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3 protocols using sta7000

1

Characterization of Cs3Cu2I5:Mn Perovskite

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Powder X-ray diffraction was characterized by an X-ray diffractometer (Bruker D8 Advance XRD system), and the morphology and elements of Cs3Cu2I5:Mn were detected by a scanning electron microscope (SEM, FEI Quanta 250 F). X-ray photoelectron spectroscopy (XPS) measurements were performed using an achromatic Al Kα source (1486.6 eV) and a double pass cylindrical mirror analyzer (PHI QUANTERA II). The thermal gravimetric analyses were conducted on STA7000, HITACHI. Emission and excitation spectra were collected on Varian Cary Eclipse instrument. The PL lifetimes were measured by FLSP920 (EDINBURGH INSTRUMENTS LTD) equipped with both ns and μs light sources. The absolute quantum yield of the samples was determined using a Quantaurus-QY absolute photoluminescence quantum yield spectrometer (C9920-02G, Hamamatsu Photonics, Japan). The X-ray source is produced from a commercial Amptek mini-x tube with Ag target and a maximum output power of 4W. All the radioluminescence and temperature-dependent spectra were recorded with a fiber spectrometer (QE65PRO, Ocean Optics). The nuclear battery performances were measured with Keithley 2400 under the irradiation of X-ray.
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Comprehensive Characterization of WNS-SO3H Catalyst

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Powder X-ray diffraction (XRD) spectroscopy, Fourier Transform Infra-Red (FTIR), Spectroscopy, scanning electron microscopy (SEM), X-ray energy dispersion spectroscopy (EDS), X-ray photoelectron spectroscopy (XPS), and CHNS analyzer, were used to characterize the WNS-SO3H catalyst. The ELEMENTAR vario EL III device was employed as a CHNS analyzer to determine the percentage amount of carbon, hydrogen, nitrogen, and sulfur. The XRD pattern in the catalyst was studied in a Philips X'pert Pro diffractometer equipped with Cu-K with a scanning rate of 2° min−1 and a range of 2θ between 10° and 90°. The functional groups in the catalyst were identified using FT-IR spectroscopy. For FT-IR spectroscopy in the 4000–400 cm−1 range, a Vertex 80 equipped with a Bruker 3000 Hyperion Microscope spectrometer and KBr pellets was used. For SEM–EDS; Jeol 639OLA/OXFORD XMX N was employed to look over the surface morphology of the WNS-SO3H. SEM–EDS was performed using an acceleration voltage of 0.5–60 eV and an EDAX detector area of 30 mm2. The XPS was performed on a Thermofisher Scientific Nexsa base model equipped with Auger electron microscopy, which has an ionization energy range of 21.2–40.8 eV. The TGA analysis was performed using TGA-DTA Hitachi STA7000 in the temperature range of 30–600 °C.
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Characterization of Vermiculite Nanocomposites

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A field emission scanning electron microscope (FE-SEM, Thermo scientific Apreo S) was operated at 15 kV to obtain the morphology, elemental composition, and mapping of the charred and uncharred regions of the coated samples. A turbo-pumped sputter coater (Quorum, Q150T Plus) was used to cover the sample surface with Cr before placing the samples under an electron microscope to avoid charging effects, with a sputtering time of 25 s and a film thickness of ∼7 to 10 nm. Transmission electron microscopy (TEM) analysis of the exfoliated vermiculite nanosheets was carried out using a Hi-Resolution Transmission Electron Microscope (HRTEM, JEOL Japan, Model: JEM-2100 Plus). Images were also obtained using an Olympus BX51 optical microscope. Thermogravimetric analysis (TGA) was carried out using a simultaneous thermogravimetric analyzer (STA 7000, HITACHI) in an Ar atmosphere with a rate of 10° C min−1. Fourier transform infrared spectra were obtained using an IRTracer 100 (Shimadzu) in ATR mode. A custom-made Underwriters Laboratory-94 fire retardant standard test was performed on wood samples 10 cm in height and 10 mm in diameter to characterize the fabricated ex-VN/epoxy nanocomposites.
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