TEM images were collected on an FEI Tecnai G2 Spirit TEM operating at 120 kV. SEM images and elemental composition were collected on an FEI Quanta 250 SEM equipped with a Thermo Fisher Scientific Energy-dispersive X-ray spectroscopy (EDS) detector. Size of dispersed PDA and PDA-F nanoparticles in aqueous solution and zeta potentials were determined by Dynamic Light Scattering (DLS) measured with a Malvern Zetasizer Nano ZS90. XPS data were collected on a Thermo Scientific ESCALAB 250 Xi spectrometer using monochromated Al Kα radiation. The carbon 1s peak at 284.8 eV was used for calibration. Ultrasound data were collected on a Siemens Sequoia 512 with an Acuson 15L8 transducer.
Energy dispersive x ray spectroscopy
Manufactured by Thermo Fisher Scientific
Sourced in United States
Energy-dispersive X-ray spectroscopy (EDS or EDX) is an analytical technique used to identify the elemental composition of a sample. It works by irradiating a sample with a beam of X-rays, causing the emission of characteristic X-rays from the sample. The emitted X-rays are detected and analyzed to determine the elements present in the sample.
Automatically generated - may contain errors
Lab products found in correlation
Sequoia 512, by Siemens (1 mentions)
Escalab 250xi spectrometer, by Thermo Fisher Scientific (1 mentions)
Quanta 250 sem, by Thermo Fisher Scientific (1 mentions)
Tecnai g2 spirit tem, by Thermo Fisher Scientific (1 mentions)
Verios 460l xhr, by Thermo Fisher Scientific (1 mentions)
Nano zs90, by Malvern Panalytical (1 mentions)
D8 advance, by Bruker (1 mentions)
4 protocols using energy dispersive x ray spectroscopy
1
Characterization of PDA and PDA-F Nanoparticles
2
Elemental Analysis via SEM-EDS
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Elemental analysis was performed by using a scanning electron microscope (SEM), FEI Verios 460L XHR (extreme high resolution, Hillsboro, OR, USA), equipped with energy-dispersive X-ray spectroscopy (Thermo Fischer Scientific, Gloucester, UK).
3
Microstructural Analysis of Modified Cement
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Analysis of the local microstructure of the modified cement matrix was carried out based on images obtained from SEM (FEI, Hillsboro, OR, USA). The samples for the analysis were broken off from the inner part of the sample. To obtain a conductive layer, the samples were sputtered with carbon. The test was carried out after 28 days of maturation, both on reference samples and those subjected to the thermal action. The photos were taken in a high vacuum mode. On the same samples, the EDS analysis (Energy Dispersive X-ray Spectroscopy, FEI) was carried out, which allowed for the identification of the local chemical composition of the material.
4
Comprehensive Nanoparticle Characterization Protocol
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Transmission electron microscopy (TEM, FEI Titan 300 kV FEG) attached with an Oxford energy-dispersive X-ray spectroscopy (EDS) system and an FEI Co. XL30 FEG wet-mode environmental scanning electron microscopy (ESEM) (Philips Electron Optics, Eindoven, The Netherlands) with EDS were employed to investigate the structure of the nanoparticles. A Zetasizer Nano-ZS90 (Malvern, UK) was used to determine the zeta (z) potential of particles. X-ray diffraction (XRD, Bruker D8 Advance) was utilized to analyze the crystal structure of the material. X-ray photoelectron spectrometry (XPS, Kratos Ultra) was used to analyze the surface composition of the material. The BrunauereEmmetteTeller (BET) specific surface area was measured through N 2 adsorption method using a TriStar 3000 system (Micromeritics Corp., USA). UVeVis spectrometer (Biospec-1601, Shimadzu, Japan) was used to obtain spectrum of the nanoparticle mixture from 190 to 1100 nm. ICP-AES was used to measure the concentration of Cd, S, Ni, Co, Zn, and total Fe.
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