The structural transition was investigated by DSC (Mettler Toledo, DSC 3) with a ramp rate of 10 K/min. The structural characterization was performed by XRD (Bruker, D8 Advance) at RT with Cu-Ka radiation. The cross-sectional microstructure was observed by SEM (FEI Quanta 250F). The elemental mapping image was obtained by energy-dispersive spectroscopy (FEI Quanta 250F). The M-T curve was carried out using a Physical Property Measurement System (Quantum Design, Dynacool) with a ramp rate of 2 K/min. The yield compressive strength was tested by an universal testing machine. The thermal expansion was investigated by thermomechanical analysis (402 F3 Hyperion).
Quanta 250f
The Quanta 250F is a high-resolution scanning electron microscope (SEM) designed for advanced materials characterization. It features a field emission gun (FEG) electron source and a range of advanced imaging and analytical capabilities.
Lab products found in correlation
7 protocols using quanta 250f
Mn-Fe-Ni-Si-Ge/Sn Composite Synthesis
The structural transition was investigated by DSC (Mettler Toledo, DSC 3) with a ramp rate of 10 K/min. The structural characterization was performed by XRD (Bruker, D8 Advance) at RT with Cu-Ka radiation. The cross-sectional microstructure was observed by SEM (FEI Quanta 250F). The elemental mapping image was obtained by energy-dispersive spectroscopy (FEI Quanta 250F). The M-T curve was carried out using a Physical Property Measurement System (Quantum Design, Dynacool) with a ramp rate of 2 K/min. The yield compressive strength was tested by an universal testing machine. The thermal expansion was investigated by thermomechanical analysis (402 F3 Hyperion).
Characterization of Cs3Cu2I5:Mn Perovskite
Nanothermite Characterization and Ignition
SEM Imaging of Failed Tendon Enthesis
Comprehensive Characterization of MOF-5
Comprehensive Characterization of Photocatalysts
of the photocatalysts were conducted on an XD-3 diffractometer (Beijing
Purkinje General Instrument Co., Ltd., China). Fourier transform infrared
(FT-IR) spectra were analyzed on an IS10 FT-IR spectrometer (Nicolet,
U.S.A.) by mixing the samples with KBr. The morphologies of the photocatalysts
were observed through a Quanta 250F field-emission scanning electron
microscope (FE-SEM) (FEI, U.S.A.) and JEM-2100 high-resolution transmission
electron microscope (HR-TEM) (JEOL, Japan). The energy-dispersive
X-ray spectra (EDS) and elemental mappings were also collected on
the SEM instrument. X-ray photoelectron spectroscopy (XPS) was applied
to collect the electron states on the surface of the catalysts, which
were obtained on an ESCALAB 250 spectrometer (Thermo, U.S.A.). Diffuse
reflectance spectroscopy (DRS) on a Shimadzu UV-2550 UV–vis
spectrophotometer (Shimadzu, Japan) was carried out for the characterization
of UV–vis absorption spectra of catalysts. The photoluminescence
spectra (PL) were studied by ELabram-HR800.
EBSD Analysis using FEI Quanta 250F SEM
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