The surface and cross-sectional morphologies of the MAO and MAO-LDH coatings were observed via field-emission scanning electron microscopy (FE-SEM, Nova NanoSEM 450, US). And elemental compositions were detected using FE-SEM attached energy dispersive X-ray spectrometry (EDS) device. Chemical functional groups of the coatings were analyzed through Fourier transform infrared spectrometry (FT-IR, Nicolet 380, Thermo Electron Corporation, US) in the wavenumber range from 4000 to 400 cm−1 with a resolution of 1 cm−1. Crystallographic structure was detected through an X-ray diffractometer (XRD, Rigaku D/MAX2500PC, Japan) with a Cu target (λ = 0.154 nm) from 5° to 80° over 2θ range at a scanning rate of 8° min−1. Chemical compositions of the MAO-LDH coating was also revealed via X-ray photoelectron spectroscopy (XPS, ESCALAB250, Thermo VG Co, East Sussex, US) with an Al Kα X-ray source.
Nicolet 380
Manufactured by Thermo Fisher Scientific
Sourced in United States, United Kingdom
The Nicolet 380 is a Fourier Transform Infrared (FTIR) spectrometer designed for laboratory use. It is capable of analyzing the chemical composition of samples by detecting and measuring the absorption of infrared radiation. The core function of the Nicolet 380 is to provide accurate and reproducible infrared spectroscopic data for a variety of applications.
Automatically generated - may contain errors
Lab products found in correlation
D max 2500 pc, by Rigaku (5 mentions)
Nova nanosem 450, by Thermo Fisher Scientific (4 mentions)
Jem 2100f, by JEOL (4 mentions)
K alpha, by Thermo Fisher Scientific (2 mentions)
Nexsa, by Thermo Fisher Scientific (2 mentions)
Escalab 250xi, by Thermo Fisher Scientific (2 mentions)
Escalab 250, by Thermo Fisher Scientific (2 mentions)
D8 advance, by Bruker (2 mentions)
Zetasizer nano z, by Malvern Panalytical (2 mentions)
Sigma 300, by Zeiss (2 mentions)
Zetasizer nano, by Malvern Panalytical (1 mentions)
Fv1000, by Olympus (1 mentions)
X pert, by Philips (1 mentions)
Jem 2010f uhr, by JEOL (1 mentions)
Sdta851e, by Mettler Toledo (1 mentions)
Empyrean diffractometer, by Malvern Panalytical (1 mentions)
Zetasizer nano s device, by Malvern Panalytical (1 mentions)
Pl gpc50, by Agilent Technologies (1 mentions)
Talos f200x, by Thermo Fisher Scientific (1 mentions)
Sta 449, by Netzsch (1 mentions)
96 protocols using nicolet 380
1
Comprehensive Characterization of Coatings
2
Comprehensive Material Characterization Protocol
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The phase analysis was performed on an X-ray diffractometer (XRD, D/Max2500PC, Rigaku, Japan) by monochromatic Cu Kα radiation with a wavelength of 0.154056 nm at a scanning rate of 6° min−1. The chemical composition of the alloy surface was evaluated via a Fourier transform infrared spectrophotometer (FT-IR, Nicolet 380, Thermo Electron Corporation, USA) and an X-ray photoelectron spectroscopy (XPS, ESCALAB 250, Thermo VG Corporation, USA). Field emission scanning electron microscopy (FESEM, Nova NanoSEM 450, FEI, USA) was applied to observe the fracture surfaces and corrosion morphologies of the samples with an accelerating voltage of 15 kV.
3
Characterization of Mg Corrosion Products
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The surface functional groups of the samples were detected using Fourier transform infrared spectroscopy (FTIR, Nicolet380, Thermo Electron Corporation, USA). The phase composition of corrosion products was distinguished by an X-ray diffraction diffractometer (XRD, Riguta D/max 2500 PC, Japan) with a Cu Ka1 (λ = 0.15406 nm) source operated at 35 kV and 20 mA. The microstructure and surface morphology of pure Mg samples after hydrogen evolution test were characterized with field emission scanning electron microscope (FE-SEM, NOVA NANOSEM-450, USA). The chemical compositions of pure Mg surface corrosion products were probed by energy dispersive X-ray spectroscopy (EDS) and X-ray photoelectron spectroscopy (XPS, ESCALAB 250, Thermo VG Corporation, MA, USA) [56 ].
4
Characterization of Corrosion Products
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The constituents of corrosion products were examined by means of X-ray diffraction (XRD, Riguta D/max-RC, Japan) with a Cu Ka1 (λ = 0.15406 nm) source operated at 35 kV and 20 mA, Fourier transformed infrared (FTIR, Nicolet380, Thermo Electron Corporation, MA, USA) and X-ray photoelectron spectroscopy (XPS, ESCALAB 250, Thermo VG Corporation, MA, USA). The surface morphologies of the samples were examined by field emission scanning electron microscope (FE-SEM, NOVA NANOSEM-450, FEI Corporation, Portland, OR, USA).
5
Comprehensive Characterization of Reduced Graphene Oxide
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The electrochemical experiments were performed on a CHI660D electrochemical workstation (CH Instrumental Co., Shanghai, China). The morphology of RGO/CMC was observed by transmission electron microscopy (TEM, JEM-2010F UHR, JEOL Ltd., Tokyo, Japan). The spectral properties were characterized by ultraviolet-visible spectroscopy (UV-Vis, TU-1800PC, Puxi Tongyong Instrument, Beijing, China), Fourier-transform infrared spectroscopy (FT-IR, Nicolet-380, Thermo Electron Co., Waltham, MA, USA), Raman spectra instrument (Olympus FV1000, Olympus Co., Tokyo, Japan). The surface property of RGO/CMC colloidal aqueous solution was studied by Zeta potential analyzer (Zetasizer Nano, Malvern Instruments Ltd., Worcestershire, UK). The component percentage of sample were measured through thermal gravimetric analysis (TGA, SDTA851e, Mettler-Toledo Co., Zurich, Switzerland) with a heating rate of 10 °C·min−1 using pure nitrogen as a carrier gas. The crystal structures of GO and RGO/CMC were characterized by X-ray diffraction (XRD, X’Pert, Philips Co., Eindhoven, The Netherlands).
