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Leo 1530 vp scanning electron microscope

Manufactured by JEOL

The LEO 1530 VP Scanning Electron Microscope is a high-performance imaging and analytical tool designed for a wide range of applications. It features a high-resolution electron beam and advanced detection capabilities for detailed surface analysis and characterization.

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2 protocols using leo 1530 vp scanning electron microscope

1

Detailed Characterization of MrGO-N and rGO-N

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Morphological characterization of MrGO-N and rGO-N was performed on a LEO 1530 VP Scanning Electron Microscope (SEM) and JEOL JEM-2010 High Resolution Transmission Electron Microscope (HRTEM). Samples were suspended in ethanol and then sonicated for 30 min. After that, the samples were mounted in a Cu TEM grid. Raman spectroscopy was performed on a WITEC-A300M+ Confocal Raman Microscope with laser frequency of 514 nm as excitation source trough a 50× objective. Zeta potential measurements of the samples were measured in DI water using a Malvern Nano-ZS dynamic light scattering equipment. X-ray diffraction (XRD) patterns were obtained in a Bruker D8 Advanced diffractometer using CuKα radiation. Infrared spectra were recorded by Fourier transform-infrared (FT-IR) spectroscopy using a Jasco FTIR-4100 Instrument in ATR mode. Finally, oxygenated groups were quantified by Boehm titrations with an automatic titrator Mettler-Toledo T70. Details of experimental conditions and procedures are described in previous work [26 (link)].
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2

Integumentary Filament Sampling for SEM Analysis

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Sampling. The specimen NJU-57003 is represented by two fragmented slabs, both containing original bone, fossilized soft tissues, and natural moulds of bones. Each slab was glued together along the fissures by fossil dealers with the fossil on the surfaces untouched. The specimen CAGS-Z070 is represented by a single unbroken slab. Small flakes (1-3 mm wide) of samples with preserved integument and/or enclosing sediments were carefully removed from the inferred integumentary filaments from different parts of NJU-57003 (Supplementary Figs. 1a and4a-c) using a dissecting scalpel. This method was used to avoid sampling from degraded products of other tissues, such as dermis, epidermis, or even internal organs. Most samples were not treated further; the remainder were sputter-coated with Au to enhance SEM resolution (Fig. 2g-h and Supplementary Figs. 4a-f and6). All experiments described below were repeated in order to validate the results. SEM. Samples were examined using a JEOL 8530F Hyperprobe at the School of Earth Sciences, University of Bristol, and a LEO 1530VP scanning electron microscope at the Technical Services Centre, Nanjing Institute of Geology and Palaeontology, Chinese Academy of Sciences. Both instruments were equipped with a secondary electron (SE) detector, a back-scattered electron (BSE) detector and an energy dispersive X-ray spectrometer (EDS).
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