The samples fixed in 10 % buffered formalin were prepared according to Bullard et al. (2012) (link), with minor changes. Briefly, different parts of the infected skin were washed several times using phosphate buffer saline (pH 7.2), then fixed in 2.5 % glutaraldehyde at 4°C for 24 hours. The samples were dehydrated by passing them through serial ascending concentrations of ethanol (50 % to 100 %; each for a duration of 20 minutes). The specimens were then dehydrated on filter paper (Whatman Grade 1, Cat. No. 1001110); complete dryness occurred in a CO2 critical point drier (Autosamdri-815, Germany). The samples were then glued onto stubs, coated with 20nm gold in a sputter coater (Spi-Module Sputter Coater, UK), examined and photographed using a JSM 5200 electron probe microanalyzer (JEOL, Japan) at the College of Agriculture, Cairo University, Egypt.
Jsm 5200 electron probe microanalyzer
Manufactured by JEOL
Sourced in Japan
The JSM 5200 is an electron probe microanalyzer manufactured by JEOL. It is designed to perform elemental analysis and mapping of solid samples. The instrument uses a focused electron beam to interact with the sample, and the emitted X-rays are detected and analyzed to determine the chemical composition of the material.
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Lab products found in correlation
2 protocols using jsm 5200 electron probe microanalyzer
1
Preparing Infected Skin Samples for SEM
2
Morphological Analysis of L. cyprinacea Copepods
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Five parasite females of L. cyprinacea subjected to Illicium verum were harvested and rinsed multiple times with saline. The copepods were rinsed multiple times with saline, then cleaned in lactophenol and loaded on gelatin to analyze their morphology [21 (link),42 (link)]. Five freshly obtained copepods were rinsed multiple times in saline. Adult L. cyprinacea was immersed in 2.5% glutaraldehyde. After that, the specimens were dehydrated in an increasing ethanol series, dried in a CO2 critical point drier (Autosamdri-815; Lewis Avenue, Rockville, ML, USA), bonded over stubs, and sputter-covered with twenty nm gold (Spi-Module sputter coater; UK). Then, the specimens were inspected and photographed using a scanning electron microscope (SEM) at magnifications ranging from 35 to 500 (JEOL JSM 5200 Electron Probe Microanalyzer; Tokyo, Japan) [21 (link)].
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