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Ac240tsa r3

Manufactured by Oxford Instruments

The AC240TSA-R3 is a compact, high-performance atomic force microscope (AFM) designed for advanced materials research and surface analysis. It features a closed-loop scanner with a scan range of 40 μm × 40 μm × 10 μm, enabling high-resolution imaging and nanoscale measurements. The system is equipped with a sensitive cantilever detection system and supports a variety of imaging modes, including contact, tapping, and non-contact modes. The AC240TSA-R3 is suitable for a wide range of applications, including the study of surfaces, thin films, and nanostructures.

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4 protocols using ac240tsa r3

1

Nanoscale Height Measurements Using AFM

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AFM experiments for height measurements were performed using soft cantilevers (AC240TSA-R3, Oxford Instrument Co.) with a nominal force constant of 2 N/m and resonance frequencies of 70 kHz. The free-air amplitude of the tip was calibrated with the Asylum Research software and the spring constant was captured by the thermal vibration method. Samples were imaged with a Cypher ES scanner using intermittent tapping (AC-air topography) mode. All nanowires height analyses and statistics were performed using Gwyddion and IGOR Pro software (WaveMetrics, Inc.). To check protein quality for infrared nanospectroscopy, AFM was performed using cantilevers (Arrow-NCR, Nano Worlds) with a nominal force constant of 42 N/m and a resonance frequency of 285 kHz. Samples were imaged with an Icon AFM (Bruker) using intermittent tapping (AC-air topography) mode. Liquid AFM was performed using bio-lever mini tips (BL-AC40TS, Olympus) with resonance frequency of 25 kHz in liquid and nominal force of 0.1 N/m. AFM images were processed using the Gwyddion package.
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2

Nanoscale Height Measurements Using AFM

Check if the same lab product or an alternative is used in the 5 most similar protocols
AFM experiments for height measurements were performed using soft cantilevers (AC240TSA-R3, Oxford Instrument Co.) with a nominal force constant of 2 N/m and resonance frequencies of 70 kHz. The free-air amplitude of the tip was calibrated with the Asylum Research software and the spring constant was captured by the thermal vibration method. Samples were imaged with a Cypher ES scanner using intermittent tapping (AC-air topography) mode. All nanowires height analyses and statistics were performed using Gwyddion and IGOR Pro software (WaveMetrics, Inc.). To check protein quality for infrared nanospectroscopy, AFM was performed using cantilevers (Arrow-NCR, Nano Worlds) with a nominal force constant of 42 N/m and a resonance frequency of 285 kHz. Samples were imaged with an Icon AFM (Bruker) using intermittent tapping (AC-air topography) mode. Liquid AFM was performed using bio-lever mini tips (BL-AC40TS, Olympus) with resonance frequency of 25 kHz in liquid and nominal force of 0.1 N/m. AFM images were processed using the Gwyddion package.
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3

Polymer Conjugate Structure by AFM

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The structure of the polymer conjugates was studied with AFM using Cypher microscope (Asylum Research, Santa Barbara, CA), operated in tapping mode at ambient conditions. Silicon cantilevers having chromium/gold (Cr/Au) coating, with resonance frequencies between 44 and 95 kHz and spring constant in the range of 0.3 to 4.8 N/m and 9 ± 2–mm uncoated silicon tip (AC240TSA-R3, Asylum Research, Santa Barbara, CA), were used for the dry imaging in air. Depending on the frame size, the scan rate was set in the 0.7- to 1.0-Hz range. The images were processed and analyzed using Gwyddion 2.47 software (n = 5).
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4

Probing Mechanical Properties of Nanofibers

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We evaluated the mechanical properties of the nanofibers with a combined AFM/optical microscopy technique. The cover glass with the sample was placed on the microscope stage. The stage serves an inverted optical microscope (Olympus IX 73) and AFM (MFP-3D-Bio, Oxford Instruments-Asylum Research, Santa Barbara, CA, USA). We adjusted the stage before manipulations began, so that the sample was directly above the objective lens and beneath the AFM probe. The AFM was then put into contact mode to begin fiber manipulations. The probe was raised to hover above a specific fiber. The AFM probe was lowered in 500 nm steps until the apex of the tip was horizontally level with the desired fiber. By adjusting the lateral x-y-position, the AFM probe was placed at the middle of the suspended fiber. Only the tip of the AFM probe was in contact with the fiber. The fiber was pulled in the horizontal plane, perpendicular to the fiber length, parallel to the groove, at a speed of 350 nm/s, until it broke (Figure 1C,D). The AFM and the sample were checked regularly to ensure that they were level with each other. Asylum Research AFM Probes AC240TSA-R3 were used (resonance frequency f = 70 kHz, spring constant, k = 2 N/m, length L = 240 µm, width w = 40 µm, height h = 14 µm, nominal tip radius, r = 7 nm).
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