FtsZ polymerization reactions were performed essentially as described above but without BSA. After 5 mins at room temperature a 10-μl aliquot was placed on a carbon-coated copper grid, negatively stained with 2% uranyl acetate for 5–10 secs, and wicked dry. Images were collected on a JEOL 2100 Lab6 TEM operated at 200kV with 30 pA/cm2 current density and recorded on a US1000 XP1 camera at a nominal magnification of X 30,000, unless otherwise mentioned.
2100 lab6 tem
Manufactured by JEOL
The JEOL 2100 Lab6 TEM is a transmission electron microscope (TEM) designed for high-resolution imaging and analysis of a wide range of materials. It features a LaB6 electron source, providing high brightness and excellent resolution. The 2100 Lab6 TEM is capable of achieving a point-to-point resolution of 0.23 nm and a line resolution of 0.14 nm. This model is suitable for a variety of applications, including materials science, nanotechnology, and life sciences research.
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Lab products found in correlation
4 protocols using 2100 lab6 tem
1
FtsZ Polymerization Imaging Protocol
2
Multimodal Characterization of Nanomaterials
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The microstructure
and morphology
of the prepared samples was observed with a Hitachi SU-70 FEG-SEM
at 10 kV, a JEOL 2100 LaB6 TEM operated at 200 kV, and
a JEOL TEM/STEM FEG also operated at 200 kV. A 22 mrad probe convergence
angle was used to perform STEM imaging. HAADF detector in the JEOL
2100 FEG TEM with 90 mrad inner-detector angle was utilized to obtain
the Z-contrast atomic resolution images. For EDS
data collection, an Oxford X-max 100TLE windowless X-ray detector
was utilized. The average particle size and distribution were determined
by ImageJ software using at least three microscopy images per sample.
Raman measurements were performed with a Labram Aramis model by Horiba
Jobin-Yvon using a 532 nm laser and an integration time of 4 s, which
was repeated at least four times per sample. XPS analysis was performed
on a Kratos Axis 165 X-ray photoelectron spectrometer. XRD data was
collected by a D8 Advanced (Bruker AXS, Fitchburg, WI, USA).
and morphology
of the prepared samples was observed with a Hitachi SU-70 FEG-SEM
at 10 kV, a JEOL 2100 LaB6 TEM operated at 200 kV, and
a JEOL TEM/STEM FEG also operated at 200 kV. A 22 mrad probe convergence
angle was used to perform STEM imaging. HAADF detector in the JEOL
2100 FEG TEM with 90 mrad inner-detector angle was utilized to obtain
the Z-contrast atomic resolution images. For EDS
data collection, an Oxford X-max 100TLE windowless X-ray detector
was utilized. The average particle size and distribution were determined
by ImageJ software using at least three microscopy images per sample.
Raman measurements were performed with a Labram Aramis model by Horiba
Jobin-Yvon using a 532 nm laser and an integration time of 4 s, which
was repeated at least four times per sample. XPS analysis was performed
on a Kratos Axis 165 X-ray photoelectron spectrometer. XRD data was
collected by a D8 Advanced (Bruker AXS, Fitchburg, WI, USA).
3
Cryo-EM Sample Preparation Protocol
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To prepare samples for Cryo‐EM, 10 ml of cultures was centrifuged at 5000g for 20 min. The pellets were resuspended with 50 μl of buffer (10 mM Tris–HCl, 100 mM NaCl, 5 mM CaCl2). The 5 μl droplets of preparations were adsorbed onto a holey carbon‐coated TEM support grid (QUANTIFOIL®) typically used for Cryo‐EM. After removing the excess liquid with Whatman® paper, the grids were quickly immersed in liquid ethane and transferred into the microscope using a side entry nitrogen‐cooled cryoholder (Gatan, 626‐DH cryotransfer system). The observations were performed with a Cryo‐EM JEOL 2100 LaB6 TEM with an accelerating voltage of 200 kV, at the nominal magnification of 10 000. Images were recorded under low dose conditions with ultra‐scan 1000 camera (Gatan, 2 k × 2 k pixels CCD).
4
Transmission Electron Microscopy Protocols
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TEM data were obtained using a FEI Titan G2 80–200 TEM/STEM with ChemiSTEMTechnology operating at 200 kV, plus a JEOL 2100 LaB6 TEM operating at 200 kV equipped with a Gatan Orius CCD camera and Tridiem energy filter. Both instruments were located in the Centre for Microscopy, Characterisation and Analysis (CMCA) at The University of Western Australia. HAADF (high angle annular dark-field) STEM images, EDS maps and spectra were obtained on the FEI Titan. Energy filtered (EFTEM) elemental maps were obtained on the JEOL 2100 using the conventional three-window technique, with energy windows selected to provide optimum signal-to-noise. Selected area electron diffraction (SAED) was performed on the JEOL 2100 using an aperture that selected a 200 nm diameter area of the sample.
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