The structure of FLG was imaged with Raman spectroscope (HR800, Horiba, Paris, France) with a confocal Raman microscope mode and a laser wavelength of 532 nm. Nanoparticle analyzer is an instrument that uses a physical method to test the size and distribution of particles. The particle diameter distribution of FLG was measured by the NanoPlus-3 nanoparticle analyzer (Micromeritics, New York, NY, USA). The wear mark depth of the Si3N4 disk was characterized by the OLS4100 3D laser measuring microscope (Olympus, Tokyo, Japan). S-4800 scanning electron microscope (SEM, Hitachi, Tokyo, Japan) equipped with an energy-dispersive X-ray spectroscope (EDS, Hitachi, Tokyo, Japan) and Raman spectroscope (Horiba, Paris, France) were used to observe the wear mark of the Si3N4 disk.
S 4800 scanning electron microscope sem
Manufactured by Hitachi
Sourced in Japan
The Hitachi S-4800 is a scanning electron microscope (SEM) designed for high-resolution imaging and analysis of a wide range of materials. The S-4800 utilizes a field emission electron gun to generate a focused electron beam that scans the specimen surface, allowing for the observation and characterization of the sample's topography and composition. The instrument's core function is to provide detailed, high-magnification images of the specimen under investigation.
Automatically generated - may contain errors
Lab products found in correlation
Raman spectroscope, by Horiba (1 mentions)
Oca 15 plus, by Dataphysics (1 mentions)
Tga q500, by TA Instruments (1 mentions)
Escalab 250xi system, by Thermo Fisher Scientific (1 mentions)
Asap 2020 analyzer, by Micromeritics (1 mentions)
1200 series, by Agilent Technologies (1 mentions)
Cary eclipse spectrophotometer, by Agilent Technologies (1 mentions)
X pert diffractometer, by Philips (1 mentions)
Lc 20ab pump, by Shimadzu (1 mentions)
Multifunctional microplate reader, by Agilent Technologies (1 mentions)
Unstained protein molecular weight marker, by Thermo Fisher Scientific (1 mentions)
Nanodrop 2000 spectrophotometer, by Thermo Fisher Scientific (1 mentions)
Mini protean tetra system, by Bio-Rad (1 mentions)
Axs d8 advance diffractometer, by Bruker (1 mentions)
Tensor 27, by Bruker (1 mentions)
D max 2500, by Rigaku (1 mentions)
Ta sdt q600, by TA Instruments (1 mentions)
Emax 350, by Horiba (1 mentions)
15 protocols using s 4800 scanning electron microscope sem
1
Characterization of Graphene Nanomaterials
2
Wettability Characterization of Ablated Surfaces
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The ablated surface was observed using a Hitachi S4800 scanning electron microscope (SEM). The chemical composition was analyzed by energy dispersive X-ray spectroscopy (EDXS). The static and dynamic wettability of the samples were investigated using a video-based optical contact angle-measuring device (OCA 15 Plus; Data Physics Instruments) and a sessile drop technique. An organic analytical reagent, 1,2-dichloroethane, was used as the test oil after it was dyed with Sudan III. The volume of the oil and water droplet was set at 5 μL. Average values were obtained by measuring five different points on the same surface.
3
Comprehensive Characterization of Materials
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Surface morphologies were obtained by using a Hitachi S4800 scanning electron microscope (SEM). Powder X-ray diffraction (XRD) patterns were performed on a Bruker D8 advanced D8 X-ray diffractometer with a Cu Kα radiation source, and the scan range was 10–80° with a step of 0.02°. The functional groups of samples were determined by a Nicolet 5700 Fourier transform infrared (FT-IR) spectrometer in the wavenumber range of 400–4000 cm−1. X-ray photoelectron spectroscopy (XPS) measurements were conducted on a Thermo ESCALAB 250XI system with an Al Kα radiation source. Thermo gravimetric analyzer (TGA) was made on a TA Instruments Q500 TGA under N2 atmosphere at a constant heating rate of 10 °C min−1 in a temperature range of 30–800 °C. The N2 adsorption–desorption isotherms were obtained by JW-BK 112 surface analyzer at liquid nitrogen temperature. The surface areas of samples were estimated by using the method of Brunauer–Emmett–Teller (BET). The densities of total acids, –SO3H, –COOH, and phenolic –OH were measured by acid–base titration based on the previous reported procedures.20 (link)
4
Characterization of Multilayer Graphene
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Thermogravimetric (TG) analysis and synchronously differential scanning calorimeter (DSC) tests were carried out using a TA SDT 2960 thermoanalyzer (New Castle, DE, USA) with a heating rate of 5 °C min−1 in an argon atmosphere. Nitrogen adsorption-desorption isotherm measurements were performed using a Micromeritics ASAP 2020 analyzer (Norcross, GA, USA) to investigate the specific surface area. Before analysis, the multilayer graphene was pretreated by degassing at 200 °C for 8 h to remove any adsorbed species. X-ray powder diffraction (XRD) tests were conducted using a Bruke D8 focus instrument (Karlsruhe, Germany) with graphite-filtered Cu-Kα radiation. The scanning speed was 5 degrees per minute, with a step of 0.02 degrees from 10 to 80 degrees. SEM tests were conducted using a Hitachi (S-4800) scanning electron microscope (SEM) (Toyota, Japan) equipped with an energy-dispersive spectroscopy analyzer with charges of 15 kV and 10 pA. The combustion heat was examined with oxygen bomb equipment with an oxygen pressure of 10 MPa. The combustion heat tests were conducted 5 times and the average value of the tests was provided to eliminate the differences caused by the test system.
