Bare metal oxide nanoparticles were imaged through high resolution transmission electron microscopy (HR-TEM, JEM-2100F, JEOL, Tokyo, Japan) at a working voltage of 200 kV. Energy-dispersive X-ray spectroscopy (EDXS, JEM-2100F, JEOL, Tokyo, Japan) was utilized to analyze the Fe and Mn concentration of Fe-NPs and Mn-NPs, respectively. The bare Fe-NP samples were diluted (1:1000) and applied onto a 400 mesh carbon-coated Cu grid (Agar Scientific, UK) followed by evaporation of solvent under vacuum overnight. Particle sizes and zeta potentials of 100 μM HMO-Ms were analyzed using DLS (Mobius, Wyatt, Santa Barbara, CA, USA). All DLS and zeta potential measurements were performed in three replicas and reported as mean ± standard deviation. To visualize the morphology of the nanoparticles, 100 μM PAM solutions were negatively stained with 2 wt% uranyl acetate solution on 400 mesh carbon grids (Ted Pella, Redding, CA, USA) and imaged using TEM (JEM-2100F, JEOL, Tokyo, Japan).
Jem 2100f
Manufactured by JEOL
Sourced in Japan, United States, Germany, United Kingdom
The JEM-2100F is a transmission electron microscope (TEM) designed and manufactured by JEOL. It is capable of high-resolution imaging and analytical capabilities. The JEM-2100F is used for a variety of research and industrial applications that require advanced electron microscopy techniques.
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Lab products found in correlation
Escalab 250xi, by Thermo Fisher Scientific (142 mentions)
S 4800, by Hitachi (117 mentions)
K alpha, by Thermo Fisher Scientific (90 mentions)
D8 advance, by Bruker (80 mentions)
Escalab 250, by Thermo Fisher Scientific (62 mentions)
Jsm 6700f, by JEOL (38 mentions)
Jsm 7600f, by JEOL (34 mentions)
Zetasizer nano zs90, by Malvern Panalytical (30 mentions)
Su8010, by Hitachi (29 mentions)
Ultima 4, by Rigaku (26 mentions)
Nicolet 6700, by Thermo Fisher Scientific (25 mentions)
Zetasizer nano z, by Malvern Panalytical (23 mentions)
Asap 2020, by Micromeritics (22 mentions)
D max 2500, by Rigaku (22 mentions)
Nicolet is50, by Thermo Fisher Scientific (21 mentions)
Jsm 7500f, by JEOL (20 mentions)
Nano zs90, by Malvern Panalytical (18 mentions)
X pert pro mpd, by Malvern Panalytical (17 mentions)
Uv 2600, by Shimadzu (17 mentions)
Axis ultra dld, by Shimadzu (17 mentions)
1 755 protocols using jem 2100f
1
Characterization of Bare Metal Oxide Nanoparticles
2
Structural Analysis of WS2 Nanorods
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Transmission electron microscopy (TEM) (JEOL JEM 2100F, JEOL Ltd., Tokyo, Japan) was utilized to explore the structural, morphological, lattice spacings, and lattice planes of WS2 nanorods. In addition, the atomic-resolution high-angle annular dark-field (HAADF) and electron energy loss spectroscopy (EELS) were investigated using a JEOL, JEM-2100F, JEOL Ltd., Tokyo, Japan, to study the elemental color mapping of WS2 nanorods.
3
Characterization of Metallized Nanorods via TEM
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A suspension of purified metallized nanorod (4 μL droplet) was placed on a carbon-coated copper (C-Cu) EM grid. Excess sample was removed using filter paper and the grid washed with Milli-Q water (20 μL). Excess water was removed from the C-Cu EM grid surface and the grid left to air dry for 5 to 10 min. The resulting grids were kept overnight in a sealable, vacuumed glass desiccator to absorb any remaining moisture. Sample grids were observed via transmission electron microscopy (TEM) using a JEOL JEM-1230 at 80 kV and a high-resolution transmission electron microscope (HR-TEM) using a JEOL JEM-2100F (Tokyo, Japan) at 200 kV. Scanning transmission electron microscopy (STEM), selected area electron diffraction (SAED) and energy-dispersive X-ray spectroscopy (EDX) were performed using a JED-2200 analyzer (JEOL, Tokyo, Japan). Elemental color mapping was conducted using a TEM model JEOL JEM-2100F (Tokyo, Japan) at 200 kV. The electron beam was focused to 1 nm and signals were integrated for 30 s. For the EDX, a barium specimen holder and C-Cu EM grids were used.
