800 field emission SEM (www.hitachi-hightech.com), and images were digitally captured in TIFF format.
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2

SEM Imaging of Plant Stem Segments

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The 1-cm-long stem segments were mounted on aluminum stubs with double-sided carbon tape, dried in a desiccator and sputter-coated (www.tedpella.com) with a Cressington HR208 sputter coater with platinum for 90s at 40 milliamps, depositing a 10 nm-thick coating.
The segments were examined at 10 kV with a Hitachi SU4800 field emission SEM (www.hitachi-hightech.com), and images were digitally captured in TIFF format.
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