The MFM observations are performed with scanning probe microscopy (MFP-3D, Asylum Research). For the measurements, a low-moment magnetic tip (PPP-LM-MFMR, Nanosensors) is selected, and the distance between the tip and sample is maintained at a constant distance of 30 nm. The VFM3 component (Asylum Research) is integrated into the MFP-3D to vary the perpendicular magnetic field.
Mfp 3d
Manufactured by Oxford Instruments
Sourced in United States, United Kingdom, Japan
The MFP-3D is a high-performance atomic force microscope (AFM) designed for advanced nanoscale imaging and analysis. It provides precise measurements of surface topography, mechanical properties, and other nanoscale characteristics of a wide range of materials and samples.
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Lab products found in correlation
Efm 50, by NanoWorld (4 mentions)
Protease inhibitor cocktail, by Thermo Fisher Scientific (4 mentions)
S 4800, by Hitachi (3 mentions)
Igor pro software, by Wavemetrics (3 mentions)
Ac240, by Olympus (3 mentions)
Ac240ts, by Olympus (3 mentions)
Axio observer z1, by Zeiss (3 mentions)
Nicolet 6700, by Thermo Fisher Scientific (3 mentions)
Msnl 10 e, by Bruker (3 mentions)
Bx53m microscope, by Olympus (2 mentions)
All in one tl, by Budget Sensors (2 mentions)
Csc37, by MikroMasch (2 mentions)
S 4800 microscope, by Hitachi (2 mentions)
Igor pro 6, by Wavemetrics (2 mentions)
Supra 55vp, by Zeiss (2 mentions)
Silicon afm tips, by Nanosensors (2 mentions)
Escalab 250xi, by Thermo Fisher Scientific (2 mentions)
Pe300bfm, by Excelitas (1 mentions)
Jem 2010f microscope, by JEOL (1 mentions)
Ir prestige 21 spectrophotometer, by Shimadzu (1 mentions)
194 protocols using mfp 3d
1
Scanning Probe Microscopy Magnetic Analysis
2
Characterization of I3-SMARS using Multi-Modal Techniques
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The optical images were monitored with an Olympus BX53M microscope in bright-field mode, equipped with a homemade temperature/magnetic dual-controlled microscope stage. Field emission SEM and elemental analysis were performed on a JEOL FEG JSM-7001F microscope equipped with an Oxford/INCA EDS. Transmission electron microscopy (TEM) images were obtained using a JEOL JEM-2010F microscope. Fourier transform infrared spectroscopy spectrum was collected on a Shimadzu IR Prestige-21 spectrophotometer. Ultraviolet-visible (UV-vis) absorption spectra were recorded on a Shimadzu UV-3600 UV-vis near-infrared spectrophotometer. X-ray diffraction was carried out on a Bruker D4 X-ray diffractometer. AFM images were collected on a commercial scanning probe microscope (SPM) instrument (MFP-3D, Asylum Research, CA, USA). The temperature and open-circuit voltage of I3−-SMARS were recorded on a nanovoltmeter (Keithley 2182A). The infrared camera was used to capture infrared image and surface temperature. Simulated sunlight with a radiation intensity of 5 kW m−2 was provided by a 300-W Xenon lamp (Excelitas, PE300BFM).
3
Characterization of Sb2S3 Bulks and Nanosheets
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The microstructure/morphology of the as-prepared Sb2S3 bulks and nanosheets was investigated by XRD (GBC MMA) with Cu Kα radiation; field-emission SEM (FESEM) (JEOL 7500); TEM (JEOL ARM-200F) with high-resolution TEM (HRTEM), and Raman spectroscopy (Jobin Yvon HR800) employing a 10 mW helium/neon laser at 632.8 nm. A commercial AFM (Asylum Research MFP-3D) was used to measure the morphology and thickness of the SBS nanosheets in trapping mode. An Al coated n-silicon probe with resonance frequency of 204–497 kHz and force constant of 10–130 N m−1 was used in the AFM measurements. For synchrotron X-ray powder diffraction, a specially modified CR2032 coin cell was used with holes on both sides. In situ synchrotron XRD measurements were then performed at the Powder Diffraction beamline (Australian Synchrotron), and the XRD patterns were conducted at 0.688273 Å (determined using LaB6, NIST SRM 660b).
4
AFM Analysis of Cell Layers
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HCFs were seeded in 4-well-chamber Lab-Tek™ II slides and cell culture took place as described above. After six days in culture, cell layers were washed with HBSS and fixed at room temperature for 15 min. The cell layers were then washed three times with PBS and serially dehydrated with 30%, 50%, 70%, 90% and 100% ethanol. Atomic force microscopy (MFP-3D, Asylum Research, USA) analysis was then performed using rectangular Si cantilevers (SSS-NCH, Nanosensors, Switzerland), each having a nominal resonance frequency of 330 kHz and a spring constant of 42 N/m. Images were recorded using amplitude modulation mode in an ambient environment after drying the samples with nitrogen.
