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Evo hd 15 microscope

Manufactured by Zeiss
Sourced in Germany, United Kingdom

The EVO HD 15 is a high-resolution scanning electron microscope (SEM) designed for advanced materials analysis. It features a large specimen chamber, high-performance electron optics, and a variety of detectors to capture detailed images and data. The EVO HD 15 provides versatile imaging capabilities for a wide range of samples and applications.

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4 protocols using evo hd 15 microscope

1

SEM Imaging of Infected Cells

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The preparation of the samples was performed 24 h after infection and treatment. The cells were washed once with PBS at 37 °C, followed by fixation with glutaraldehyde 3% for 2 h at room temperature. Samples were then washed with PBS and dehydrated with a graded ethanol series (30–100%). Filters were cut from inserts and mounted on aluminum stubs equipped with a carbon disk and sputtered with gold (Quorum Q150R ES, Quorum Technologies Ltd, Laughton, UK). Images were taken with an EVO HD 15 microscope (acceleration voltage 5 kV; Software SmartSEM, Zeiss, Jena, Germany) under high vacuum conditions (3.8 × 106 mbar in the sample chamber).
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2

Microscopic Characterization of Material Surfaces

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Photographic images of each sample were obtained at 100× magnification with a celestron handheld digital microscope (Celestron, USA) and ImageJ image processing software (National Institute of Health, USA) was used to determine the average size of pores on the respective material surfaces. For scanning electron microscopy, samples were sputter-coated with 5 nm of gold-nanoparticles using a plasma sputter-coater (Quorum Q15ORS) and samples were imaged using JEOL JSM-7401F field emission scanning electron microscope or Zeiss EVO HD15 microscope.
Test samples for SEM with cells were fixed (in 300 μL 0.1 M Sodium Cacodylate buffer with 2% PFA and 1.5% GTA) and critical point dried before being processed for analysis.
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3

Structural and Thermal Analysis of Materials

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X-ray diffraction patterns were obtained on a PANalytical Xpert-PRO diffractometer [40 kV, 20 mA, λ(CuKα1,α2) = 1.541 Å, Bragg-Brentano mode, 2θ = 10° to 80°]. Thermal behaviors by thermogravimetric analysis (TGA) and differential scanning calorimetry (DSC) were done on SDT Q600 TA Instruments from room temperature to 950 °C (5 °C min−1, N2 flow of 100 mL min−1). Analysis by scanning electron microscopy (SEM) was performed by using a Hitachi S-4800 FEG microscope and energy-dispersive X-ray spectroscopy (EDX) was carried out by using ZEISS EVOHD 15 microscope.
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4

Characterizing Atomized Nanostructure Coatings

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Exploratory analysis of morphology and size of the nanostructures that make up the atomised coatings were conducted using SEM. Coated microscope slides were gold-coated (S150B, Edwards, Crawley, UK) and mounted onto aluminium stubs before analysed using Zeiss Evo HD-15 microscope. Highresolution images at both x5k and x50k magnification were obtained using a working distance between 9.5mm and 10.5mm, respectively, with a voltage between 10kV and 18kV.
Smart Tiff viewer software was used in conjunction with SEM to gather data on average diameter size and size distribution information on the atomised structures. These samples were further analysed on contact lenses to ensure the lenses (i.e. the surface the coatings were collected on) did not affect the resulting atomised structures.
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