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Jem 3010 microscope

Manufactured by JEOL
Sourced in Japan

The JEM-3010 is a high-resolution transmission electron microscope (TEM) designed for advanced materials research and characterization. It features a LaB6 electron source, a high-stability electron optical system, and a state-of-the-art digital image acquisition system. The JEM-3010 provides a maximum accelerating voltage of 300 kV and a point-to-point resolution of 0.17 nm, enabling the detailed observation and analysis of a wide range of materials at the atomic scale.

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7 protocols using jem 3010 microscope

1

Structural and Optical Characterization of RMSNs

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Scanning electron microscopy (SEM) images were obtained using a Carl Zeiss SUPRA 55 VP field-emission scanning electron microscope. Transmission electron microscopy (TEM) observations were carried out using a JEOL JEM-3010 microscope operated at 300 kV. Fourier-transform infrared spectroscopy (FTIR) analysis was carried out using the SHIMADZU IRspirit-T model. The hydrodynamic size of RMSNs was measured using an ELSZ-2000ZS (Otsuka Electronics Co., Ltd., Osaka, Japan). The same instrument was also used to measure the zeta potentials of the RMSNs and SBA-15.
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2

Advanced Characterization of Nanomaterials

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Electrochemical measurements were performed on a WD20-BASIC (PINE, America). EIS measurements were performed on CHI660D electrochemical workstation (Chenhua, Shanghai). Transmission electron microscopy (TEM), and high-resolution transmission electron microscopy (HRTEM) images were obtained on JEM-3010 microscope (JEOL, Japan) with an Oxford INCA detector operating at 300 kV. Scanning electron microscopy (SEM) images were obtained on JSM-6700F electron microscope at 500 kV. X-ray diffraction (XRD) measurements were performed on a XRD-6100 X-ray diffractometer (Shimadzu) with Cu Kα radiation (λ = 0.154 nm). Inductively coupled plasma optical emission spectrometry (ICP-OES) data were collected on an IRIS Intrepid II XSP instrument (Thermo Fisher). X-ray photoelectron spectroscopy (XPS) spectra were obtained on an X-ray photoelectron spectrometer (K-alpha 1063, Thermo Fisher) with Al Kα X-rays as the excitation source.
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3

Characterization of Nanomaterial Morphology

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Field emission scanning electron microscopy (FE-SEM) images were taken with a ZEISS MERLIN microscope. Samples dispersed in ethanol were deposited onto silicon wafers and sputtered with platinum by a JFC-1600 auto fine coater at a 20 mA current for 300 s prior to observation. Transmission electron microscopy (TEM) images were examined by a JEOL JEM-3010 microscope with Oxford 794-CCD camera at an accelerating voltage of 200 kV. Samples suspended in ethanol were dropped onto copper grids coated with a carbon support film before observation. The photographs of the water contact angle were recorded with an ultrapure water droplet of 8 μL on a JC2000D1 contact angle analyzer at room temperature. All the contact angle values were determined by using the Laplace-Young fitting mode.
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4

Synthesis and Characterization of Resveratrol-Loaded Gold Nanoparticles

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For the synthesis of AuNPs, gold (III) chloride trihydrate (HAuCl4·3H2O) was purchased from Sigma-Aldrich (St. Louis, MO, USA). Resveratrol-AuNPs were synthesized according to our previous report13 . Resveratrol-AuNPs were loaded onto a mica substrate (grade V-1, 25 mm × 25 mm length, 0.15 mm thick, SPI Supplies Division of Structure Probe, West Chester, PA, USA) and dried overnight in a 37 °C oven. After drying overnight, deionized water was put on the sample-loaded mica and the resveratrol-AuNPs was detached from the mica substrate. Then, the removed resveratrol-AuNPs was pipetted onto a carbon-coated copper grid (carbon type-B, 300 mesh copper grid, Ted Pella, Inc., Redding, CA, USA) and the sample-loaded grid was air-dried. A JEM-3010 microscope operated at 300 kV (JEOL Ltd., Tokyo, Japan) was utilized to get HR-TEM images.
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5

Characterization of SiO2-Coated Gold Nanorods

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Transmission electron microscopy (TEM) was performed using a JEM-3010 microscope (JEOL, Tokyo, Japan) operating at 300 kV. TEM samples were prepared by depositing 10 μL of the SiO2-AuNRs suspension on carbon-coated copper grids, which was followed by the removal of excess solution and vacuum drying in an oven for 24 hours. Ultraviolet-visible (UV-Vis) spectra of the SiO2-AuNRs were measured using an Optizen 2120 UV spectrophotometer (Mecasys, Daejeon, Korea) from 400 nm to 1,000 nm in 1 cm cuvettes. Zeta potential measurements were conducted using a Zetasizer Nano ZS system (Malvern Instruments, Malvern, UK).
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6

Characterizing PVG/Au Nanocomposite by HRTEM and DRS

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High-resolution transmission electron microscopy (HRTEM) images were obtained using a JEOL JEM–3010 microscope (300 kV, 1.7 Ǻ point resolution). PVG/Au disc was crushed and the powder was suspending in isopropanol. Subsequently, an aliquot of the suspension was drop on a holey-carbon coated Cu grid for TEM analysis. Diffuse reflection spectrocopy (DRS) in the ultraviolete-visible (UV-vis) range were recorded on a PerkinElmer spectrophotometer EP Lambda1050. For UV-vis measurementes, the PVG and PVG/Au discs were stuck in a sample holder which was mounted in an integrating sphere spectral collector. For these measuremenets, BaSO4 powder was used as standard for instrumental background correction.
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7

Transmission Electron Microscopy of Fullerene-siRNA Complexes

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The TEM measurements that are presented in Figs. 3A,B and S8 were obtained using a JEOL high resolution (HR-TEM) JEM 3010 microscope operating at a 300 kV accelerating voltage. The samples of the fullerene–siRNA complexes (20 µL of a desired solutions in nuclease free water, R = 70; 0.45 µg siRNA GFP and 37.5 µg of fullerene nanomaterial) were deposited on a copper grid with a holey carbon amorphous film under air and then dried at room temperature for 24 h.
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