Jsm 7600f microscope

The ¹H NMR spectra of the microgel was studied using a VARIAN 400 spectrometer (400 MHz). Transmission electron microscopy (TEM) images were obtained using a JEOL (Tokyo, Japan) 2100 microscope operated at 200 kV. Field emission scanning electron microscopy (FESEM) studies were performed on a JSM 7600 F microscope (JEOL, Tokyo, Japan) at 5 kV. UV-Vis spectra of the samples were recorded using a Shimadzu (Tokyo, Japan) 2550 spectrophotometer. Finally, the size of the composite particles dispersed in water (20 mg/mL) was determined by Malvern Nano ZS dynamic light scattering (DLS) varying from 20 to 50 °C.

X-ray diffraction (XRD) measurements were performed on a Bruker Powder D8 Advance diffractometer (Billerica, MA, USA) at 40 kV and 40 mA using CuKa radiation (λ = 1.5418 Angstrom). DRUV/Vis spectra were recorded on a Shimadzu UV-2450 spectrophotometer (Kyoto, Japan) at 298 K using BaSO₄ as a reference. FTIR spectra were recorded as KBr pellets on a Shimadzu IRPrestige-21 spectrometer (Kyoto, Japan). FTIR spectrum of pyridine adsorbed on TS-1 zeolites was tested at 298 K in a sealed reaction cell with KBr windows. A self-supporting disc (20 mg with 2.0 cm diameter) was prepared and evacuated at 723 K for 1 h. Subsequently, pyridine vapor was introduced and kept for 30 min. Excess pyridine was removed by vacuuming at 423 K for 30 min. The FTIR spectrum was collected in absorbance mode after the disc cooled to room temperature. Nitrogen adsorption–desorption isotherms were measured on a TriStar II 3020 sorption analyzer (Norcross, GA, USA) at 77 K. Elemental analyses (Si, Ti, and Na) were performed on an inductively coupled plasma optical emission spectrometer (Shimadzu ICPE-9000 spectrometer, Kyoto, Japan). Scanning electron microscopy (SEM) images were obtained on a JEOL JSM-7600F microscope (Tokyo, Japan) operated at 20 kV. Particle sizes were measured on a Malvern Zetasizer Nano ZS90 analyzer (Malvern, UK).

SEM was performed using a JEOL JSM-7600F microscope with an accelerating voltage of 5 kV. Before performing the SEM measurements, the samples were prepared by depositing dilute solutions of gels on silicon wafers, followed by drying and coating them with a thin layer of Pt to increase the contrast.

X-ray diffraction (XRD) data were acquired by a SmartLab apparatus (Rigaku, Tokyo, Japan). N₂ adsorption/desorption isotherms were obtained at 77 K using a BELSORP-Minix (MicrotracBEL, Osaka, Japan) apparatus. The Brunaur–Emmett–Teller (BET) method was used to calculate the specific surface area. The non-local density functional theory (NLDFT) model was adopted to calculate the pore size distribution. The microstructure was characterized by field-emission scanning electron microscopy (FESEM) using a JSM-7600F microscope (JEOL, Tokyo, Japan). The chemical valence states were characterized by X-ray photoelectron spectroscopy (XPS) using a Nexsa spectroscope (Scientek, Delta, BC, Canada). The data were calibrated by carbon with binding energy of 284.8 eV.

The SEM images were recorded using a JEOL JSM 7600 F microscope operating at 5 kV. The AFM images were recorded using a NanoWizard 3 from JPK instruments. TEM imaging was performed on a Hitachi H9000-NAR microscope (LaB₆ filament, 300 kV, Scherzer resolution: 0.18 nm). For the TEM analyses, the nanowires were sliced with an ultra-microtome to a thickness of around 100 nm and dispersed on a carbon-coated TEM grid.

All samples were platinum-coated in an ion sputter prior to the observation. BC-PANI and CC-PANI was imaged using a JSM-7600F microscope (JEOL Ltd., Tokyo, Japan) at 2.0 kV. The PANI sample without BC or MC was imaged at 3.0 kV.