Multimode 8 nanoscope 5 instrument
The Multimode 8-nanoscope V instrument is a scanning probe microscope designed for high-resolution imaging and analysis of nanoscale materials and surfaces. It is capable of various scanning probe microscopy techniques, including atomic force microscopy (AFM), scanning tunneling microscopy (STM), and related modes. The instrument provides the ability to characterize the topography, mechanical, electrical, and other properties of samples at the nanometer scale.
Lab products found in correlation
2 protocols using multimode 8 nanoscope 5 instrument
Cages Dynamics via AFM and Cryo-EM
Cages Dynamics via AFM and Cryo-EM
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