5
Characterization of Polymer Samples
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Circular dichroism (CD) and UV-vis absorption spectra were obtained on a Jasco-810 spectropolarimeter. Fluorescence spectra were measured on a Varian Cary Eclipse spectrophotometer (Varian, USA). The morphology of the samples was observed with a Hitachi S-4800 scanning electron microscope (SEM). The molecular weights and molecular weight polydispersity (Mw/Mn) were determined by GPC/SEC (Agilent Technologies 1200 series) with THF as the eluent. Fourier transform infrared (FT-IR) spectra were recorded with a Nicolet NEXUS 670 spectrophotometer (KBr tablet).
6
Characterization of Nanomaterial Samples
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X-ray diffraction (XRD) patterns were measured on an X’Pert Philips diffractometer (Cu Kα radiation, 2θ range 10°–90°, step size 0.08°, accelerating voltage 40 kV, applied current 40 mA). The morphology of the samples was taken on a Hitachi S-4800 scanning electron microscope (SEM). UV–visible diffuse reflectance spectra (UV–vis DRS) were obtained on a Shimadzu U-3010 spectrometer, using BaSO4 as a reference. The photoluminescence (PL) spectra were recorded on a F-7000 FL spectrophotometer.
7
Characterization of MIPs and NIPs Using SEM, Fluorescence, and HPLC
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A Hitachi S-4800 scanning electron microscope (SEM, Hitachi, Tokyo, Japan) was used to observe the surface morphologies of the MIPs or non-imprinted polymers (NIPs) based on QDs-grafted COFs. The fluorescence spectra were acquired using a multifunctional microplate reader (Biotek Instruments Inc., Winooski, VT, USA). All fluorescence measurements were performed under the same conditions. The excitation wavelength was 460 nm for emission over the range of 500–700 nm. The high performance liquid chromatography (HPLC) system consisted of two LC-20AB pumps and an RF-10AXL ultraviolet detector (Shimadzu, Kyoto, Japan). A Visiprep TM-DL solid phase extraction (SPE) vacuum manifold (Supelco, Bellefonte, PA, USA) was used in the preprocessing procedure.
8
Electrochemical and Spectroscopic Characterization
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Electrochemical measurements were performed by using a CHI600E electrochemical workstation (Shanghai Chenhua Apparatus Co., Ltd, China). A three-electrode system was used with platinum (Pt) wire, Ag/AgCl, and glassy carbon as the counter electrode, reference electrode, and working electrode, respectively. The morphologies of the modified electrodes were characterized using an S-4800 scanning electron microscope (SEM, Hitachi Instruments Co., Ltd, Japan). UV absorption spectra of the HEX, BSA and HEX–BSA complexes were measured by using a NanoDrop 2000 spectrophotometer (Thermo Fisher Scientific Inc., USA). The SDS-polyacrylamide gel electrophoresis (SDS-PAGE) of the HEX–BSA complex and proteins was performed using a Mini-Protean Tetra System (Bio-Rad Laboratories Inc., USA) and an Unstained Protein Molecular Weight Marker (Fermentas Inc. Canada) was used for molecular weight estimation.
9
Scanning Electron Microscopy of Thin Film Surfaces
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Thin film surface morphology was characterized using a Hitachi S-4800 Scanning Electron Microscope (SEM) with 10 kV accelerating voltage.
10
Scanning Electron Microscope Analysis
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A Hitachi S-4800 Scanning Electron Microscope (SEM) was used. Detailed information can be found in the Appendix A2 and Appendix A3 .
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