Alpha a high performance frequency analyzer
The Alpha-A High Performance Frequency Analyzer is a laboratory instrument designed for advanced frequency analysis. It offers high-performance frequency domain measurements across a wide range of frequencies. The core function of this device is to accurately measure and analyze the frequency characteristics of various electrical signals and systems.
10 protocols using alpha a high performance frequency analyzer
Broadband Dielectric Spectroscopy Measurements
In-situ Electrochemical Characterization of PLD
In situ electrochemical measurements during PLD deposition (i-PLD) were conducted with an Alpha-A High Performance Frequency Analyzer equipped with an Electrochemical Test Station POT/GAL 30V/2A setup (both Novocontrol Technologies, Germany). For i-PLD measurements, a sample was placed on the PLD heater and covered with a corundum mask (cutout 0.45 × 0.45 cm2) to prevent short circuiting of the working electrode and counter electrode via the edges of the sample during the subsequent film deposition. The working electrode was brought into contact with a PtIr-needle and the counter electrode via platinum paste brushed onto the heater. A sketch of the measurement setup can be found in
Impedance measurements were typically conducted in a frequency range from 106 to 10−1 Hz (if needed for resolving the electrode feature, the frequency range was extended to 10−2 Hz), with an AC amplitude of 10 mV root-mean-square, and a resolution of 5 or 10 points per frequency decade. In many cases, oxygen partial pressure and temperature were kept at 600 °C and 0.04 mbar O2 for deposition; in some cases pressure and temperature were varied for a more detailed impedance characterisation.
i-PLD Temperature Measurement Technique
with a custom-made setup inside the PLD chamber.40 (link) The bottom Ti/Pt grid was contacted with a brushed Pt electrode
on the heating stage, and the top grid was contacted with a Pt/Ir
needle. The temperature during i-PLD was controlled by evaluating
the ohmic offset in an across-plane impedance measurement. This offset
resistance includes contributions from wiring and grid resistances,
which were determined beforehand, as well as from thermally activated
ionic conduction through the electrolyte substrates. With the known
conductivity–temperature relationships for YSZ and LSGM,38 (link),41 (link) this technique allows for a very exact temperature measurement during
the PLD process. Impedance measurements were conducted with an Alpha-A
High Performance Frequency Analyzer and Electrochemical Test Station
POT/GAL 30 V/2A setup by Novocontrol Technologies in the frequency
regime from 106 to 10–1 Hz with an alternating-current
(ac) voltage of 20 mV root mean square (RMS). Ex situ measurements in synthetic air (5.0 purity, Messer, Austria) were
performed with the same setup by Novocontrol Technologies and a measurement
setup in a tube furnace. The temperature was measured with a type
S thermocouple, positioned 1 cm next to the sample.
MEA Electrode Characterization by EIS
To identify the optimum AC frequency for the electroporation pulse, we determined the normalized impedance, which describes the contribution of the cell layer to the total impedance. Hereby, two EIS measurements were conducted: one without the cells and one after 24 h, when the cells completely adhered to the MEA. These measurements were performed in cell culture medium and all 60 electrodes of the MEA were short-circuited to reduce the total impedance of the WE.
Dielectric Spectroscopy of Materials
Electrochemical Impedance Spectroscopy of PEDOT:PSS Films
LLZO Ionic Conductivity Measurement
Dielectric Measurements of Thin Films
Comprehensive Characterization of CDI-Cu NF
Electrical Characterization of Immunosensor
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