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Multiphysics wave optics module

Manufactured by Comsol

The Multiphysics Wave Optics module is a software tool that simulates the propagation and interaction of electromagnetic waves with various materials and structures. It provides numerical modeling capabilities for a range of wave optics phenomena, including reflection, refraction, diffraction, and interference. The module utilizes the finite element method to solve the Maxwell's equations governing electromagnetic wave behavior.

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3 protocols using multiphysics wave optics module

1

Numerical Simulations of Optical Cavities

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2D numerical simulations were performed on the basis of the finite-element method (COMSOL Multiphysics Wave Optics module). A circular-shaped perfect matching layer as the outermost boundary was introduced for simulating the mode field distribution. Fine meshing with a size of ~2 nm was applied to the outermost region of the cavity overlapping with the resonant optical fields. The eigenmodes and eigenfrequencies for both TM and TE modes around 590 to 600 nm were numerically solved and tracked upon varying conditions of sorption and diffusion.
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2

Finite Element Simulations and CIE Color Analysis

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We validated the experimental spectra with numerical simulations using a commercially available software (COMSOL Multiphysics, Wave Optics Module) based on the Finite Element Method. 1913 CIE colour map was calculated using Matlab with an open-access code from the Matlab website, https://www.mathworks.com/matlabcentral/fileexchange/29620-cie-coordinate-calculator.
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3

Pulsed Laser Deposition of Ag-LNO Nanocomposites

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The pure LNO, low-density and high-density Ag–LNO nanocomposite thin films were deposited by pulsed laser deposition (PLD) method with a KrF excimer laser (Lambda Physik, λ = 248 nm). The co-deposition of Ag strip and LNO target was applied to deposit the Ag–LNO nanocomposite thin films, the films were obtained by the alternative laser ablation of Ag strips and LNO target. Before the deposition, the base pressure was pumped down to 5 × 10−7 torr. During deposition, the temperature was maintained at 650 °C with an O2 pressure of 10 mTorr and deposition frequency of 3 Hz. The density of Ag NPs was controlled by the size of the Ag strip. After deposition, the chamber was naturally cooled to room temperature at a rate of 10 °C min−1.
The crystal structure and microstructure of films were characterized by XRD (PanalyticalX'Pert X-ray diffractometer) and TEM (FEI Talos-F200X). The AFM images were obtained by Bruker Icon AFM.
Transmittance measurement was then carried out by UV-visible spectroscopy (PerkinElmer Lambda 1050). Optical simulation was conducted by COMSOL Multiphysics Wave Optics Module. Variable angle ellipsometry experiments were then conducted using a RC2 spectroscopic ellipsometer (J.A. Woollam Company). The effective refractive index and optical dielectric constants were obtained by fitting the ellipsometry parameters of psi (φ) using different models in VASE.
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