10 μL of the diluted polymer samples (TP1–TP4) (c = 10−3, 10−1 and 1 mg mL−1) were drop-casted on silicon wafer followed by washing with the same solvent and dried overnight. AFM height images were recorded by tapping mode on a Bruker Multimode 8 scanning probe microscope with silicon cantilever (Bruker) and analysed using the software NanoScope Analysis 1.5. The size distributions of the nanoparticles were analyzed using image-J software, from the U.S. National Institutes of Health.
15 μL polymer solution at a varied concentration (10−3, 10−1 and 1 mg mL−1) were drop-casted on a 300 mesh carbon-coated copper grid. After ∼5 min, excess solution was blotted using Whatman filter paper. The extra solution was then wicked off from all edges of the grid carefully. Grids having samples were then dried in the desiccator under vacuum for 1 day. TEM images were recorded using JEOL JEM 2100 with a Tungsten filament at an accelerating voltage of 2000 kV.
15 μL polymer solution at a varied concentration (10−3, 10−1 and 1 mg mL−1) were drop-casted on a 300 mesh carbon-coated copper grid. After ∼5 min, excess solution was blotted using Whatman filter paper. The extra solution was then wicked off from all edges of the grid carefully. Grids having samples were then dried in the desiccator under vacuum for 1 day. TEM images were recorded using JEOL JEM 2100 with a Tungsten filament at an accelerating voltage of 2000 kV.