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Su3500 sem instrument

Manufactured by Hitachi

The SU3500 SEM (Scanning Electron Microscope) instrument from Hitachi is a high-performance electron microscope designed for a wide range of applications. The core function of the SU3500 SEM is to provide high-resolution imaging and analysis of various samples at the nanoscale level.

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3 protocols using su3500 sem instrument

1

Corrosive Morphology and Adsorption of Copper

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To analyze the corrosive morphology and adsorption mechanics of Cu during corrosion processing better, an immersion test for the pure Cu was carried out. The copper coupons (99.9%) were cut to the desired dimensions of 3.0 × 1.5 × 1.5 cm for SEM analysis and the weight loss test. The conditions of the soaking temperature, soaking time, and the size of the samples were determined, and the samples were soaked in 0.5 M H2SO4 at a temperature of 308 K for 8 h. After the weight loss test, the copper block was removed from the 500 mL glass cell and rinsed with a high-pressure water washing device and then dried at room temperature. The Cu sample thickness and weight loss had changed after the immersion test. The weight loss test data were obtained from the average value of three parallel Cu samples in the erosion solution with different concentrations of prothioconazole. The corrosion metal surface morphology and microstructure were observed and investigated using a Hitachi SU3500 SEM instrument.
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2

Copper Sample Preparation for SEM

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The pure copper sample
used for SEM experiments was cut into a rectangular parallelepiped
with a size of 2.0 cm × 1.0 cm × 1.0 cm. The samples were
placed in stable solutions of 0.5 M H2SO4 with
and without 3.2 × 10–4 M TZV. The copper samples
were taken out after marinating 8 h and dried after being washed by
deionized water and absolute alcohol successively. SEM pictures were
obtained using a Hitachi SU3500 SEM instrument under high vacuum at
15 keV.
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3

Comprehensive Characterization of Materials

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Powder X-ray diffraction (PXRD) patterns were collected using a D/Max-2500 X-ray diffractometer with Cu-Kα radiation. Fourier-transform infrared (FT-IR) spectra was recorded on a Nicolet iS 50 ATR-FTIR instrument. Thermogravimetric analysis (TGA) was carried out on a Delta Series TA-SDTQ600 analyzer in nitrogen atmosphere using aluminum crucibles. The solid phase 13C-NMR spectra were obtained on a Varian 300 MHz solid state Infinityplus 300 NMR spectrometer. The Brunauer–Emmett–Teller (BET) surface areas were screened by nitrogen adsorption and desorption at 77 K using ASAP-2020. Pore size distributions and pore volumes were derived from the adsorption branches of the isotherms using the density functional theory (DFT) pore model. Scanning electron microscopies (SEM) were carried out using a Hitachi SU3500 SEM instrument. The fluorescence excitation and emission spectra were performed on an G9800A fluorescence spectrophotometer (Agilent Technologies, USA) with the slit widths both set at 5 nm. The fluorescence lifetime was carried out with an Fluorolog-3 fluorescence spectrophotometer (HORIBA Jobin Yvon, USA). Atomic Force Microscope (AFM) was conducted on Dimension icon of Bruker. The geometry optimization of lattice structure and refinement of PXRD pattern were performed at forcite module and reflex module in Material Studio, respectively.
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