Su4800 field emission sem
The SU4800 field emission scanning electron microscope (FE-SEM) from Hitachi is a high-performance imaging and analysis tool. It utilizes a field emission electron source to provide high-resolution imaging capabilities. The SU4800 is designed for a variety of applications, including materials science, nanotechnology, and life sciences research.
Lab products found in correlation
2 protocols using su4800 field emission sem
Electron Microscopy Sample Preparation
SEM Imaging of Plant Stem Segments
The segments were examined at 10 kV with a Hitachi SU4800 field emission SEM (www.hitachi-hightech.com), and images were digitally captured in TIFF format.
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