Jem 2010fx
The JEM 2010FX is a transmission electron microscope (TEM) produced by JEOL. It is designed to provide high-resolution imaging and analysis of samples at the nanoscale level. The JEM 2010FX features a high-brightness electron gun, advanced optics, and a robust mechanical design to enable detailed examination of various materials and structures.
Lab products found in correlation
3 protocols using jem 2010fx
Characterization of Cu-Doped Biochar Adsorbents
Characterization of Pluronic Copolymers
from Sigma-Aldrich.
Optical absorbance spectra were measured using a JASCO V-770 spectrophotometer
with a 1 cm cell path length and with a UV/vis bandwidth of 2.0 nm.
JAC ultrasonic 1505 (150 W, 40 kHz) was used for sonication. TEM images
were obtained with a JEOL JEM 2010FX operating at 200 kV. SEM images
were obtained with a JEOL JSM 6700F with an operating voltage of 5.0
kV.
Synthesis and Characterization of Pluronic Copolymer Nanostructures
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