Dea 2970

The solid-state NMR (Nuclear Magnetic Resonance) spectra were recorded on the same NMR instrument equipped with solid-state probe using the following experimental conditions: ¹³C CP/MAS NMR, 6 usec prescan delay time, 2000 usec contact pulse, 5 kHz MAS rate, and 2000 scans; ²⁹Si CP/MAS NMR, 30.0 usec delay time, 1200 usec contact pulse, 5 kHz MAS rate, and 2500 scans. Then, a field-emission scanning electron microscope (FE-SEM) (JEOL) was used for observing the fractured cross-section of composite films. The fractured surfaces of the samples were obtained by dipping them into liquid nitrogen for 10 min and then broken into two pieces by radial impact force. The exposed fracture surfaces were gold-coated for 20 sec prior to SEM observation. UV spectra for the reported samples were recorded using a UV-Visible photo-spectrometer (UV-3101PC). Fourier Transform Infrared spectroscopy (FT-IR) spectra data were collected using a Per-kin-Elmer spectrometer using ATR (Attenuated Total Reflection) mode. Thermogravimetric analysis was carried using under nitrogen atmosphere on TA instrument (TGA Q500) by maintaining a heating rate of 15 °C min⁻¹ from 50 to 950 °C. The dielectric constants (DC) of the films were recorded on a TA instrument (DEA 2970) analyzer with a heating rate of 5 °C/min.

The TA instrument DEA 2970 (10, 100, 1000 and 10,000 Hz, in 50 mL/min N₂) was used to study the dielectric properties of cured epoxy resins.