5
Nanomaterial Characterization by Microscopy
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A Transmission Electron Microscope (TEM, JEM-2100F) was used to observe the morphology of the MoS and graphene. The thickness and morphology of the MoS nanosheets and graphene were obtained via Atomic Force Mcroscope (AFM, Asylum Research MFP-3D). The microstructure of the MoS nanosheets and graphene was studied by Raman spectra (inVia-Reflex, excitation wavelength: 532 nm).
6
Characterization of Extracellular Vesicle Topography by AFM
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Atomic force microscopy was performed to characterize the topography of extracellular vesicles as described previously [14 (link)]. Briefly, 20µL (9–12 × 1011 EVs/mL) of EV sample was deposited on APS mica for 20 min at room temperature. Then 200 μL of the PBS buffer was added to the sample. The sample was then subjected to atomic force microscopy (AFM) imaging using the Asylum Research MFP3D (Santa Barbara, CA, USA) instrument. Imaging was performed in tapping mode at room temperature. An MSNL probe with cantilever “E” (Bruker Corporation) was employed for imaging. The nominal spring constant of the MSNL “E” cantilevers was ∼0.1 N/m.
7
Piezoelectric Characterization of PVDF/TPU Nanofibers
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The formed nanofiber mats of different PVDF/TPU blends ratios were analyzed using an atomic force microscopy (AFM) system MFP-3D (Asylum Research, High Wycombe, UK) with a single-frequency piezoresponse force microscope (PFM) contact mode at the Center of Advanced Materials (CAM), Qatar University, Doha, Qatar. In this characterization, the mechanical surface deformation had been measured under applied electric voltages. To excite the sample with the electric signal, a conductive tip with platinum-deposited cantilever AC240TM (Olympus, Tokyo, Japan) had been used. The tip, of 2 N/m spring constant and 70 kHz resonance frequency, was first calibrated using thermal GetRealTM mode to obtain an exact value of the spring constant and accurately convert the raw signal in (V) to picometer (pm) with applying voltage range from 1 V up to 10 V, and the subsequent surface roughness amplitude response was recorded and evaluated using Igor Pro 6.37 software (Wave Metrics, Portland, OR, USA).
8
Calcite Film Roughness Evolution in Salt
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Roughness evolution with time of single, unconfined calcite films in salt solutions was analyzed with the Atomic Force Microscope (AFM; MFP3D, Asylum Research, Oxford Instrument). A soft, uncoated quartz-like AFM tip with k = 0.01 N/m (qp-SCONT; NANOSENSORS™ uniqprobes) was used to image the surfaces in a contact mode (scan size 3 × 3 μm2, resolution of 512 pixels). The experiments were carried out in stationary salt solutions, in a homemade, non-sealed fluid cell with a volume of ~3 ml. We thus observed some evaporation during the experiments, leading to an increase in salt concentration throughout the experiment. In each experiment we continuously scanned the same position on the film surface, however due to instrumental drift we usually observed a μm-range shift from the initial scan position. A new piece of calcite film deposited on mica (ALD set 3) was used for each experiment.
9
Measuring Grafted Layer Thickness by AFM
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Example 7
AFM Measurements
Atomic force microscopy (AFM; MFP 3D, Asylum Research, Santa Barbara, Calif.) images of spin-coated PES on SiO2 wafers were obtained. This was used to measure the thickness of the grafted layer in either water or isobutanol. A scratch was made using a razor blade through the middle of the sample down to the SiO2 substrate. The height of the layer was then measured from the substrate to the top of the film. The film was then modified by grafting 5 mL of 1 M C18 to the surface using UV-induced radical polymerization (as described previously in Zhou et al., High Throughput Synthesis and Screening of New Protein Resistant Surfaces for Membrane Filtration, AIChE J. 2010, 56 (7), 1932-1945, and in Zhou et al., High Throughput Discovery of New Fouling-Resistant Surfaces, J. Mater. Chem., 2011, 21 (3), 693-704) and then the height was measured again. An average of different height measurements was used to calculate the average thickness of the grafted layer. The height difference was measured using IGOR 6. Images were collected in the presence of either water or isobutanol using either tapping (before grafting) or contact modes (after grafting) using a v-shaped tip.
10
PEDOT:PSS Film Surface Characterization
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AFM phase images and surface roughness data were acquired by atomic force microscope (MFP-3D, Asylum Research). Dry-annealed free-standing PEDOT:PSS films were directly attached onto sample stage by double-sided carbon tape.
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