Su3500 sem instrument
The SU3500 SEM (Scanning Electron Microscope) instrument from Hitachi is a high-performance electron microscope designed for a wide range of applications. The core function of the SU3500 SEM is to provide high-resolution imaging and analysis of various samples at the nanoscale level.
3 protocols using su3500 sem instrument
Corrosive Morphology and Adsorption of Copper
Copper Sample Preparation for SEM
used for SEM experiments was cut into a rectangular parallelepiped
with a size of 2.0 cm × 1.0 cm × 1.0 cm. The samples were
placed in stable solutions of 0.5 M H2SO4 with
and without 3.2 × 10–4 M TZV. The copper samples
were taken out after marinating 8 h and dried after being washed by
deionized water and absolute alcohol successively. SEM pictures were
obtained using a Hitachi SU3500 SEM instrument under high vacuum at
15 keV.
Comprehensive Characterization of Materials
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