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7 protocols using quanta 250f

1

Mn-Fe-Ni-Si-Ge/Sn Composite Synthesis

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The Mn0.66Fe0.34Ni0.66Fe0.34Si0.66Ge0.34 precursor was prepared by the method mentioned in ref.12 (link). For synthesizing the Mn0.66Fe0.34Ni0.66Fe0.34Si0.66Ge0.34/Sn composite, the precursor alloy was ground into powders using a ceramic mortar by hand, and then mixed with the commercial Sn powders with an average size of 43 μm for one more hour grinding using an agate mortar. The mixed powders were hot-pressed at 280 °C under 250 MPa for 5 min in vacuum and then slowly cooled to RT in 6 hrs. The applied pressure is maintained till the sample is cooled to RT.
The structural transition was investigated by DSC (Mettler Toledo, DSC 3) with a ramp rate of 10 K/min. The structural characterization was performed by XRD (Bruker, D8 Advance) at RT with Cu-Ka radiation. The cross-sectional microstructure was observed by SEM (FEI Quanta 250F). The elemental mapping image was obtained by energy-dispersive spectroscopy (FEI Quanta 250F). The M-T curve was carried out using a Physical Property Measurement System (Quantum Design, Dynacool) with a ramp rate of 2 K/min. The yield compressive strength was tested by an universal testing machine. The thermal expansion was investigated by thermomechanical analysis (402 F3 Hyperion).
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2

Characterization of Cs3Cu2I5:Mn Perovskite

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Powder X-ray diffraction was characterized by an X-ray diffractometer (Bruker D8 Advance XRD system), and the morphology and elements of Cs3Cu2I5:Mn were detected by a scanning electron microscope (SEM, FEI Quanta 250 F). X-ray photoelectron spectroscopy (XPS) measurements were performed using an achromatic Al Kα source (1486.6 eV) and a double pass cylindrical mirror analyzer (PHI QUANTERA II). The thermal gravimetric analyses were conducted on STA7000, HITACHI. Emission and excitation spectra were collected on Varian Cary Eclipse instrument. The PL lifetimes were measured by FLSP920 (EDINBURGH INSTRUMENTS LTD) equipped with both ns and μs light sources. The absolute quantum yield of the samples was determined using a Quantaurus-QY absolute photoluminescence quantum yield spectrometer (C9920-02G, Hamamatsu Photonics, Japan). The X-ray source is produced from a commercial Amptek mini-x tube with Ag target and a maximum output power of 4W. All the radioluminescence and temperature-dependent spectra were recorded with a fiber spectrometer (QE65PRO, Ocean Optics). The nuclear battery performances were measured with Keithley 2400 under the irradiation of X-ray.
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3

Nanothermite Characterization and Ignition

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The structural and compositional information of the prepared materials were obtained by X-ray diffraction (XRD), (Bruker D8 Advance, Bruker, Karlsruhe, Germany). The morphological features and the element distribution of the obtained samples on Ni substrates were characterized by field emission scanning electron microscopy (SEM) (Quanta 250F, FEI, Hillsboro, OR, USA), equipped with an energy dispersive X-ray spectrometer (EDS), transmission electron microscopy (TEM) (FEI Tecnai G2 20 LaB6, FEI, Hillsboro, OR, USA), and high resolution transmission electron microscopy (HRTEM) (FEI Tecnai G2 F30 S-Twin, FEI, Hillsboro, OR, USA). The element mappings were also performed on the HRTEM. Differential scanning calorimetry (DSC) (TGA/DSC 3+, Mettler Toledo, Zurich, Switzerland), was used to determine the reaction heats of the nanothermites from 300 to 900 °C at a heating rate of 10 °C·min−1 under 30 mL·min−1 N2 flow. In addition, the ignition performances of the nanothermite film were studied by a Nd:YAG laser device and a high-speed camera. The wavelength, the pulse width and the incident laser energy were 1064 nm, 6.5 ns and 30 mJ, respectively.
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4

SEM Imaging of Failed Tendon Enthesis

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Failed tendon enthesis samples (n = 10) were dried at 37°C, fixed on SEM aluminum pin mounts using carbon tape and silver paint, and carbon-coated (30 nm). Prepared samples were imaged by scanning electron microscope (FEGSEM, Quanta 250F, FEI Company, Hillsboro, OR, USA) in backscattered electron mode using a concentric backscattered detector and acceleration voltages of 5 to 15 kV and different magnifications from ×250 to ×20,000. SEM was carried out using facilities at the University Service Centre for Transmission Electron Microscopy, TU Wien, Austria.
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5

Comprehensive Characterization of MOF-5

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The infrared spectra (FTIR) of the samples were recorded in the range of 4000–400 cm−1 using a Bruker ALPHA FT-IR spectrophotometer. The concentration of Zn metal in MOF-5 was analyzed using inductively coupled plasma emission spectroscopy (ICP-OES) to establish the structure. X-ray diffraction (XRD) studies were carried out using the powder X-ray diffractometer of the Bruker-AXS D8 DISCOVER instrument (Cu Kα radiation λ = 1.540 Å). The surface structure of MOF-5 was established using a field emission scanning electron microscope (FESEM—FEI Quanta 250F). Thermogravimetric analyses (TGA) were conducted to understand the thermal stability of the adsorbent samples. Quantitative analysis of the extraction of PNPs was carried out using a Shimadzu UV-1601 UV-Vis spectrophotometer and an Agilent Cary Eclipse fluorescence spectrophotometer. The size and surface charges of the prepared PNPs were measured using a Malvern Zeta sizer Nano-ZS90 instrument. BET, pore size, total pore volumes, and Langmuir surface areas of the samples were determined from nitrogen (N2) adsorption isotherms using the Quantachrome Autosorb iQ C-XR model to determine the pore size and surface area. The samples were degassed for 12 h at 120 °C before analyzing the sample.
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6

Comprehensive Characterization of Photocatalysts

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Powder X-ray diffraction (XRD) patterns
of the photocatalysts were conducted on an XD-3 diffractometer (Beijing
Purkinje General Instrument Co., Ltd., China). Fourier transform infrared
(FT-IR) spectra were analyzed on an IS10 FT-IR spectrometer (Nicolet,
U.S.A.) by mixing the samples with KBr. The morphologies of the photocatalysts
were observed through a Quanta 250F field-emission scanning electron
microscope (FE-SEM) (FEI, U.S.A.) and JEM-2100 high-resolution transmission
electron microscope (HR-TEM) (JEOL, Japan). The energy-dispersive
X-ray spectra (EDS) and elemental mappings were also collected on
the SEM instrument. X-ray photoelectron spectroscopy (XPS) was applied
to collect the electron states on the surface of the catalysts, which
were obtained on an ESCALAB 250 spectrometer (Thermo, U.S.A.). Diffuse
reflectance spectroscopy (DRS) on a Shimadzu UV-2550 UV–vis
spectrophotometer (Shimadzu, Japan) was carried out for the characterization
of UV–vis absorption spectra of catalysts. The photoluminescence
spectra (PL) were studied by ELabram-HR800.
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7

EBSD Analysis using FEI Quanta 250F SEM

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The EBSD analysis was performed using an FEI Quanta 250F environmental scanning electron microscope (SEM) equipped with an EDAX Hikari camera for capturing the EBSD patterns. For EBSD pattern acquisition, the microscope was operated at a 20 kV accelerating voltage and 9.5 mm working distance with the sample tilted to 70 degrees (the maximum allowed tilt for this microscope) using the EDAX-TEAM EBSD data acquisition and data analysis software from EDAX. The EBSD system was carefully calibrated at the given working distance before the performing the experiments.
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