6
FTIR Analysis of Fabric Samples
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FTIR spectra of the fabric samples were recorded using a Nicolet 380 FTIR spectrophotometer (Thermo-Electron Corporation, Waltham, MA, USA) using transmission technique for KBr pellets by recording 50 scans in %T mode with a resolution of 4 cm−1 in the wave numbers range of 4000–400 cm−1.
7
Characterization of Sr-MMT and Na-MMT Coatings
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The surface morphology and thickness of Sr-MMT and Na-MMT coatings were observed by means of scanning electron microscope (SEM, Nova NanoSem 450) equipped with energy dispersive X-ray spectroscopy (EDS). The chemical bonds of the coatings were observed through Fourier transform infrared spectroscopy (FT-IR, Nicolet 380, Thermoelectron, USA). X-ray photoelectron spectroscopy (XPS, Thermo Scientific K-Alpha, USA) with mono AlKα radiation (hv = 1486.6 eV) was performed to analyze chemical composition of Sr-MMT and Na-MMT coatings.
The Micro Combi Tester (Anton Paar MCT and NHT, Austria) was used to evaluate binding force between Sr-MMT coating and Mg–Ca alloy matrix. The loading rate is 1.99 N·min−1, and the load range is 0.01 N ∼ 2 N. Scratch images are obtained by in situ optical microscope to determine where the coating failed.
The Micro Combi Tester (Anton Paar MCT and NHT, Austria) was used to evaluate binding force between Sr-MMT coating and Mg–Ca alloy matrix. The loading rate is 1.99 N·min−1, and the load range is 0.01 N ∼ 2 N. Scratch images are obtained by in situ optical microscope to determine where the coating failed.
8
Mineralogical Analysis of Bulk Sediment Samples
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Bulk samples (10–20 g) were collected in the field in plastic vials from each visible layer. Their location in the section was tagged and photographed. Mineralogical analysis was conducted using a Fourier transform infrared spectrometer (Nicolet 380; Thermo Electron Corp), focusing on the spectrum between 4,000 and 250 cm−1. Sample preparation was followed by the potassium bromide (KBr) standard procedure (50 ), and interpretation aided by a reference library at the Kimmel Center for Archaeological Science, Weizmann Institute. Identification of heat-altered clay minerals is based on criteria given by ref. 51 , and of heat-altered calcite based on criteria in ref. 52 . Nine of 14 samples (HA-2, -3a, -5, -6, -7, -10b, -11, -13a, -14) were further analyzed using optical microscopy in the form of grain mounts, prepared by mounting approximately 1 mg of sediment with a few drops of Entellan (Merc) on microscope slides, and analyzed under plane (PPL) and cross-polarized light (XPL) using a Nikon 50i POL polarizing light microscope.
9
Infrared Spectroscopy of Liquid Samples
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Infrared (IR) spectra were collected at 37 °C
in reflectance
geometry, from 800 to 4000 cm–1, using a Fourier-transform
spectrometer (Nicolet 380, Thermo-Electron Corp. Madison, WI, USA)
fitted with a deuterated triglycine sulfate (DTGS) detector and thermostatic
“Golden gate” attenuated total reflectance (ATR, SpecAc,
UK) sample stage with a diamond element. The optical path through
the spectrometer and ATR device were purged with dry, filtered air
to minimize interference due to atmospheric CO2 and water
vapor. Liquid specimens were placed directly onto the ATR element,
covered with a glass coverslip, and sealed around the edges with petroleum
jelly to prevent evaporation, and 64 scans were collected at 4 cm–1 resolution.
in reflectance
geometry, from 800 to 4000 cm–1, using a Fourier-transform
spectrometer (Nicolet 380, Thermo-Electron Corp. Madison, WI, USA)
fitted with a deuterated triglycine sulfate (DTGS) detector and thermostatic
“Golden gate” attenuated total reflectance (ATR, SpecAc,
UK) sample stage with a diamond element. The optical path through
the spectrometer and ATR device were purged with dry, filtered air
to minimize interference due to atmospheric CO2 and water
vapor. Liquid specimens were placed directly onto the ATR element,
covered with a glass coverslip, and sealed around the edges with petroleum
jelly to prevent evaporation, and 64 scans were collected at 4 cm–1 resolution.
10
FTIR Characterization of Solid Samples
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FT-IR
spectra of dried samples in KBr disks were recorded at room temperature
using an FT-IR Nicolet 380 from Thermo Electron Corporation working
in the range of wavenumbers 4000–400 cm–1 at a resolution of 2 cm–1. A finely ground, approximately
0.05% (w/w) mixture of the sample in KBr was pressed into a transparent
disk using a hydraulic press and applying a pressure of about 670
MPa.
spectra of dried samples in KBr disks were recorded at room temperature
using an FT-IR Nicolet 380 from Thermo Electron Corporation working
in the range of wavenumbers 4000–400 cm–1 at a resolution of 2 cm–1. A finely ground, approximately
0.05% (w/w) mixture of the sample in KBr was pressed into a transparent
disk using a hydraulic press and applying a pressure of about 670
MPa.
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