The morphology of CS-AgNps was analyzed by transmission electron microscopy (TEM) using a Hitachi High-Tech HT7700 microscope (Japan) operated in “high contrast” mode and at a 100 kV acceleration potential. Samples were applied from aqueous suspension (1 mg/mL) to 300 mesh copper grids, coated with carbon and dried under vacuum.
The morphology of films (surface and cross-sections) was observed by SEM through a Verios G4 UC Scanning Electron Microscope (Thermo Scientific, Bruno, Czech Republic) equipped with an energy dispersive X-ray spectrometer (EDS, EDAX Octane Elect Super SDD detector, Ametek, Mahwah, NJ, USA). The samples were coated with 10 nm platinum using a Leica EM ACE200 Sputter coater to provide electrical conductivity and to prevent charge buildup during exposure to the electron beam.
The visualization of the surface films (unloaded and IBF-loaded F #3 sample) was carried out by atomic force microscopy (AFM) using Nanoscope IIIa-type Multimode (Digital Instruments, Tonawanda, NY, USA) equipped with an “E”-type scanner. Amplitude- and height-mode images were captured at room temperature in the air using the tapping mode with a silicon tip cantilever (Bruker Corporation, Billerica, MA, USA) operated at a resonance frequency of 275–300 kHz and at a scan rate of 1.2 Hz. The images were evaluated with the Nanoscope V614r1 software (Digital Instruments, Buffalo, NY, USA).
The morphology of films (surface and cross-sections) was observed by SEM through a Verios G4 UC Scanning Electron Microscope (Thermo Scientific, Bruno, Czech Republic) equipped with an energy dispersive X-ray spectrometer (EDS, EDAX Octane Elect Super SDD detector, Ametek, Mahwah, NJ, USA). The samples were coated with 10 nm platinum using a Leica EM ACE200 Sputter coater to provide electrical conductivity and to prevent charge buildup during exposure to the electron beam.
The visualization of the surface films (unloaded and IBF-loaded F #3 sample) was carried out by atomic force microscopy (AFM) using Nanoscope IIIa-type Multimode (Digital Instruments, Tonawanda, NY, USA) equipped with an “E”-type scanner. Amplitude- and height-mode images were captured at room temperature in the air using the tapping mode with a silicon tip cantilever (Bruker Corporation, Billerica, MA, USA) operated at a resonance frequency of 275–300 kHz and at a scan rate of 1.2 Hz. The images were evaluated with the Nanoscope V614r1 software (Digital Instruments, Buffalo, NY, USA).