Supra 55 thermal field emission scanning electron microscopy

Nicolet 710 FT-IR spectrometer (Thermo Nicolet, USA) was employed to analyze the FTIR results. The metal content was determined by IRIS Advantage OPTIMA 7000DV Inductively Coupled Plasma-Atomic Emission Spectrometer (Thermo PerkinElmer). The surface morphology observation, particle size measurement analysis, and scanning electron microscope images of the NPs were determined by SUPRA™ 55 Thermal Field Emission Scanning Electron Microscopy (Carl Zeiss, Germany). The transmission electron microscope images of NPs were studied by JEM-2100F Transmission Electron Microscopy (JEOL, Japan). X-ray diffraction studies were carried out on EMPYREAN X-ray diffractometer (PANalytical, Netherlands). Genesys 10S UV-Vis spectrometer (Thermo Fisher) was used for the ultra-violet and visible spectral analysis. For XPS analysis, Escalab 250xi X-ray photoelectron spectroscopy (Thermo, USA), and for DLS and Zeta potential analysis, NanoBrook Omni (Brookhaven Instruments, USA) were used.

The FTIR results were determined and analyzed using Nicolet 710 FTIR spectrometer (Thermo Fisher, USA). The metal composition of the nanoparticles was determined using IRIS Advantage OPTIMA 7000DV inductively coupled plasma atomic emission spectrometer (Thermo Perkin-Elmer). Surface morphology, particle size, and microstructure of the NPs were determined using a SUPRA™ 55 Thermal Field Emission Scanning Electron Microscopy (Carl Zeiss, Germany). The transmission electron microscopy images of the NPs were acquired using a JEM-2100F transmission electron microscope (JEOL, Japan). X-ray diffraction studies were performed using an EMPYREAN X-ray diffractometer (PANalytical, The Netherlands). A Genesys 10S UV-vis spectrometer (Thermo Fisher) was used for ultraviolet and visible spectral analysis.