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35 protocols using d max 2550 pc

1

X-ray Diffraction Analysis of Polymer Powders

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Powders of PP control and modified samples were prepared for X-ray diffractometer (XRD) examination. An XRD machine (Rigaku D/MAX 2550/PC, Tokyo, Japan) was used for scanning rate of 0.02/min at 40 kV, 200 mA and a range of 0°–60° (2ϴ) to characterize all samples.
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2

X-Ray Diffraction Analysis of Pharmaceutical Samples

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XRD analysis of the samples (i.e., raw IND, IND granules, raw NF, and NF granules) was performed in an X-ray diffractometer (D/max 2550/PC, Rigaku, Tokyo, Japan) with Cu Kα1 radiation. The samples were scanned at 40 kV and 40 mA, in the 2θ range of 5–50° at 10°/min [14 (link)].
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3

Comprehensive Characterization of Crystalline Samples

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Microscopic morphology studies were carried by the scanning electron microscope (LEO 1530 Gemini, Zeiss, Germany) at 15 kV. Crystalline structures of samples were characterized by X-ray diffractometer (D/max2550PC, Rigaku, Japan) at a rate of 8° min−1 from 10° (2θ) to 90° (2θ) with Cu Kα radiation. Differential scanning calorimetry (DSC) was conducted by a thermal analyzer system (Hengjiu, Beijing) with a heating rate of 10 °C min−1 and a 50 ml min−1 Ar flow rate. The carbon coating was observed by transmission electron microscopy (Tecnai G2, FEI, USA). Raman spectroscopies were completed by (T64000, Horiba, Japan) and 514 nm light was used for excitation with an intensity of 20 mW. Particle size distribution was measured by laser particle size analysis (Mastersizer3000, Malvern, England).
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4

Synthesis and Characterization of CSS-Ag Nanoparticles

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According to our previous reported work, catechol-conjugated chitosan was synthesized in a standard EDC procedure and the CSS-Ag NPs were prepared using green methods9 (link). The CSS chemical structure was analyzed by 1H NMR (Bruker Avance, 600 MHz, D2O) and FT-IR (Nicolet Avatar 230 spectrometer). The phase structure of CSS was analyzed by X-ray diffraction (XRD, Rigaku D/Max-2550 PC, Japan). The silver concentration of the CSS-Ag NPs was measured by atomic absorption spectrophotometer (AAS, Hitachi 180-50, Japan). The distribution of the nanoparticles was determined in the UV-vis spectrum (Hitachi U-1000, Japan), TEM, and Malvern Zetasizer Nano ZS (United Kingdom).
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5

Comprehensive Materials Characterization

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Scanning electron microscopy (SEM) with energy dispersive spectra (EDS) was measured by a field emission scanning electron microscope (Hitachi SEM SU3800). X-ray diffraction spectrum of aluminate for impregnating dispenser cathodes was measured by a polycrystalline diffractometer (Rigaku D/max 2550 PC). For the characterization of atomic force microscopy (AFM), a Bruker Dimension Icon AFM equipment was used. Raman spectrum was measured by a Renishaw inVia system.
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6

Characterization of Col/BG Nanofibers

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The morphology of the Col/BG nanofibers was observed by scanning electron microscopy (SEM; JSM-5600; JEOL, Tokyo, Japan). Image analysis software (ImageJ, National Institutes of Health) was used to determine the mean fiber diameter by selecting 100 fibers randomly. The weight loss temperature was determined using a thermogravimetric analyzer (209F1; Netzsch, Selb, Germany). The contact angle was measured by a contact angle measuring instrument (OCA40; Dataphysics, Filderstadt, Germany). The elementary composition was measured with an energy dispersive spectrometer (IE 300X; Oxfordshire, UK). The chemical structure and the phase composition were determined with Fourier transform infrared spectroscopy (Avatar 380, Nicolet, Waltham, MA, USA) and X-ray diffraction (D/Max-2550 PC; Rigaku, Tokyo, Japan), respectively. The tensile strength was analyzed with a universal materials testing machine (Hounsfield, H5K-S UTM, Redhill, UK).
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7

Characterization of Electrospun Nanofibers

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The morphology of the electrospun nanofibers was observed using scanning electron microscopy (SEM) (JEOL JSM-5600LV, Japan) at an acceleration voltage of 8–10 kV. Prior to imaging by SEM, samples were sputter coated with gold for 50 s to increase their conductivity. The nanofiber diameter was obtained from at least 50 measurements on a typical SEM image using Image J 1.40 G software (NIH, USA). Further examination of nanofiber fluorescence was performed on Olympus BX51 fluorescence microscope. The nanofiber samples were prepared by collecting nanofibers on a glass slide under electrospinning nozzle for 1 min and then captured using Olympus DP72 camera equipped with Olympus CellSens software. A Nicolet-Nexus 670 Fourier transform infrared (FTIR) spectrometer (Thermo Fisher Scientific, Waltham, MA) was used to obtain the FTIR spectra of the electrospun nanofibers over a range of 500–4000 cm−1 at a scanning resolution of 2 cm−1. X-ray diffraction (XRD) spectroscopy was carried out on a Rigaku D/max 2550 PC (Rigaku Inc., Japan) with Cu Kα radiation. The operating voltage and current were kept at 40 kV and 300 mA, respectively. The electrospun nanofiber samples were examined between 0 and 60° (2θ) at a scanning rate of 1° (2θ) per minute.
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8

