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Em scd005

Manufactured by Leica
Sourced in Germany, Czechia, United States

The EM SCD005 is a sputter coater device designed for the preparation of samples for electron microscopy. It is a high-vacuum system that deposits a thin, uniform layer of conductive material, such as gold or platinum, onto the surface of a sample to enhance its conductivity and improve image quality during scanning electron microscope (SEM) or transmission electron microscope (TEM) observation.

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32 protocols using em scd005

1

Scanning Electron Microscopy of Shell Tissue

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For imaging of the shell tissue and single cells, oven-dried samples (24 h at 60 °C) were mounted on aluminum stubs with double-sided sticky carbon tapes and gold sputtered with a sputter coater (LEICA EM SCD005) prior to visualization under a scanning electron microscope (FEI Apreo). Scanning parameters were set to 1.0 kV beam voltage and 6.3 pA current. A work distance between 3.3 and 7.8 mm was chosen depending on the magnification.
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2

Cell Attachment on Titanium Alloy Samples

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The cell attachment properties were examined as described by Ahmed et al. [29 (link)]. The titanium alloy samples were sterilized using autoclaved and UV in 6-well plates. After preparing the medium having 105 cells, 250 μL of prepared medium was added onto the top of every sample and left for 30 min. After that, at the side of each well, 5 mL of prepared medium was added slowly, and the plate was incubated at 37°C and 5% CO2 for 24 and 72 hours. The samples were washed by sterile distilled water after each time interval. Next, 2.5% glutaraldehyde (Merck, Germany) was added for 2 hours, and the samples were dehydrated in ethanol at five concentrations (30% and 50%, 10 min each; 70%, 90%, and 100%, 5 min each) and the samples were dried. After complete dryness, the samples were fitted onto aluminum stubs via carbon double-sided tape, coated with gold using a sputter coating machine (Leica EM SCD005, Czech Republic), and then viewed under scanning electron microscopy (SEM).
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3

Nanofiber Morphology and Composite Cement Analysis

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The morphology of electrospun nanofibers and the prepared composite cement cross-sections were examined using SEM (TESCAN MIRA3). For this purpose, the samples were first mounted on an aluminum stub to be sputter-coated with a layer of gold (Leica EM SCD005, Wetzlar, Germany) for 1 min. When sputtering the samples with gold, the value of the vacuum was 10 Pa. To observe the samples’ morphology, high-resolution SEM with a solid-state secondary ion detector and an acceleration voltage of 30 kV was employed. The average diameter of the electrospun fibers was measured by detecting 50 fibers randomly from SEM images and analyzing them by using ImageJ® 1.53g software (NIH, Bethesda, MD, USA). Additionally, the surfaces of the CPC composites were observed by SEM after cell seeding, following the preparation described in Section 2.4.6.
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4

Morphological Characterization by SEM-EDS

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The morphological studies were carried out by scanning electron microscopy (SEM, MIRA3 by Tescan™) equipped with an energy-dispersive X-ray analyzer (EDS) [93 ]. Before the analysis, the carbonaceous material was sputtered with a carbon coater (EM SCD005, Leica™).
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5

Characterization of Fe3O4 Nanoparticles

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FE-SEM was used to analyze the topographic details on the surface of the nanoparticles. images were obtained with an accelerating voltage of 10 kV using a Tescan model MIRA3 (Tescan company, Czech Republic). All samples were coated with 8nm gold using a gold sputter Leica EM SCD005 instrument before imaging. The morphology of synthesized Fe3O4 was analyzed by using a transmission electron microscope (TEM, Zeiss EM10C, Oberkochen, Germany) at 100 kV.
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6

Nanoparticle Size and Morphology Analysis

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The size distribution of the particles was measured by dynamic light scattering (DLS) (Zetasizer Nano ZS, Malvern Instruments, United Kingdom). Size measurement was performed in triplicate at room temperature. The morphology of the nanoparticles was observed by atomic force microscopy (AFM, Bruker, Germany). A drop of nanoparticles was spread on mica and imaged using Tap 150Al-G Silicon AFM probes in ScanAsyst mode. The nanoparticles were also observed using a scanning electron microscope (SEM, PHILIPS XL-30E, Netherlands) at an acceleration voltage of 10 kV. The samples were sputter-coated with gold using a sputtering device (Leica EM SCD005, Germany). All tests were performed in triplicate.
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7

Evaluating Cell Attachment and Viability

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To evaluate the cell attachment and viability of the material, SHED-seeded APC and APC-CT were observed after the direct contact by field emission scanning electron microscopy (FESEM) as described earlier [29 (link)]. The materials were placed in 6-well plates and seeded with 1.5 × 105 cells on top of the material discs and left for 30 min. The wells were filled with culture medium to cover the seeded cells and then incubated at 37 °C in 5% CO2. After 3 days, the cells were washed with distilled water and fixed with 2.5% glutaraldehyde at 4 °C for 2 h and then dehydrated in graded series of ethanol concentrations (30%, 50% for 10 min each; 70%, 90%, 100%, 100% for 5 min each) and dried in a desiccator. Eight material discs (two per group) were prepared for cell attachment examination. Then, the material specimens were gold-coated by a sputter coating machine (EM SCD005, Leica, Wetzlar, Germany) and viewed by FESEM (Quanta FEG 450, Fei, Hillsboro, OR, USA).
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8

Scanning Electron Microscopy of Proniosomes

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The Scanning electron microscopy (SEM) is a microscope that uses electron beams to produce an accurate image of the sample, through focusing the beam of electrons to interact with the atoms producing various signals that are translated into information regarding the topography and the composition of the sample. The topography (surface morphology), as well as the proniosome’s shape, was studied using the SEM. Proniosome powders (FN1, FN2, and FN3) were examined separately by SEM. Each sample was sprinkled over an aluminum stub using double-sided adhesive carbon tape, then samples were stored under a vacuum until total removal of air in ‘Leica Em SCD005′ sputter coater. The samples were sputter-coated with gold for 60 s to get a thickness of 14 nm. After the coating, the surface morphology (roundness, smoothness, and formation of aggregates) of proniosomes was scanned by Carl Zeiss AG-EVO® 50 Series under a magnification power that ranged from 50 x to 4k x [15 (link)].
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9

Analyzing Fractured Filament Surfaces

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As the first step, fracture surfaces of the three types of filaments used were analyzed, after brittle fracture in liquid nitrogen, using SEM, namely the neat filament of PA6,6 only and the pair of composite filaments with 5 and 10 wt.% reinforcement in recycled CFs. Prior to the SEM analysis, the specimens were sputter-coated with carbon to make the material conductive for the analysis. This pre-treatment was performed using an EM SCD005 vacuum sputter coater (Leica, Wetzlar, Germany).
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10

SEM Analysis of Sample Microstructure

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Scanning electron microscopy (SEM) analysis was conducted using a Mira3 FEG-SEM (Tescan, Brno, Czech Republic). Prior to the study, each sample was cut into small pieces of approximately 1 cm. Subsequently, the fragments were fixed, through a carbon adhesive tape, on a metallic stub and then made conductive by graphite sputtering (EM SCD005 vacuum sputter coater, Leica, Wetzlar, Germany).
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