Three Itokawa particles (RA-QD02-0286, RA-QD02-0292, and RA-QD02-0325) were transferred onto an adhesive carbon-conductive tape for further analysis. We determined the elemental compositions of their surfaces with an energy-dispersive X-ray spectrometer (EDX) using an FE-SEM (Hitachi SU6600) equipped with a X-MaxN 150 mm2 (Oxford Instruments) in JAXA and an FE-SEM (Hitachi SU6600) equipped with a Bruker XFlash® FlatQUAD detector at the Institute for Molecular Science (IMS, Higashi-Okazaki, Japan). The accelerating voltage for SE imaging was 1.5 kV, whereas for EDS analysis we used 5 and 10 kV.
Su6600
The SU6600 is a scanning electron microscope (SEM) developed by Hitachi. It provides high-resolution imaging and analysis of various materials. The SU6600 features a field emission electron source, advanced electron optics, and a range of detectors to enable detailed examination of samples.
Lab products found in correlation
104 protocols using su6600
Analyzing Itokawa Regolith Particles
Three Itokawa particles (RA-QD02-0286, RA-QD02-0292, and RA-QD02-0325) were transferred onto an adhesive carbon-conductive tape for further analysis. We determined the elemental compositions of their surfaces with an energy-dispersive X-ray spectrometer (EDX) using an FE-SEM (Hitachi SU6600) equipped with a X-MaxN 150 mm2 (Oxford Instruments) in JAXA and an FE-SEM (Hitachi SU6600) equipped with a Bruker XFlash® FlatQUAD detector at the Institute for Molecular Science (IMS, Higashi-Okazaki, Japan). The accelerating voltage for SE imaging was 1.5 kV, whereas for EDS analysis we used 5 and 10 kV.
Scanning Electron Microscopy Analysis of Atelocollagen Microstructure
Dentin Disc Preparation and Analysis
Scanning Electron Microscopy Sample Preparation
Electron Microscopy of Enterococcus Phage Infection
Characterization of Lignin Aggregates
in DMF and chloroform solutions were evaluated by a dynamic light
scattering (DLS) method using a ζ-potential and a particle size
analyzer (ELSZ2000ZS; Otsuka Electronics Co., Ltd., Osaka, Japan).
In addition, each solution was cast onto a glass coverslip and dried
in air for 1 week to remove the solvent prior to conducting scanning
electron microscopy (SEM) and Fourier transform infrared (FT-IR) spectroscopy
analysis. SEM observations were performed using an SU-6600 instrument
(Hitachi High-Technologies Corporation, Tokyo, Japan). Samples were
placed on an SEM stub, coated in gold, and then analyzed at an accelerating
voltage of 5 kV. FT-IR spectra were recorded in the attenuated total
reflectance (ATR) mode (IRAffinity-1S instrument, Shimadzu Co., Kyoto,
Japan).
Membrane Microstructure Analysis by SEM
Fabrication and Characterization of Nanoporous Gold Substrates
Scanning Electron Microscopy of Amphipod Exoskeleton
SEM Analysis of Hydrogel Microstructure
About PubCompare
Our mission is to provide scientists with the largest repository of trustworthy protocols and intelligent analytical tools, thereby offering them extensive information to design robust protocols aimed at minimizing the risk of failures.
We believe that the most crucial aspect is to grant scientists access to a wide range of reliable sources and new useful tools that surpass human capabilities.
However, we trust in allowing scientists to determine how to construct their own protocols based on this information, as they are the experts in their field.
Ready to get started?
Sign up for free.
Registration takes 20 seconds.
Available from any computer
No download required
Revolutionizing how scientists
search and build protocols!