Characterization of BN Nano-materials

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The crystal structure and phase formation were analysed by X-ray powder diffraction (XRD) with Cu-Ka radiation (D/max 2550 PC Rigaku, λ = 0.10405 nm). The Raman spectra were obtained by confocal micro-Raman spectrometer (Renishaw InViaReflex, Gloucestershire, UK; 785 nm). The morphology of the samples was inspected using a scanning electron microscope (Hitachi SEM S-3000, Tokyo, Japan) and transmission electron microscope (Hitachi TEM H-800, Tokyo, Japan). The PL properties were measured using a fluorescent spectrophotometer (JASCO FP-6600, Tokyo, Japan). The high-temperature stability of BN nano-materials was tested using the Discovery TGA thermal analysis system (TA Instruments Q5000IR, New Castle, PA, USA; N2 or O2 is used as the test atmosphere (flow rate 20 mL/min), the temperature rises to 900 °C at 20 °C /min, and then changes to 10 °C /min to 1150 °C). The electronic universal material testing machine (Instron-5969, Buckinghamshire, UK; Three-point bending) was used to test the PiG samples (12 mm × 18 mm × 1.5 mm) with different components (marked with BN rations) to obtain the mechanical strength. The temperatures and infrared thermal images were recorded using an infrared thermometer (FLIR ThermoVision A40M, Wilsonville, OR, USA).
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9

Comprehensive Characterization of Ti4O7 Electrode

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The surface morphology and crystallinity of the Ti4O7 electrode was examined by a field emission scanning electron microscope (FESEM, Model No.: Hitachi S-4800, Japan) and an X-ray diffractometer (XRD, Model No.: Rigaku D/max-2550/PC), respectively. X-ray photoelectron spectroscopy was obtained from a Thermo Fisher Scientific Escalab 250Xi X-ray Photoelectron Spectrometer (XPS) under high vacuum (1 × 10−9 torr). The total organic carbon of real water samples was measured with a multi N/C 2100 TOC Analyzer (Analytik Jena AG, Germany). An MS5000 spectrometer (Freiberg Instruments Inc., Germany) was employed to obtain the electron paramagnetic resonance (EPR) spectra using 5,5-dimethyl-1-pyrroline-N-oxide (DMPO) as a radical trap. Ammonia concentration was measured by the Nessler reagent method15 (link) using a TU-1810 UV-vis spectrophotometer (Yixin Instruments Equipment Co., Ltd., Shenzhen) at a wavelength of 420 nm. The amount of N2 produced was calculated from the total nitrogen (30 mg L−1 ammonia) minus the measured concentration of ammonia and nitrate. NO3 and NO2 concentrations were determined with a DionexTM ICS-5000 ion chromatography system (IC, Thermo Fisher, USA). NB concentration was quantified by a waters 3000 high performance liquid chromatography system (UHPLC, USA) coupled with a C18 column at 262 nm.
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10

Morphological and Structural Analysis of PAA Membranes

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Surface morphological observations of solution blown PAA were performed with a field emission scanning electron microscope (FE-SEM, SU8010, Hitachi, Japan) after sputter-coated with 5–10 nm of gold. Fiber diameters were determined using Image Tool software (Texas City, TX, USA) by randomly selecting 100 individual fibers per specimen from at least five different SEM images with 5000× magnification. The structure of the PAA and PI membrane were confirmed by fourier transform infrared spectroscopy (FT-IR, NICOLET NEXUS-670, Waltham, MA, USA) with the attenuated total reflectance (ATR) mode. All spectra were run in 32 scan per spectrum in the range of 4000–600 cm−1 with the resolution of 0.09 cm−1. A wide angle X-ray diffractometer (XRD, D/max-2550 PC, Rigaku Co., Akishima, Japan) with a CuKα (λ = 1.5406 Å) was used to confirm the crystallographic structure of the sample. The diffraction angle 2θ was recorded from 5° to 60°. The tensile tests of as-prepared membranes were performed on a tensile tester (XQ-1C, Shanghai New Fiber Instrument Co., Ltd., Shanghai, China) at a crosshead speed of 10 mm/min in ambient condition. The gauge length was 10 mm and the dimensions of test specimens were 3 mm wide and 25 μm thick. Every series of samples were measured ten times.
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