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Nanosem650

Manufactured by Thermo Fisher Scientific
Sourced in United States

The NanoSEM650 is a scanning electron microscope (SEM) designed for high-resolution imaging of nanoscale samples. It features advanced electron optics and a compact, user-friendly design. The NanoSEM650 enables detailed observation and analysis of a wide range of materials at the nanometer scale.

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4 protocols using nanosem650

1

LSPR Optical Platform Assembly

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The LSPR optical platform was self-assembled in the laboratory (Fig. S2). The LSPR extinction spectra were obtained using a spectrometer (QE65000, Ocean Optics, USA). Scanning electron microscopy (SEM) images were obtained using aby field emission scanning electron microscope (NanoSEM650, FEI, USA). Fluorescence images were obtained using an optical microscope (Ti-s, Nikon, Japan).
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2

Electrode Characterization by SEM and XRD

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The size and morphologies of as-prepared electrodes were characterized by a field-emission scanning electron microscope (SEM, FEI NanoSEM650) operating at 20 kV. X-ray diffraction (XRD) patterns were collected on Rigaku D/MAX-2500 XRD with Cu Kα radiation (40 kV, 40 mA, λ = 1.5418 Å), recorded with 2θ ranging from 5° to 90°, 10°/min.
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3

Comprehensive Materials Characterization

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The morphology and element analysis of as-prepared products were characterized by scanning electron microscopy (SEM, FEI NanoSEM650, Hillsboro, OR, USA), transmission electron microscopy (TEM; FEI Tecnai G2 F20, Hillsboro, OR, USA), X-ray photoelectron spectroscopy (XPS, Thermo escalab 250Xi, Waltham, MA, USA) and Raman spectroscopy (Renishaw inVia, New Mills, Gloucestershire, UK) with a 532-nm laser. Crystal structures were characterized with an X-ray diffractometer (XRD, Bruker D8 ADVANCE, Billerica, MA, USA) with radiation from a Cu-Kα radiation. Capacitance-voltage (CV) properties, galvanostatic charge/discharge measurements, electrochemical impedance spectroscopy (EIS), and the cycling performance of samples were recorded by a Chenhua CHI760E electrochemical workstation.
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4

Characterization of Nano-structured TiO2 Photocatalysts

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The produced nano-structured TiO2 samples were characterized by X-ray diffraction (XRD) which was performed with a Bruker D8 Advance diffractometer using the Cu Kα radiation (1.544 Å) and a 2θ scan rate of 1.281°/min, while scanning electron microscope observations (SEM) were performed with an FEI microscope (NanoSEM 650 model, FEI Company). The samples on the stab were covered with a thin gold film before SEM observations. XRD analyses were performed to establish the crystal phase(s) and the primary particle sizes of the photocatalysts, while SEM analyses to determine their morphological properties.
BET specific surface area values of the prepared samples were determined by the multi-point BET method using a Micromeritics (Gemini VII model) apparatus. The nano-structured TiO2 photocatalysts were degassed at 200°C for 5 h before the measurement. The crystalline and morphologic properties of the samples could be changed only slightly by the used degassing temperature, however we could not perform degassing process at low temperatures because the pores would not be completely free and the measurement would be wrong (i.e., room temperature).
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