Jsm 5410 lv microscope
The JSM–5410 LV is a low-vacuum scanning electron microscope (SEM) manufactured by JEOL. It is designed to provide high-resolution imaging of a wide range of samples, including those that are not easily accommodated in a high-vacuum environment. The JSM–5410 LV utilizes a tungsten filament electron source and offers a magnification range from 20x to 300,000x, with a resolution of 3.5 nm at 30 kV. It is equipped with a secondary electron detector and backscattered electron detector for imaging, as well as an optional energy-dispersive X-ray (EDX) spectrometer for elemental analysis.
7 protocols using jsm 5410 lv microscope
Microscopic Imaging of Spheroids
Morphological Study of Millipedes from Laos
Scanning electron micrographs (
The collecting sites were located by GPS using the WGS84 datum.
The carinotaxy formulae in the descriptions follow those in Golovatch et al. (2007a , 2007b ), while body segment counts are after Enghoff et al. (1993) .
Larval Morphology Visualization
Larval head capsules were prepared from the gold-coated specimens as well as from uncoated material by macerating in 0.2M aqueous KOH to remove soft tissues, washing in dilute acetic acid, followed by dehydration through to xylene and mounting in Permount®.
Field Observations and Specimen Documentation
Collecting sites were located by GPS using the WGS84 datum.
In the catalogue sections, D stands for the original description, subsequent descriptive notes or appearance in a key while M for a mere mention.
Taxonomic Study of Limestone Mountain Fauna
The collecting site was located by GPS using the WGS84 datum.
In the catalogue sections, D stands for the original description and/or subsequent descriptive notes, K for the appearance in a key, L for the appearance in a species list, R for a new subsequent record, and M for a mere mention.
Morphological Analysis of Gonopods from Northern Laos
Scanning electron micrographs
Museum of Zoology, Chulalongkorn University
Collecting sites were located by GPS using the WGS84 datum.
In the catalogue sections, D stands for the original description, subsequent descriptive notes or appearance in a key, R for a subsequent record or records, and M for a mere mention.
Electron Microscopy Sample Preparation
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