4
Transmission Electron Microscopy of Extracellular Vesicles and Tumors
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The EV preparations were layered onto carbon-coated glow-discharged copper grids. Grids were fixed in 2% paraformaldehyde for 10 min and contrasted using 2% neutral uranyl acetate for 10–15 min and embedded in 1.8% methylcellulose (25 Cp)/0.4% uranyl acetate. Imaging was performed with JEOL JEM 2100F transmission electron microscope (Jeol Ltd., Tokyo, Japan) operated at 200 kV.
CAM tumors were prefixed with 2.5% glutaraldehyde in 0.1 M phosphate buffer for 4h at room temperature. After an overnight wash in 0.1 M phosphate buffer, pH 7.4 and 1 h wash in H2O, the tumors were postfixed in 1% osmium tetraoxide and 2.22% CaCl2 in H2O and stained with 1% uranyl acetate. The tumors were dehydrated and embedded in LX-112 resin (Ladd Research Industries, Burlington, VT) and polymerized at 60°C for 48 h. The 70 nm sections were stained with 1% uranyl acetate and imaged with JEOL JEM-2100F transmission electron microscope (Jeol Ltd., Tokyo, Japan) at 200 kV.
CAM tumors were prefixed with 2.5% glutaraldehyde in 0.1 M phosphate buffer for 4h at room temperature. After an overnight wash in 0.1 M phosphate buffer, pH 7.4 and 1 h wash in H2O, the tumors were postfixed in 1% osmium tetraoxide and 2.22% CaCl2 in H2O and stained with 1% uranyl acetate. The tumors were dehydrated and embedded in LX-112 resin (Ladd Research Industries, Burlington, VT) and polymerized at 60°C for 48 h. The 70 nm sections were stained with 1% uranyl acetate and imaged with JEOL JEM-2100F transmission electron microscope (Jeol Ltd., Tokyo, Japan) at 200 kV.
5
Characterization of Metallized Nanorods via TEM
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A suspension of purified metallized nanorod (4 μL droplet) was placed on a carbon-coated copper (C-Cu) EM grid. Excess sample was removed using filter paper and the grid washed with Milli-Q water (20 μL). Excess water was removed from the C-Cu EM grid surface and the grid left to air dry for 5 to 10 min. The resulting grids were kept overnight in a sealable, vacuumed glass desiccator to absorb any remaining moisture. Sample grids were observed via transmission electron microscopy (TEM) using a JEOL JEM-1230 at 80 kV and a high-resolution transmission electron microscope (HR-TEM) using a JEOL JEM-2100F (Tokyo, Japan) at 200 kV. Scanning transmission electron microscopy (STEM), selected area electron diffraction (SAED) and energy-dispersive X-ray spectroscopy (EDX) were performed using a JED-2200 analyzer (JEOL, Tokyo, Japan). Elemental color mapping was conducted using a TEM model JEOL JEM-2100F (Tokyo, Japan) at 200 kV. The electron beam was focused to 1 nm and signals were integrated for 30 s. For the EDX, a barium specimen holder and C-Cu EM grids were used.
