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Jem 2100f cs stem

Manufactured by JEOL
Sourced in Taiwan, Province of China, Japan

The JEM-2100F Cs STEM is a high-performance transmission electron microscope designed for advanced structural and analytical characterization. It features a spherical aberration (Cs) corrector for the objective lens, providing improved spatial resolution and image quality. The core function of the JEM-2100F Cs STEM is to enable high-resolution imaging and analysis of materials at the nanometer scale.

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9 protocols using jem 2100f cs stem

1

Comprehensive Characterization of Nanomaterial Structures

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The morphology
and structure of materials were examined by means of scanning electron
microscopy (SEM, Hitachi-SU8000, Taipei, Taiwan) and scanning transmission
electron microscopy (JEOL JEM-2100F Cs STEM, Taipei, Taiwan) with
an acceleration voltage of 200 kV. A Horiba Scientific (Taipei, Taiwan)
Raman system with a green laser at 532 nm and laser power at 450 mW
was used to measure Raman spectra. The laser beam was focused on the
sample surface in an area of about 10 μm in size. Raman spectra
reveal the nanostructures of the sample. FTIR measurements were conducted
on a Thermo/Nicloet, FTIR spectrometer (Thermo Fisher Scientific,
Taipei, Taiwan) at room temperature under N2 flow with
a resolution of 4 cm–1 and spectral range 650–4000
cm–1. Attenuated total reflectance analysis was
conducted with a Bruker Tensor equipped with a DTGS detector. All
spectra were collected with 512 scans and spectral resolution of 4
cm–1.
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2

Structural Characterization of Nanomaterials

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The morphology and structure of materials were observed by means of scanning electron microscopy (SEM, Hitachi-SU8000, Taipei, Taiwan) and scanning transmission electron microscopy (JEOL JEM-2100F Cs STEM, Taipei, Taiwan) with an acceleration voltage of 200 kV. A Horiba Scientific (Taipei, Taiwan) Raman system with a green laser at 532 nm and laser power at 450 mW was used to measure Raman spectra. The laser beam was focused on the sample surface in an area of about 10 µm in size. Raman spectra revealed the nanostructures of the sample.
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3

Characterization of Al-doped ZnO Nanostructures

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The morphology of Al-doped ZnO NSs, pure ZnO NWs, and ZnO films
were characterized by an ultrahigh-resolution scanning electron microscope
( Hitachi SU8000, Japan), and analyzed by XRD (18 kW Rotating Anode
X-ray Generator, Rigaku). The Al-doped ZnO NSs were measured by a
high-resolution transmission electron microscope and energy dispersive
spectrometer (JEOL JEM-2100F CS-STEM, Japan).
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4

Comprehensive Analysis of DLC Film Properties

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As-synthesized DLC
patterns subjected to various structural, morphological, topographical,
chemical bonding, and functional group analysis were performed by
using high precision and calibrated scientific equipment. The thickness
measurement of the DLC film was performed by a profilometer of KLA-Tencor,
AS-IQ, Alpha-Step D-300 model. The stylus is a diamond tip of a radius
of 2 μm, and a scanning speed of 50 μm/s was used with
an applied stylus force of 2 mg. The topological information was collected
from atomic force microscopy (AFM) of model XE7, Park Systems, and
the images were processed by XEI software. The morphological analysis
was carried out by JEOL, JSM-6701F field-emission scanning electron
microscopy (FESEM), and JEOL, JEM-2100F CS STEM transmission electron
microscopy (TEM). Fourier transform infrared (FTIR) spectroscopy studies
were performed using JASCO, FT/IR-4600 model, with a scanning range
from 4000 to 700 cm–1 in transmittance mode. The
Raman spectra were recorded by using a 532 nm excitation wavelength
from MRI, Protrustech Co., Ltd. X-ray photoelectron spectroscopy (XPS)
measurements were performed by PHI Hybrid Quantera with monochromatic
Al Kα (E = 1.487 keV) X-ray radiation. Data
analysis was performed using XPSPEAK41 software. The nanoindentation
measurements were performed using a Hysitron TI 950 triboindenter,
Bruker.
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5

Structural and Compositional Analysis

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The morphology and structure of materials were observed by means of scanning electron microscopy (SEM, Hitachi-SU8000, Taipei, Taiwan) and scanning Transmission Electron Microscopy (JEOL JEM-2100F Cs STEM, Taipei, Taiwan) with an acceleration voltage of 200 kV. A Horiba Scientific (Taipei, Taiwan) Raman system with a green laser at 532 nm and laser power at 450 mW was used to measure Raman spectra. The laser beam was focused on the sample surface in an area of about 10 µm in size. Raman spectra reveal the nanostructures of the sample. XRD (Bruker AXS Gmbh, Arlsruhe, Germany) was used to analyze the phase of the pyrolytic silicon-based anode. The N2 adsorption/desorption isothermals of electrodes were performed at 77 K with the specific surface area calculated from the Brunauer–Emmett–Teller (BET) plot of the N2 adsorption isothermal.
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6

