D4 x ray diffractometer
The D4 X-ray diffractometer is a versatile instrument designed for powder X-ray diffraction analysis. It is capable of collecting high-quality X-ray diffraction data from a wide range of samples, including crystalline materials, powders, and thin films. The instrument utilizes a copper X-ray source and a state-of-the-art detector to provide reliable and accurate results.
Lab products found in correlation
11 protocols using d4 x ray diffractometer
Characterization of I3-SMARS using Multi-Modal Techniques
Synthesis and Characterization of Tungsten-Molybdenum Oxides
Characterization of Upconversion Nanoparticles
Comprehensive Characterization of Porous Materials
Characterization of rGO in Salts
Synthesis and Characterization of Silver Nanoparticles
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Comprehensive Characterization of Nanomaterials
Materials Characterization of Novel Compounds
Nanomaterial Characterization by Comprehensive Analytical Techniques
Characterization of Fe3O4@PDA@Cu-MOFs
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