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Mp x ray diffractometer

Manufactured by STOE

The MP X-ray diffractometer is a laboratory instrument used for the analysis of the crystalline structure of materials. It utilizes X-ray radiation to obtain diffraction patterns, which provide information about the atomic arrangement and phase composition of the sample. The core function of the MP X-ray diffractometer is to perform non-destructive analysis of solid-state materials.

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2 protocols using mp x ray diffractometer

1

Characterization of Uranium Nanoparticles

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The phase composition was determined using a Stoe-Stadi MP X-ray diffractometer operating in transmission mode using Mo-Kα1 (λ = 0.7093 Å) radiation. The morphologies of nanoparticles were investigated with a scanning electron microscope (SEM, Hitachi S-4800) and a transmission electron microscope (TEM, Zeiss LEO 912, 120 kV). The X-ray photoelectron spectra (XPS) were recorded with a Surface Science Instruments ESCA M-Probe using monochromatic Al-Kα radiation ( = 1486.6 eV). The spectra were fitted and analysed with CasaXPS software. The X-ray absorption fine structure (XAFS) spectra at the uranium L3-edge (E0 = 17 166 eV) were collected at the BL14W1 beamline of the Shanghai Synchrotron Radiation Facility (SSRF). The energy was calibrated according to the absorption edge of the Zr foil at the K-edge (17 997 eV). Rheological experiments were performed on a rheometer (MCR301, Anton Paar): frequency sweep tests were carried out at a fixed strain of 0.5%; amplitude sweep tests were performed at a fixed frequency of 1 Hz. The UV-Vis measurements were performed on a PerkinElmer Lambda 750 spectrophotometer. The photoluminescence (PL) emission spectra were recorded with a Hitachi F-7000 luminescence spectrometer with an excitation wavelength of 375 nm. A light response test was performed by illumination under Xe light of 150 W.
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2

Comprehensive Particle Characterization

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Size and morphology of the particles were analyzed via transmission electron microscopy (TEM) studies using a ZEISS Leo912 microscope operated at an acceleration voltage of 120 kV. For sample preparation, diluted dispersions of the samples were prepared in ethanol, dropped onto a carbon-covered standard TEM grid (QUANTIFOIL Multi A) and dried under air. Phase purity and crystallinity of the samples was measured using a powder STOE-STADI MP X-Ray diffractometer (XRD) with Mo radiation (λ = 0.7093 Å) and measured peak patterns were compared to reference JCPDS files. Infrared spectra were acquired using a Perkin Elmer Fourier transform infrared (FTIR) spectrometer between 400 and 4000 cm−1. UV-vis spectroscopy (LAMBDA 950 Perkin Elmer) was employed to detect the dye-labeled miRNA on the particle surface. Zeta potential and hydrodynamic diameter of the particles were measured using aqueous dispersions (distilled water with a pH of 6.5) of the particles employing a Malvern Zetasizer NanoZS.
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