6
Physicochemical Characterization of Metal Oxide Nanoparticles
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ZnO NPs were synthesized by Beijing DK Nano Technology Co. LTD (Beijing, China) as reported in our recent publications [80 (link), 81 (link)]. The characteristics of ZnO NPs (morphology, size, agglomeration, etc.) were determined by transmission electron microscopy (TEM; JEM-2100F, JEOL Inc., Japan) and dynamic light scattering (DLS) particle size analyzer (Nano-Zetasizer-HT, Malvern Instruments, Malvern, UK). CuO and SiO2 NPs were manufactured by Beijing DK Nano Technology Co. LTD (Beijing, China) too. The morphology and size of CuO and SiO2 NPs were characterized using transmission electron microscopy (TEM; JEM-2100F, JEOL Inc., Japan) and a D8 Advance Powder X-ray Diffractometer (Bruker AXS, Karlsruhe, Germany). The hydrodynamic diameter, polydispersity index and zeta potential were determined in phosphate buffered saline (PBS) after 30 min sonication.
7
Characterization of Fe3O4/CNT Nanocomposites
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The morphology of Fe3O4/CNT and Fe3O4/CNT/Gent was observed using SEM (S4800, Japan) and TEM (JEOL JEM-2100F, Japan). Elemental mapping images were obtained using a TEM (JEOL JEM-2100F, Japan). The surface compositions, chemical structure, and crystal structures were collected with XPS (250Xi, United States), FTIR (Nicolet IS10, United States), and XRD (D8 Advanced, Germany) utilizing CuKα radiation. The magnetic properties of the prepared samples were using vibrating sample magnetometer (SK-300, Japan).
8
Characterization of Immobilized Pt Catalysts
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The immobilized Pt catalysts and other intermediates were characterized using infrared spectroscopy (IR, TENSOR 27, Bruker, Germany), transmission electron microscopy (TEM, JEM 2100F, JEOL Ltd., Japan), high-resolution transmission electron microscopy (HRTEM, JEM 2100F, JEOL Ltd., Japan), energy dispersive X-ray spectroscopy (EDS, X-Max, Oxford Instruments Ltd., Britain) and X-ray photoelectron spectroscopy (XPS, PHI-1600, PerkinElmer, US). Residual H2PtCl6 solutions were characterized using an ultraviolet-visible spectrophotometer (UV, U-3900, Hitachi, Japan). Pt loading was analyzed using an atomic absorption spectrophotometer (AAS, 180-80, Hitachi, Japan). The hydrosilylation products and diethylenetriaminepentaacetic dianhydride (DTPAD) were identified using a Bruker Advance 600 MHz spectrometer (Bruker, Germany). The quantitative analysis of all hydrosilylation products were analyzed using GC with a capillary column (30 m × 0.25 mm × 0.25 μm) coated with 5% phenyl and 95% methyl polysiloxane.
9
InGaN Surface Morphology and Optical Analysis
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The surface morphology of the samples was measured by SEM (Hitach-4000) and AFM (My-scope plus, Nanofocus Co.). The cross-sectional microstructure and distribution of the indium concentration of the samples were analyzed by TEM (JEM-2100 F, JEOL, 300 KeV) and EDS with STEM (JEM-2100 F, JEOL, 200 KeV and Cs corrector, CEOS), respectively. The TEM specimens were prepared by using a focused ion beam system (NOVA 600 Nanolab). Also, PL (He-Cd laser 325 nm) and EL (ELT-1100 LED Chip tester) were used to determine the optical properties at 300 K of the InGaN templates and the LEDs, respectively.
10
Comprehensive Material Characterization by XRD, SEM, TEM, and XPS
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X-ray diffraction (XRD) measurement was performed on X-ray powder diffractometer with a Cu Kɑ radiation (λ = 1.5406 Å). Scanning electron microscopy (SEM) images were collected on Hitachi S5500 scanning electron microscope. Transmission electron microscope (TEM) and high-resolution transmission electron microscope (HRTEM) images were collected using a JEOL JEM2100F (accelerating voltage of 200 kV). Element dispersive spectroscopy (EDS) measurements and line scans profiles were performed on FEI Tecnai G2 F20 microscope, an accessory built on the JEOL JEM-2100F. All XPS analyses were carried out with Thermo VG Scientific ESCALAB 250 spectrometer (Al Kα radiator).
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