Talos f200x

Exfoliated phosphorene samples were prepared and added dropwise onto a carbon film on a copper grid (Lacey carbon film, 300 Mesh Cu, TED Pella, Inc., Redding, CA, USA). The lacey carbon film was then left in a hood overnight to completely dry the solvent. High-resolution transmission electron microscopy (HR-TEM) was performed on a FEI Talos F200X, Waltham, MA, USA, instrument operated at an accelerating voltage of 200 kV and with a point-to-point resolution of 0.1 nm. The TEM images were obtained at typical magnifications of 100 K to 1.05 M Velox digital micrograph software was used to analyze the samples and Image J was used to estimate nanoparticle size. Scanning transmission electron microscopy (STEM) was performed on the same instrument (FEI Talos F200X, using a high angle annular dark field Detector (HAADF) at 200 kV. HAADF–STEM image intensity is reported to be proportional to square of the atomic number, so heavy atoms are observed brighter. The phosphorene nanoparticle composition and element distribution were determined via FEI super energy-dispersive X-ray spectroscopy (EDX) system.

Low-magnification HAADF-STEM images were obtained on FEI Talos F200X operated at 200 kV. Atomic resolution HAADF-STEM images were obtained on probe aberration-corrected JEM ARM200F (S) TEM operated at 200 kV. Energy Dispersive Spectroscopy (EDS) mappings and line scanning were carried out on FEI Talos F200X, equipped with Super X-EDS system (four systematically arranged windowless silicon drift detectors) at 200 kV. ICP-AES measurements were performed using an Atom scan Advantage Spectrometer (Thermo Ash Jarrell Corporation). XPS measurements were conducted on a VG ESCALAB MK II X-ray photoelectron spectrometer with an exciting source of Mg Kα = 1253.6 eV. N₂ sorption analysis was conducted using an ASAP 2020 accelerated surface area and porosimetry instrument (Micromeritics), equipped with automated surface area, at 77 K using BET calculations for the surface area. The pore size distribution plot was analyzed from the adsorption branch of the isotherm based on the quenched-solid density functional theory (QSDFT).

XRD were performanced on a Japan Rigaku DMax-γA rotation anode x-ray diffractometer equipped with graphite monochromatized Cu-K radiation. HAADF-STEM images were produced on FEI Talos F200X operated at 200 kV. Atomic resolution HAADF-STEM images were produced on probe aberration-corrected JEM ARM200F (S) TEM operated at 200 kV. EDS mapping were used FEI Talos F200X equipped with Super X-EDS system.

Transmission electron microscope (TEM, Talos F200X, FEI, USA) was used to examine the internal morphology of the samples. The elemental composition of nanoparticles was analyzed by X-ray energy dispersive spectroscopy (EDS, Talos F200X, FEI, USA). The Fourier transform infrared spectroscopy (FTIR, FTIR-8400S, Shimadzu, Japan). X-ray photoelectron spectroscopy (XPS, ESCALAB Xi + , 191 Thermo Fisher, USA) was used to measure the samples’ chemical compositions and valence state. UV–vis absorption spectra were collected with a spectrophotometer (UV- 2600, Japan). The samples' particle size and zeta potential were measured by laser particle size and zeta potential meter (Zeta; Malvern, UK). The content of Mn and Fe in MnO₂@GA-Fe@CAI was measured by an inductively coupled plasma optical emission spectrometer (ICP-OES, Agilent 5110, USA).

The crystalline phase was determined by powder X-ray diffraction (XRD) using a Rigaku SmartLab 9 X-ray diffractometer (Tokyo, Japan) with Cu Kα radiation (λ = 1.5418 Å). The morphology was characterized by a scanning electron microscopy (SEM, Zeiss Supra-40, Oberkochen, Germany) and transmission electron microscopy (TEM, FEI Talos F200x, Waltham, MA, USA). Element distribution mapping was carried out using an energy dispersive X-ray detector equipped on the FEI Talos F200x. X-ray photoelectron spectroscopy (XPS) was studied on a Thermo Fisher ESCLAB 250Xi spectrometer (Waltham, MA, USA).