Log In Sign up
The largest database of trusted experimental protocols

Titan 80 300

Manufactured by Philips
Visit Supplier

The Titan 80-300 is a laboratory equipment product manufactured by Philips. It is a high-performance electron microscope designed for advanced materials analysis and research. The core function of the Titan 80-300 is to provide high-resolution imaging and analytical capabilities for studying the structure and composition of various materials at the nanoscale level.

Automatically generated - may contain errors

Lab products found in correlation

Cm200 microscope, by Philips (2 mentions)

2 protocols using titan 80 300

1

Comparing Simulations with HRTEM Images

Check if the same lab product or an alternative is used in the 5 most similar protocols
To compare the simulations with HRTEM images, we refer to published work on hexagonal boron nitride (hBN) [26] (link). To further quantify the accu-racy, we compare our simulations to electron di↵raction measurements of mechanically exfoliated single-layer graphene and single-layer hBN synthesized by chemical vapor deposition [41, (link)42] (link). The di↵raction patterns were recorded on an aberration-corrected FEI Titan 80-300 and on a Philips CM200 microscope (both operated at 80 kV).
Susi T., Madsen J., Ludacka U., Mortensen J., Pennycook T., Lee Z., Kotakoski J., Kaiser U., & Meyer J. (2018). E cient first principles simulation of electron scattering factors for transmission electron microscopy.
+ Open protocol
+ Expand
2

Comparing Simulations with HRTEM Images

Check if the same lab product or an alternative is used in the 5 most similar protocols
To compare the simulations with HRTEM images, we refer to published work on hexagonal boron nitride (hBN) [26] (link). To further quantify the accu-racy, we compare our simulations to electron di↵raction measurements of mechanically exfoliated single-layer graphene and single-layer hBN synthesized by chemical vapor deposition [41, (link)42] (link). The di↵raction patterns were recorded on an aberration-corrected FEI Titan 80-300 and on a Philips CM200 microscope (both operated at 80 kV).
Susi T., Madsen J., Ludacka U., Mortensen J.J., Pennycook T.J., Lee Z., Kotakoski J., Kaiser U, & Meyer J.C. (2019). Efficient first principles simulation of electron scattering factors for transmission electron microscopy. Ultramicroscopy, 197.
+ Open protocol
+ Expand

About PubCompare

Our mission is to provide scientists with the largest repository of trustworthy protocols and intelligent analytical tools, thereby offering them extensive information to design robust protocols aimed at minimizing the risk of failures.

We believe that the most crucial aspect is to grant scientists access to a wide range of reliable sources and new useful tools that surpass human capabilities.

However, we trust in allowing scientists to determine how to construct their own protocols based on this information, as they are the experts in their field.

Ready to get started?

Sign up for free.
Registration takes 20 seconds.
Available from any computer
No download required

Sign up now

Revolutionizing how scientists
search and build protocols!