Synthesis of Gold Nanoparticles

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Gold nanoparticles were synthesized through reduction. Hydrogen tetrachloroaurate (HAuCl4, Sigma‐Aldrich, St Louis, MO) was used as a gold precursor, and trisodium citrate was used as a reducing agent. Briefly, 0.5 mM hydrogen tetrachloroaurate dissolved in 300 mL distilled water followed by boiling for 10 min. Note that 30 mL of 38.8 mM trisodium citrate ((HOC(COONa)(CH2COONa)2, Sigma‐Aldrich, St Louis, MO) solution was added into the gold precursor solution to allow the color change from light yellow to colorless. Then, the solution started darkening, and the reaction was terminated when the color of solution became red. This gold particles solution was ready to use after cool down and storage in 4°C. Gold particles’ size was determined by the Zeta‐sizer (Malvern Zeta‐sizer Nano ZS90) and transmission electron microscopy (TEM, JEOL JEM‐2100F CS STEM). Figure S3 presents particle size analysis. The particle size measured by the Zeta‐sizer averaged 18.71 nm, which consistent to that observed in TEM. In addition, the numerical value of PDI was 0.41 resulting in uniform particle size distribution.
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7

Morphological Analysis of CuO/NiO Nanowires

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The microstructure, morphology and crystallinity of the as-prepared CuO and CuO/NiO nanowires were analyzed by transmission electron microscopy (TEM, JEM-2100F CS STEM, JEOL, Japan), scanning electron microscopy (SEM, SU8000, JEOL, Tokyo, Japan), and X-ray diffraction (XRD), respectively. The CuO/NiO nanowires were assembled into coin cells as the anode for testing LIB performance. The assembling sequence from bottom to top is as follows: bottom stainless steel case, Li metal cathode, separator, CuO/NiO nanowires, spring, and top stainless steel case; the electrolyte is ethylene carbonate (EC)/diethyl carbonate (DEC) with 1 M LiPF6. The cycle tests of the anode materials were performed between 0.1–3 V under a constant current of 0.1 C (70 mA g−1) at room temperature. For comparison, evolution of the morphology and microstructure of the CuO/NiO nanowires upon cycling were studied by TEM, where a constant current of 1 µA was employed for the formation process in the 1st cycle by Keithley 2400.
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8

Structural Analysis of Si@SiC Nanoflakes

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The morphology and structure of the nanocarbon-coated silicon were observed by means of scanning electron microscopy (SEM, Hitachi-SU8000, Taipei, Taiwan). Scanning Transmission Electron Microscopy (JEOL JEM-2100F Cs STEM, Taipei, Taiwan) was used to reveal the silicon carbide layer on a silicon flake. The acceleration voltage was 200 kV. A Horiba Scientific (Taipei, Taiwan) Raman system with a green laser at 532 nm and laser power at 450 mW was used to measure Raman spectra. The laser beam was focused on the sample surface in an area of about 10 µm in size. Raman spectra reveals the nanostructures of the samples. XRD (Bruker AXS Gmbh, Karlsruhe, Germany) was used to analyze the crystalline structure of the Si@SiC flakes. FTIR measurements were conducted on a Thermo/Nicloet, FTIR transmission spectrometer (Thermo Fisher Scientific, Taipei, Taiwan) at room temperature under N2 flow with a resolution of 4 cm−1, spectral range 400–4000 cm−1, using the KBr method.
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9

Characterization of Material Properties

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Scanning electron microscopy (SEM) images were obtained using a field emission scanning electron microscope (JEOL 6340F, Tokyo, Japan), while transmission electron microscopy (TEM) samples were prepared using a focused ion beam system (FEI Helios G3CX, Thermo Fisher Scientific, Waltham, MA, USA). TEM brightfield images and energy scattering spectroscopy (EDS) were acquired using JEOL JEM-2100F CS STEM (Tokyo, Japan). The transmission spectra were measured using a miniature UV-VIS spectrometer (Model: BLK-CSR-SR, StellarNet Inc., Tampa, FL, USA), and a tungsten halogen light source (SL1-FILTER, StellarNet Inc., Tampa, FL, USA, and SLS301, Thorlabs Inc., Newton, NJ, USA). X-ray photoelectron spectroscopy (XPS) was carried out using PHI 5000 VersaProbe (ULVAC-PHI, Kanagawa, Japan). The CIE 1931 color space chromaticity diagrams were created by converting and mapping the measured spectra.
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