and structure of materials were examined by means of scanning electron
microscopy (SEM, Hitachi-SU8000, Taipei, Taiwan) and scanning transmission
electron microscopy (JEOL JEM-2100F Cs STEM, Taipei, Taiwan) with
an acceleration voltage of 200 kV. A Horiba Scientific (Taipei, Taiwan)
Raman system with a green laser at 532 nm and laser power at 450 mW
was used to measure Raman spectra. The laser beam was focused on the
sample surface in an area of about 10 μm in size. Raman spectra
reveal the nanostructures of the sample. FTIR measurements were conducted
on a Thermo/Nicloet, FTIR spectrometer (Thermo Fisher Scientific,
Taipei, Taiwan) at room temperature under N2 flow with
a resolution of 4 cm–1 and spectral range 650–4000
cm–1. Attenuated total reflectance analysis was
conducted with a Bruker Tensor equipped with a DTGS detector. All
spectra were collected with 512 scans and spectral resolution of 4
cm–1.