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Tecnai g2 f20 tmp

Manufactured by Thermo Fisher Scientific
Sourced in Germany

The Tecnai G2 F20 TMP is a transmission electron microscope (TEM) designed for high-resolution imaging and analysis of materials at the nanoscale. It features a field emission gun (FEG) source and a Titan Themis electron optics system, providing high-resolution imaging capabilities. The Tecnai G2 F20 TMP is capable of operating at an accelerating voltage of 200 kV.

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6 protocols using tecnai g2 f20 tmp

1

Characterization of Laser-Generated NPs

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Laser-generated NPs were characterized using transmission electron microscopy (TEM) and UV-Vis absorption spectroscopy. High-resolution images and electron-diffraction patterns were measured with an analytical TEM “Tecnai G2 F20 TMP” from FEI (Laboratory of Nano and Quantum Engineering, Leibniz University Hannover, Hannover, Germany). The UV-Vis absorption spectra were measured in quartz cuvettes using the “Shimadzu UV–1900i” double beam spectrophotometer (Institute of Quantum Optics, Leibniz University Hannover, Hannover, Germany).
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2

Characterization of Nanostructures by TEM

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TEM images were obtained using a FEI Tecnai G2 F20 TMP (Cs = 2 mm, CC = 2 mm) equipped with a 200 kV field-emission gun. The samples were purified 3–4 times via precipitation with methanol/ethanol and re-dispersion in toluene/hexane prior to TEM grid preparation. Subsequently, one drop of the purified sample was placed on a carbon coated copper TEM grid and dried under ambient conditions. The obtained TEM pictures are shown in Fig. 6c,g,k. The schematic diagrams in those figure as red and yellow represent CdSe (core) and CdS (shell/crown) respectively. The QDs have a diameter of 5.94 nm ± 0.46 nm, the QRs have diameter of 5.87 nm ± 0.59 nm with length of 33.10 nm ± 2.84 nm and the NPLs have length of 38.1 nm ± 5.2 nm with width of 13.6 nm ± 2.1 nm. The NPLs have a thickness of only 5 monolayer (≈1.5 nm).
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3

Characterization of Nanoparticle Samples

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Samples were visually assessed using a transmission electron microscope (TEM, instrument: Tecnai G2 F20 TMP from FEI, voltage: 200 kV, Frankfurt am Main, Germany) and a scanning electron microscope (SEM, instrument: Helios G4 CX from FEI, voltage: 5 kV, Frankfurt am Main, Germany). Between 50 µL and 150 µL of the suspensions were dropped onto a copper grid for TEM measurements and onto a membrane filter (Whatman® Nuclepore™ Track–etched polycarbonate membranes with pore diameter of 0.2 µm, Dassel, Germany) and dried in atmospheric air. The membrane filters for the SEM measurements were then glued to a copper grid and sputtered with 4 nm platinum.
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4

Comprehensive Material Characterization

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The UV-Vis absorption spectra were recorded employing a UV-visible spectrophotometer (Varian Cary 100 Bio). TEM images were characterized by Transmission Electron Microscopy (TEM) (FEI Tecnai G2 F20 TMP) using a 200 kV field emission gun (FEG). XRD patterns were monitored using a Bruker D8 Advance X-ray Diffraction system.
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5

Characterization of CdSe Nanoplatelet Morphology

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Transmission electron microscopy (TEM) measurements were performed to characterise the morphologies of CdSe NPLs and NPL–polymer hybrid structures. All measurements were carried out in bright field mode on a FEI Tecnai G2 F20 TMP (Cs = 2 mm, CC = 2 mm) equipped with a 200 kV field emission gun. Samples were prepared by drop-casting 10 μL of the respective solution onto carbon-coated copper TEM grids.
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6

Characterization of CdSe Nanoplatelet Morphology

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Transmission electron microscopy (TEM) measurements were performed to characterise the size of the pristine CdSe NPLs and to investigate the morphologies of CdSe NPL cryoaerogels. All measurements were carried out in bright field mode on a FEI Tecnai G2 F20 TMP (Cs = 2 mm, Cc = 2 mm) equipped with a 200 kV field emission gun. Samples of pristine NPLs were prepared by drop-casting 10 µL of a diluted NPL solution onto carbon-coated copper TEM grids (Quantifoil, 300 mesh). Cryoaerogel samples were prepared by gently pressing the TEM grid onto the cryoaerogel film.
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